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Found 20 publication records. Showing 20 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | M. Bagatin, Simone Gerardin, Alessandro Paccagnella, C. Andreani, G. Gorini, C. D. Frost |
Temperature dependence of neutron-induced soft errors in SRAMs.  |
Microelectronics Reliability  |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniele Rossi, Martin Omaña, Cecilia Metra, Alessandro Paccagnella |
Impact of Aging Phenomena on Soft Error Susceptibility. |
DFT |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Simone Gerardin, M. Bagatin, Alessandro Paccagnella, G. Cellere, A. Visconti, M. Bonanomi |
Impact of total dose on heavy-ion upsets in floating gate arrays. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | M. Bagatin, Simone Gerardin, Alessandro Paccagnella, G. Cellere, F. Irom, D. N. Nguyen |
Destructive events in NAND Flash memories irradiated with heavy ions. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Paolo Rech, Michelangelo Grosso, Fabio Melchiori, D. Loparco, Davide Appello, Luigi Dilillo, Alessandro Paccagnella, Matteo Sonza Reorda |
Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. |
IOLTS |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda |
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. |
VTS |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello |
Evaluating Alpha-induced soft errors in embedded microprocessors. |
IOLTS |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Niccolò Battezzati, Simone Gerardin, Andrea Manuzzato, Alessandro Paccagnella, Sana Rezgui, Luca Sterpone, Massimo Violante |
On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs. |
IOLTS |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | A. Cester, A. Gasperin, N. Wrachien, Alessandro Paccagnella, V. Ancarani, Cosimo Gerardi |
Ionising radiation and electrical stress on nanocrystal memory cell array. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | J. Martín-Martínez, Simone Gerardin, R. Rodríguez, M. Nafría, X. Aymerich, A. Cester, Alessandro Paccagnella, G. Ghidini |
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Andrea Manuzzato, Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Luca Sterpone, Massimo Violante |
Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs. |
DFT |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | M. Bagatin, G. Cellere, Simone Gerardin, Alessandro Paccagnella, A. Visconti, S. Beltrami, M. Maccarrone |
Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. |
IOLTS |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Simone Gerardin, A. Griffoni, A. Cester, Alessandro Paccagnella, G. Ghidini |
Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. |
Microelectronics Reliability |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Francesca Danesin, Franco Zanon, Simone Gerardin, F. Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Alessandro Paccagnella |
Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. |
Microelectronics Reliability |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | G. Cellere, Alessandro Paccagnella, A. Visconti, M. Bonanomi |
Erratic Effects of Irradiation in Floating Gate Memory Cells. |
IOLTS |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | G. Cellere, Alessandro Paccagnella, A. Visconti, M. Bonanomi |
Soft Errors induced by single heavy ions in Floating Gate memory arrays. |
DFT |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Monica Alderighi, A. Candelori, Fabio Casini, Sergio D'Angelo, Marcello Mancini, Alessandro Paccagnella, Sandro Pastore, Giacomo R. Sechi |
Heavy Ion Effects on Configuration Logic of Virtex FPGAs. |
IOLTS |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | M. Bellato, Paolo Bernardi, D. Bortolato, A. Candelori, M. Ceschia, Alessandro Paccagnella, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante, P. Zambolin |
Evaluating the Effects of SEUs Affecting the Configuration Memory of an SRAM-Based FPGA. |
DATE |
2004 |
DBLP DOI BibTeX RDF |
|
| 1 | S. Cimino, A. Cester, Alessandro Paccagnella, G. Ghidini |
Ionising radiation effects on MOSFET drain current. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Massimo Violante, M. Ceschia, Matteo Sonza Reorda, Alessandro Paccagnella, Paolo Bernardi, Maurizio Rebaudengo, D. Bortolato, M. Bellato, P. Zambolin, A. Candelori |
Analyzing SEU Effects in SRAM-based FPGAs. |
IOLTS |
2003 |
DBLP DOI BibTeX RDF |
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