|
|
|
|
Venues (Conferences, Journals, ...)
|
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
No Growbag Graphs found.
|
|
|
|
|
Results
Found 4 publication records. Showing 4 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Stanislav Tyaginov, Ivan Starkov, Hubert Enichlmair, C. Jungemann, J. M. Park, E. Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser |
An analytical approach for physical modeling of hot-carrier induced degradation.  |
Microelectronics Reliability  |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Stanislav Tyaginov, Ivan Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, S. Carniello, J. M. Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, E. Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser |
Interface traps density-of-states as a vital component for hot-carrier degradation modeling.  |
Microelectronics Reliability  |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | M. Schrems, M. Knaipp, Hubert Enichlmair, V. Vescoli, Rainer Minixhofer, E. Seebacher, F. Leisenberger, E. Wachmann, G. Schatzberger, H. Gensinger |
Scalable High Voltage CMOS technology for Smart Power and sensor applications.  |
Elektrotechnik und Informationstechnik  |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | E. Seebacher, Gerhard Rappitsch, H. Höller |
Process Characterization for Low VTH and Low Power Design.  |
PATMOS  |
2003 |
DBLP DOI BibTeX RDF |
|
Displaying result #1 - #4 of 4 (100 per page; Change: )
|
|