|
|
|
|
Venues (Conferences, Journals, ...)
|
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 4 occurrences of 2 keywords
|
|
|
|
|
Results
Found 9 publication records. Showing 9 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Daniel Arumí, Rosa Rodríguez Montanes, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out.  |
IEEE Trans. on CAD of Integrated Circuits and Systems  |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniel Arumí, Rosa Rodríguez Montanes, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
Gate Leakage Impact on Full Open Defects in Interconnect Lines. |
IEEE Trans. VLSI Syst. |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
Diagnosis of full open defects in interconnect lines with fan-out. |
European Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras |
Delay caused by resistive opens in interconnecting lines. |
Integration |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras |
Experimental Characterization of CMOS Interconnect Open Defects. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
Time-dependent Behaviour of Full Open Defects in Interconnect Lines. |
ITC |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
Full Open Defects in Nanometric CMOS. |
VTS |
2008 |
DBLP DOI BibTeX RDF |
interconnect open, gate leakage current, CMOS |
| 1 | Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. |
VTS |
2007 |
DBLP DOI BibTeX RDF |
Current Based Diagnosis, Current Signatures, I_DDQ, Very Low Voltage, CMOS, Bridging Defect |
| 1 | Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
Diagnosis of Full Open Defects in Interconnecting Lines. |
VTS |
2007 |
DBLP DOI BibTeX RDF |
Defect Diagnosis, Full Open Defect, Interconnecting Line, CMOS |
Displaying result #1 - #9 of 9 (100 per page; Change: )
|
|
![[Valid RSS]](Pics/valid-rss.png "Validate my RSS feed")