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Publications of "Chandan Kumar Sarkar" ( http://dblp.L3S.de/Authors/Chandan_Kumar_Sarkar )

  Author page on DBLP  Author page in RDF  Community of Chandan Kumar Sarkar in ASPL-2

Publication years (Num. hits)
2007 (2) 2008 (1) 2009 (2) 2011 (3)
Publication types (Num. hits)
article(6) inproceedings(2)
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Found 8 publication records. Showing 8 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1D. Zade, Soshi Sato, Kuniyuki Kakushima, A. Srivastava, Parhat Ahmet, Kazuo Tsutsui, A. Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Chandan Kumar Sarkar, Hiroshi Iwai Effects of La2O3 incorporation in HfO2 gated nMOSFETs on low-frequency noise. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1A. Srivastava, R. K. Nahar, Chandan Kumar Sarkar, W. P. Singh, Y. Malhotra Study of hafnium oxide deposited using Dense Plasma Focus machine for film structure and electrical properties as a MOS device. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Srabanti Pandit, Chandan Kumar Sarkar Modeling the Effect of Gate Fringing and Dopant Redistribution on the Inverse Narrow Width Effect of Narrow Channel Shallow Trench Isolated MOSFETs. Search on Bibsonomy VLSI Design The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1A. Srivastava, Partha Sarkar, Chandan Kumar Sarkar Study of gate dielectric permittivity variation with different equivalent oxide thickness on channel engineered deep sub-micrometer n-MOSFET device for mixed signal applications. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Partha Sarkar, Abhijit Mallik, Chandan Kumar Sarkar Study on the performance of sub 100 nm LACLATI MOSFETs for digital application. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Srimanta Baishya, Abhijit Mallik, Chandan Kumar Sarkar A threshold voltage model for short-channel MOSFETs taking into account the varying depth of channel depletion layers around the source and drain. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Partha Sarkar, Abhijit Mallik, Chandan Kumar Sarkar Performance comparison of channel engineered deep sub-micrometer pseudo SOI n-MOSFETs. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Srimoyee Sen, Urmimala Roy, Chaitanya Kshirsagar, Navakanta Bhat, Chandan Kumar Sarkar Circuit prospects of DGFET: Variable gain differential amplifier an a schmitt trigger with adjustable hysteresis. Search on Bibsonomy VLSI-SoC The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
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