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Publications of "Charles S. Whitman" ( http://dblp.L3S.de/Authors/Charles_S._Whitman )

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Publication years (Num. hits)
2003-2012 (11)
Publication types (Num. hits)
article(11)
Venues (Conferences, Journals, ...)
Microelectronics Reliability(11)
Authors
Charles S. Whitman(11) Ann M. Rahn(2) Jennifer A. Antonell(2) Terri M. Gilbert(2) Leslie Marchut(1) Michael Meeder(1)
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Found 11 publication records. Showing 11 according to the selection in the facets
Hits ?▲ Authors Title Venue Year Link Author keywords
1Charles S. Whitman Impact of ambient temperature set point deviation on Arrhenius estimates. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Charles S. Whitman Prediction of transmission line lifetimes over temperature and current density. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Leslie Marchut, Charles S. Whitman Acceleration factors for THB induced degradation of AlGaAs/InGaAs pHEMT devices. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Charles S. Whitman Estimating effective dielectric thickness for capacitors with extrinsic defects by a statistical method. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Charles S. Whitman Defining the safe operating area for HBTs with an InGaP emitter across temperature and current density. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell Determining factors affecting ESD failure voltage using DOE. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Charles S. Whitman Erratum to "Reliability results of HBTs with an InGaP emitter" [Microelectron. Reliability 46 (2006) 1261-1271]. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell Erratum to "Determining factors affecting ESD failure voltage using DOE" [Microelectron. Reliability 46 (2006) 1228-1237]. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Charles S. Whitman Reliability results of HBTs with an InGaP emitter. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Charles S. Whitman, Michael Meeder Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Charles S. Whitman Accelerated life test calculations using the method of maximum likelihood: an improvement over least squares. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
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