| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Fang Bao, Ke Peng, Krishnendu Chakrabarty, Mohammad Tehranipoor |
On Generation of 1-Detect TDF Pattern Set with Significantly Increased SDD Coverage.  |
Asian Test Symposium  |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Nor Zaidi Haron, Said Hamdioui |
On Defect Oriented Testing for Hybrid CMOS/Memristor Memory. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Hideyuki Ichihara, Yuka Iwamoto, Yuki Yoshikawa, Tomoo Inoue |
Test Compression Based on Lossy Image Encoding. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Umair Ishaq, Jihun Jung, Jaehoon Song, Sungju Park |
Efficient Use of Unused Spare Columns to Improve Memory Error Correcting Rate. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Stefano Di Carlo, Giulio Gambardella, Marco Indaco, Daniele Rolfo, Paolo Prinetto |
MarciaTesta: An Automatic Generator of Test Programs for Microprocessors' Data Caches. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Michael A. Kochte, Sandip Kundu, Kohei Miyase, Xiaoqing Wen, Hans-Joachim Wunderlich |
Efficient BDD-based Fault Simulation in Presence of Unknown Values. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Jae Chul Cha, Sandeep K. Gupta |
Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to Exploit Spares and ECC to Efficiently Combat High Defect and Soft-Error Rates. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Jayaram Natarajan, Joshua W. Wells, Abhijit Chatterjee, Adit D. Singh |
Distributed Comparison Test Driven Multiprocessor Speed-Tuning: Targeting Performance Gains under Extreme Process Variations. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Nastaran Nemati, Zainalabedin Navabi |
Adaptation of Standard RT Level BIST Architectures for System Level Communication Testing. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Po-Juei Chen, Wei-Li Hsu, James Chien-Mo Li, Nan-Hsin Tseng, Kuo-Yin Chen, Wei-pin Changchien, Charles C. C. Liu |
An Accurate Timing-Aware Diagnosis Algorithm for Multiple Small Delay Defects. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Paolo Bernardi, Matteo Sonza Reorda |
A New Architecture to Cross-Fertilize On-Line and Manufacturing Testing. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Kohei Miyase, Y. Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Virazel |
Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Nabil Badereddine |
Failure Analysis and Test Solutions for Low-Power SRAMs. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Chih-Yun Pai, Ruei-Ting Gu, Bo-Chuan Cheng, Liang-Bi Chen, Katherine Shu-Min Li |
A Unified Interconnects Testing Scheme for 3D Integrated Circuits. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Hidetoshi Onodera |
Dependable VLSI Program in Japan: Program Overview and the Current Status of Dependable VLSI Platform Project. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Xijiang Lin, Elham K. Moghaddam, Nilanjan Mukherjee, Benoit Nadeau-Dostie, Janusz Rajski, Jerzy Tyszer |
Power Aware Embedded Test. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Farrokh Ghani Zadegan, Urban Ingelsson, Golnaz Asani, Gunnar Carlsson, Erik Larsson |
Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Sreejit Chakravarty |
A Process Monitor Based Speed Binning and Die Matching Algorithm. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Yang Yu, Gang Xi, Liyan Qiao |
Multiscan-based Test Data Compression Using UBI Dictionary and Bitmask. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Alejandro Cook, Sybille Hellebrand, Thomas Indlekofer, Hans-Joachim Wunderlich |
Diagnostic Test of Robust Circuits. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Paul D. Franzon, W. Rhett Davis, Thorlindur Thorolfsson, Samson Melamed |
3D Specific Systems: Design and CAD. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Brandon Noia, Krishnendu Chakrabarty |
Testing and Design-for-Testability Techniques for 3D Integrated Circuits. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Keheng Huang, Yu Hu, Xiaowei Li, Gengxin Hua, Hongjin Liu, Bo Liu |
Exploiting Free LUT Entries to Mitigate Soft Errors in SRAM-based FPGAs. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Manuel J. Barragan Asian, Rafaella Fiorelli, Gildas Leger, Adoración Rueda, José L. Huertas |
Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Nuno Guerreiro, Marcelino Santos |
Mixed-Signal Fault Equivalence: Search and Evaluation. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Norbert Wehn |
Reliability: A Cross-Disciplinary and Cross-Layer Approach. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Haider A. F. Almurib, T. Nandha Kumar, Fabrizio Lombardi |
A Single-Configuration Method for Application-Dependent Testing of SRAM-based FPGA Interconnects. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Debesh Bhatta, Joshua W. Wells, Abhijit Chatterjee |
Time Domain Characterization and Test of High Speed Signals Using Incoherent Sub-sampling. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Elena I. Vatajelu, Alvaro Gómez-Pau, Michel Renovell, Joan Figueras |
Transient Noise Failures in SRAM Cells: Dynamic Noise Margin Metric. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Gunjan Bhattacharya, Ilora Maity, Biplab K. Sikdar, Baisakhi Das |
Exploring Impact of Faults on Branch Predictors' Power for Diagnosis of Faulty Module. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Dong Xiang, Zhen Chen |
Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Prasanjeet Das, Sandeep K. Gupta |
On Generating Vectors for Accurate Post-Silicon Delay Characterization. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Eun Jung Jang, Jaeyong Chung, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham |
Post-Silicon Timing Validation Method Using Path Delay Measurements. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Jakub Janicki |
Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Said Hamdioui, Mottaqiallah Taouil |
Yield Improvement and Test Cost Optimization for 3D Stacked ICs. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Michal Filipek, Yoshiaki Fukui, Hiroyuki Iwata, Grzegorz Mrugalski, Janusz Rajski, Masahiro Takakura, Jerzy Tyszer |
Low Power Decompressor and PRPG with Constant Value Broadcast. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Said Hamdioui, Venkataraman Krishnaswami, Ijeoma Sandra Irobi, Zaid Al-Ars |
A New Test Paradigm for Semiconductor Memories in the Nano-Era. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | B. Khodabandeloo, S. A. Hoseini, S. Taheri, M. H. Haghbayan, M. R. Babaei, Zainalabedin Navabi |
Online Test Macro Scheduling and Assignment in MPSoC Design. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Puneet Gupta, Rajesh K. Gupta |
Underdesigned and Opportunistic Computing. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Shray Khullar, Swapnil Bahl |
Power Aware Shift and Capture ATPG Methodology for Low Power Designs. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Anvesh Komuravelli, Srobona Mitra, Ansuman Banerjee, Pallab Dasgupta |
Backward Reasoning with Formal Properties: A Methodology for Bug Isolation on Simulation Traces. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Anton Tsertov, Raimund Ubar, Artur Jutman, Sergei Devadze |
Automatic SoC Level Test Path Synthesis Based on Partial Functional Models. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Matthias Kirmse, Uwe Petersohn, Elief Paffrath |
Optimized Test Error Detection by Probabilistic Retest Recommendation Models. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Yi Zhao, S. Saqib Khursheed, Bashir M. Al-Hashimi |
Cost-Effective TSV Grouping for Yield Improvement of 3D-ICs. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Yasuo Sato, Hisato Yamaguchi, Makoto Matsuzono, Seiji Kajihara |
Multi-cycle Test with Partial Observation on Scan-Based BIST Structure. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware |
On Using Design Partitioning to Reduce Diagnosis Memory Footprint. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Jaewon Cha, Ilwoong Kim, Sungho Kang |
New Fault Detection Algorithm for Multi-level Cell Flash Memroies. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian |
A Robust Solution for Embedded Memory Test and Repair. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Chunhua Yao, Kewal K. Saluja, Parameswaran Ramanathan |
Temperature Dependent Test Scheduling for Multi-core System-on-Chip. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Grzegorz Mrugalski, Artur Pogiel, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Pawel Urbanek |
Fault Diagnosis in Memory BIST Environment with Non-march Tests. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Sarvesh Prabhu, Michael S. Hsiao, Saparya Krishnamoorthy, Loganathan Lingappan, Vijay Gangaram, Jim Grundy |
An Efficient 2-Phase Strategy to Achieve High Branch Coverage. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji |
Test Scheduling for Multicore SoCs with Dynamic Voltage Scaling and Multiple Voltage Islands. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Rance Rodrigues, Sandip Kundu |
An Online Mechanism to Verify Datapath Execution Using Existing Resources in Chip Multiprocessors. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Debdeep Mukhopadhyay, Rajat Subhra Chakraborty |
Testability of Cryptographic Hardware and Detection of Hardware Trojans. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Xi Qian, Adit D. Singh, Abhijit Chatterjee |
Diagnosing Multiple Slow Gates for Performance Tuning in the Face of Extreme Process Variations. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Krishnendu Chakrabarty |
Analysis of Resistive Bridge Defect Delay Behavior in the Presence of Process Variation. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Matthias Sauer, Jie Jiang, Alejandro Czutro, Ilia Polian, Bernd Becker |
Efficient SAT-Based Search for Longest Sensitisable Paths. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Jyotirmoy Saikia, Pramod Notiyath, Santosh Kulkarni, Ashok Anbalan, Rajesh Uppuluri, Tammy Fernandes, Parthajit Bhattacharya, Rohit Kapur |
Predicting Scan Compression IP Configurations for Better QoR. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Sandra Irobi, Zaid Al-Ars, Said Hamdioui, Claude Thibeault |
Testing for Parasitic Memory Effect in SRAMs. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Anshuman Chandra, Jyotirmoy Saikia, Rohit Kapur |
Breaking the Test Application Time Barriers in Compression: Adaptive Scan-Cyclical (AS-C). |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Chun-Chuan Chi, Erik Jan Marinissen, Sandeep Kumar Goel, Cheng-Wen Wu |
Multi-visit TAMs to Reduce the Post-Bond Test Length of 2.5D-SICs with a Passive Silicon Interposer Base. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Steffen Zeidler, Christoph Wolf, Milos Krstic, Frank Vater, Rolf Kraemer |
Design of a Test Processor for Asynchronous Chip Test. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Uros Legat, Anton Biasizzo, Franc Novak |
Soft Error Recovery Technique for Multiprocessor SOPC. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Atul Gupta, Ajay Kumar, Manas Chhabra |
Characterizing Pattern Dependent Delay Effects in DDR Memory Interfaces. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, X. Wen |
Power-Aware Test Pattern Generation for At-Speed LOS Testing. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Sergej Deutsch, Vivek Chickermane, Brion L. Keller, Subhasish Mukherjee, Mario H. Konijnenburg, Erik Jan Marinissen, Sandeep Kumar Goel |
Automation of 3D-DfT Insertion. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Hongyan Zhang, Robert Wille, Rolf Drechsler |
Improved Fault Diagnosis for Reversible Circuits. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Ozgur Sinanoglu |
Rewind-Support for Peak Capture Power Reduction in Launch-Off-Shift Testing. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya |
Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Fatemeh Javaheri, Majid Namaki-Shoushtari, Parastoo Kamranfar, Zainalabedin Navabi |
Mapping Transaction Level Faults to Stuck-At Faults in Communication Hardware. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Ashish Goel, Swaroop Ghosh, Mesut Meterelliyoz, Jeff Parkhurst, Kaushik Roy |
Integrated Design & Test: Conquering the Conflicting Requirements of Low-Power, Variation-Tolerance and Test Cost. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Baris Arslan, Alex Orailoglu |
Adaptive Test Framework for Achieving Target Test Quality at Minimal Cost. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Yoshinobu Higami, Hiroshi Furutani, Takao Sakai, Shuichi Kameyama, Hiroshi Takahashi |
Test Pattern Selection for Defect-Aware Test. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Yuanqing Cheng, Lei Zhang 0008, Yinhe Han, Jun Liu, Xiaowei Li |
Wrapper Chain Design for Testing TSVs Minimization in Circuit-Partitioned 3D SoC. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Yoshinobu Higami, Hiroshi Takahashi, Shin-ya Kobayashi, Kewal K. Saluja |
On Detecting Transition Faults in the Presence of Clock Delay Faults. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Hans-Joachim Wunderlich |
A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Masahiro Fujita |
High Level Verification and Its Use at Pos-Silicon Debugging and Patching. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Carl Gray, David C. Keezer, H. Wang, Keren Bergman |
Burst-Mode Transmission and Data Recovery for Multi-GHz Optical Packet Switching Network Testing. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Abdullah Mumtaz, Michael E. Imhof, Stefan Holst, Hans-Joachim Wunderlich |
Embedded Test for Highly Accurate Defect Localization. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Alexios Spyronasios, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir |
On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Naghmeh Karimi, Zhiqiu Kong, Krishnendu Chakrabarty, Pallav Gupta, Srinivas Patil |
Testing of Clock-Domain Crossing Faults in Multi-core System-on-Chip. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Hiroyuki Yotsuyanagi, Hiroyuki Makimoto, Masaki Hashizume |
A Boundary Scan Circuit with Time-to-Digital Converter for Delay Testing. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | V. R. Devanathan, Sunil Bhavsar, Rajat Mehrotra |
Physical-Aware Memory BIST Datapath Synthesis: Architecture and Case-Studies on Complex SoCs. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhen Chen, Jia Li, Dong Xiang, Yu Huang |
Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based Compression Environment. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Yuntan Fang, Huawei Li, Xiaowei Li |
A Fault Criticality Evaluation Framework of Digital Systems for Error Tolerant Video Applications. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Vasileios Tenentes, Xrysovalantis Kavousianos |
Low Power Test-Compression for High Test-Quality and Low Test-Data Volume. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Brandon Noia, Krishnendu Chakrabarty |
Identification of Defective TSVs in Pre-Bond Testing of 3D ICs. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Hyunjin Kim, Jacob A. Abraham |
On-Chip Programmable Dual-Capture for Double Data Rate Interface Timing Test. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Mohammed Abdul Razzaq, Virendra Singh, Adit D. Singh |
SSTKR: Secure and Testable Scan Design through Test Key Randomization. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Suraj Sindia, Vishwani D. Agrawal, Virendra Singh |
Test and Diagnosis of Analog Circuits Using Moment Generating Functions. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Lilia Zaourar, Yann Kieffer, Chouki Aktouf |
An Innovative Methodology for Scan Chain Insertion and Analysis at RTL. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Manuel A. d'Abreu |
Nand Flash Memory - Product Trends, Technology Overview, and Technical Challenges. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Tsung-Chu Huang, Kuei-Yeh Lu, Yen-Chieh Huang |
HYPERA: High-Yield Performance-Efficient Redundancy Analysis. |
Asian Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Min Li, Michael S. Hsiao |
FSimGP^2: An Efficient Fault Simulator with GPGPU. |
Asian Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Jhih-Wei You, Shi-Yu Huang, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu |
Performance Characterization of TSV in 3D IC via Sensitivity Analysis. |
Asian Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Shyam Kumar Devarakond, Shreyas Sen, Vishwanath Natarajan, Aritra Banerjee, Hyun Choi, Ganesh Srinivasan, Abhijit Chatterjee |
Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures. |
Asian Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | NurQamarina MohdNoor, Azilah Saparon, Yusrina Yusof, Mahmud Adnan |
New Microcode's Generation Technique for Programmable Memory Built-In Self Test. |
Asian Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Hyunjin Kim, Jacob A. Abraham |
A Low Cost Built-In Self-Test Circuit for High-Speed Source Synchronous Memory Interfaces. |
Asian Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty |
Mimicking of Functional State Space with Structural Tests for the Diagnosis of Board-Level Functional Failures. |
Asian Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Che-Wei Chou, Jin-Fu Li, Ji-Jan Chen, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu |
A Test Integration Methodology for 3D Integrated Circuits. |
Asian Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
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