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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 8 occurrences of 8 keywords
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Results
Found 12 publication records. Showing 12 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Farid Lahrach, Abderrahim Doumar, Eric Châtelet |
Fault Tolerance of Multiple Logic Faults in SRAM-Based FPGA Systems.  |
DSD  |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Farid Lahrach, Abderrahim Doumar, Eric Châtelet |
Fault tolerance of SRAM-based FPGA via configuration frames.  |
DDECS  |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Farid Lahrach, Abderrahim Doumar, Eric Châtelet, Abderrazek Abdaoui |
Master-Slave TMR Inspired Technique for Fault Tolerance of SRAM-Based FPGA.  |
ISVLSI  |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Farid Lahrach, Abderrazek Abdaoui, Abderrahim Doumar, Eric Châtelet |
A novel SRAM-based FPGA architecture for defect and fault tolerance of configurable logic blocks.  |
DDECS  |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Abderrahim Doumar, Kentaroh Katoh, Hideo Ito |
Fault Tolerant SoC Architecture Design for JPEG2000 Using Partial Reconfigurability.  |
DFT  |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Kentaroh Katoh, Abderrahim Doumar, Hideo Ito |
Design of On-Line Testing for SoC with IEEE P1500 Compliant Cores Using Reconfigurable Hardware and Scan Shift.  |
IOLTS  |
2005 |
DBLP DOI BibTeX RDF |
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| 1 | Abderrahim Doumar, Hideo Ito |
Detecting, diagnosing, and tolerating faults in SRAM-based field programmable gate arrays: a survey.  |
IEEE Trans. VLSI Syst.  |
2003 |
DBLP DOI BibTeX RDF |
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| 1 | Abderrahim Doumar, Hideo Ito |
Testing approach within FPGA-based fault tolerant systems.  |
Asian Test Symposium  |
2000 |
DBLP DOI BibTeX RDF |
FPGA-based fault-tolerant systems, FPGA test strategy, configurable logic blocks, functional phase, on-chip configuration data shifting, shifting process control, test application, test observation, fault tolerance management logic, fault tolerance cost, chip functionality, delay overhead, Xilinx FPGA, fault tolerance, field programmable gate arrays, delays, integrated circuit testing, integrated logic circuits, testing time, user data, test phase |
| 1 | Abderrahim Doumar, Hideo Ito |
Design of Switching Blocks Tolerating Defects/Faults in FPGA Interconnection Resources. (PDF / PS)  |
DFT  |
2000 |
DBLP DOI BibTeX RDF |
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| 1 | Abderrahim Doumar, Hideo Ito |
An Automatic Testing and Diagnosis for FPGAs.  |
PRDC  |
1999 |
DBLP DOI BibTeX RDF |
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| 1 | Abderrahim Doumar, Hideo Ito |
Testing the Logic Cells and Interconnect Resources for FPGAs.  |
Asian Test Symposium  |
1999 |
DBLP DOI BibTeX RDF |
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| 1 | Abderrahim Doumar, Satoshi Kaneko, Hideo Ito |
Defect and Fault Tolerance FPGAs by Shifting the Configuration Data. (PDF / PS)  |
DFT  |
1999 |
DBLP DOI BibTeX RDF |
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Displaying result #1 - #12 of 12 (100 per page; Change: )
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