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Found 22 publication records. Showing 22 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Dionyz Pogany, Sergey Bychikhin, Michael Heer, W. Mamanee, Erich Gornik |
Application of transient interferometric mapping method for ESD and latch-up analysis.  |
Microelectronics Reliability  |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Helmut Köck, Christian Djelassi, Stefano de Filippis, Robert Illing, Michael Nelhiebel, Markus Ladurner, Michael Glavanovics, Dionyz Pogany |
Improved thermal management of low voltage power devices with optimized bond wire positions. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | A. Podgaynaya, R. Rudolf, B. Elattari, Dionyz Pogany, Erich Gornik, Matthias Stecher, M. Strasser |
Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Sergey Bychikhin, G. Haberfehlner, J. Rhayem, D. Vanderstraeten, R. Gillon, Dionyz Pogany |
Investigation of smart power DMOS devices under repetitive stress conditions using transient thermal mapping and numerical simulation. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Michael Heer, Krzysztof Domanski, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang Stadler |
Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology. |
Microelectronics Reliability |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | G. Haberfehlner, Sergey Bychikhin, V. Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany |
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. |
Microelectronics Reliability |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Helmut Köck, Vladimir Kosel, Christian Djelassi, Michael Glavanovics, Dionyz Pogany |
IR thermography and FEM simulation analysis of on-chip temperature during thermal-cycling power-metal reliability testing using in situ heated structures. |
Microelectronics Reliability |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Michael Heer, P. Grombach, A. Heid, Dionyz Pogany |
Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applications. |
Microelectronics Reliability |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Michael Heer, Sergey Bychikhin, W. Mamanee, Dionyz Pogany, A. Heid, P. Grombach, M. Klaussner, W. Soppa, B. Ramler |
Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | V. Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Tilo Brodbeck, Wolfgang Stadler |
Backside interferometric methods for localization of ESD-induced leakage current and metal shorts. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Sergey Bychikhin, T. Swietlik, T. Suski, S. Porowski, P. Perlin, Dionyz Pogany |
Thermal analysis of InGaN/GaN (GaN substrate) laser diodes using transient interferometric mapping. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | K. Cico, J. Kuzmik, D. Gregusová, R. Stoklas, Tibor Lalinsky, Alexandros G. Georgakilas, Dionyz Pogany, K. Fröhlich |
Optimization and performance of Al2O3/GaN metal-oxide-semiconductor structures. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Michael Heer, V. Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Frank, A. Konrad, J. Schulz |
Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up. |
Microelectronics Reliability |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Martin Litzenberger, Christoph Furböck, Sergey Bychikhin, Dionyz Pogany, Erich Gornik |
Scanning heterodyne interferometer setup for the time-resolved thermal and free-carrier mapping in semiconductor devices. |
IEEE T. Instrumentation and Measurement |
2005 |
DBLP DOI BibTeX RDF |
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| 1 | Michael Heer, V. Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Denison, Matthias Stecher, G. Groos |
Automated setup for thermal imaging and electrical degradation study of power DMOS devices. |
Microelectronics Reliability |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | M. Blaho, Dionyz Pogany, Erich Gornik, M. Denison, G. Groos, Matthias Stecher |
Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | V. Dubec, Sergey Bychikhin, M. Blaho, Dionyz Pogany, Erich Gornik, J. Willemen, N. Qu, Wolfgang Wilkening, L. Zullino, A. Andreini |
A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Dionyz Pogany, J. Kuzmik, J. Darmo, Martin Litzenberger, Sergey Bychikhin, Karl Unterrainer, Z. Mozolova, S. Hascik, Tibor Lalinsky, Erich Gornik |
Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique. |
Microelectronics Reliability |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Wolfgang Stadler, Kai Esmark, Harald Gossner, Martin Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, Erich Gornik |
Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development. |
Microelectronics Reliability |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | M. Blaho, Dionyz Pogany, L. Zullino, A. Andreini, Erich Gornik |
Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions. |
Microelectronics Reliability |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, G. Groos, Matthias Stecher |
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. |
Microelectronics Reliability |
2001 |
DBLP BibTeX RDF |
|
| 1 | Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner |
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. |
Microelectronics Reliability |
2001 |
DBLP BibTeX RDF |
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