|
|
|
|
Venues (Conferences, Journals, ...)
|
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
No Growbag Graphs found.
|
|
|
|
|
Results
Found 8 publication records. Showing 8 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | R. Arinero, En-xia Zhang, Nadia Rezzak, Ronald D. Schrimpf, Daniel M. Fleetwood, B. K. Choï, A. B. Hmelo, J. Mekki, André Touboul, Frédéric Saigné |
High fluence 1.8 MeV proton irradiation effects on n-type MOS capacitors.  |
Microelectronics Reliability  |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Tania Roy, Yevgeniy S. Puzyrev, En-xia Zhang, Sandeepan DasGupta, Sarah A. Francis, Daniel M. Fleetwood, Ronald D. Schrimpf, Umesh K. Mishra, Jim S. Speck, Sokrates T. Pantelides |
1/f Noise in GaN HEMTs grown under Ga-rich, N-rich, and NH3-rich conditions. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Federico Faccio, Hugh J. Barnaby, Xiao J. Chen, Daniel M. Fleetwood, Laura Gonella, Michael L. McLain, Ronald D. Schrimpf |
Total ionizing dose effects in shallow trench isolation oxides. |
Microelectronics Reliability |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Sokrates T. Pantelides, L. Tsetseris, S. N. Rashkeev, X. J. Zhou, Daniel M. Fleetwood, Ronald D. Schrimpf |
Hydrogen in MOSFETs - A primary agent of reliability issues. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniel M. Fleetwood, M. P. Rodgers, L. Tsetseris, X. J. Zhou, I. Batyrev, S. Wang, Ronald D. Schrimpf, Sokrates T. Pantelides |
Effects of device aging on microelectronics radiation response and reliability. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | J. A. Felix, J. R. Schwank, Daniel M. Fleetwood, M. R. Shaneyfelt, Evgeni P. Gusev |
Effects of radiation and charge trapping on the reliability of high-kappa gate dielectrics. |
Microelectronics Reliability |
2004 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniel M. Fleetwood |
Hydrogen-related reliability issues for advanced microelectronics. |
Microelectronics Reliability |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniel M. Fleetwood |
Effects of hydrogen transport and reactions on microelectronics radiation response and reliability. |
Microelectronics Reliability |
2002 |
DBLP DOI BibTeX RDF |
|
Displaying result #1 - #8 of 8 (100 per page; Change: )
|
|
![[Valid RSS]](Pics/valid-rss.png "Validate my RSS feed")