|
|
|
|
Venues (Conferences, Journals, ...)
|
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
No Growbag Graphs found.
|
|
|
|
|
Results
Found 1 publication records. Showing 1 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | E. A. Douglas, C. Y. Chang, D. J. Cheney, B. P. Gila, C. F. Lo, Liu Lu, M. R. Holzworth, P. Whiting, K. S. Jones, G. D. Via, Jinhyung Kim, Soohwan Jang, Fan Ren, S. J. Pearton |
AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress.  |
Microelectronics Reliability  |
2011 |
DBLP DOI BibTeX RDF |
|
Displaying result #1 - #1 of 1 (100 per page; Change: )
|
|