|
|
|
|
Venues (Conferences, Journals, ...)
|
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
No Growbag Graphs found.
|
|
|
|
|
Results
Found 15 publication records. Showing 15 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Valeria Kilchytska, Joaquín Alvarado, S. Put, Nadine Collaert, Eddy Simoen, Cor Claeys, O. Militaru, G. Berger, Denis Flandre |
High-energy neutrons effect on strained and non-strained SOI MuGFETs and planar MOSFETs.  |
Microelectronics Reliability  |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Renan Trevisoli Doria, João Antonio Martino, Eddy Simoen, Cor Claeys, Marcelo Antonio Pavanello |
An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices. |
Microelectronics Reliability |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | J. Martín-Martínez, E. Amat, M. B. Gonzalez, P. Verheyen, R. Rodríguez, M. Nafría, X. Aymerich, Eddy Simoen |
SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Paula Ghedini Der Agopian, João Antonio Martino, Eddy Simoen, Cor Claeys |
Study of the linear kink effect in PD SOI nMOSFETs. |
Microelectronics Journal |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Paolo Srinivasan, Felice Crupi, Eddy Simoen, Paolo Magnone, Calogero Pace, D. Misra, Cor Claeys |
Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Kerem Akarvardar, Abdelkarim Mercha, Eddy Simoen, Vaidyanathan Subramanian, Cor Claeys, Pierre Gentil, Sorin Cristoloveanu |
High-temperature performance of state-of-the-art triple-gate transistors. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Paula Ghedini Der Agopian, João Antonio Martino, Eddy Simoen, Cor Claeys |
Impact of the twin-gate structure on the linear kink effect in PD SOI nMOSFETS. |
Microelectronics Journal |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | L. M. Camillo, João Antonio Martino, Eddy Simoen, Cor Claeys |
The temperature mobility degradation influence on the zero temperature coefficient of partially and fully depleted SOI MOSFETs. |
Microelectronics Journal |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | J. M. Rafí, Eddy Simoen, K. Hayama, Abdelkarim Mercha, F. Campabadal, H. Ohyama, Cor Claeys |
Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs. |
Microelectronics Reliability |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | K. Hayama, K. Takakura, K. Shigaki, H. Ohyama, J. M. Rafí, Abdelkarim Mercha, Eddy Simoen, Cor Claeys |
Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation. |
Microelectronics Reliability |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | K. Hayama, K. Takakura, H. Ohyama, S. Kuboyama, S. Matsuda, J. M. Rafí, Abdelkarim Mercha, Eddy Simoen, Cor Claeys |
Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs. |
Microelectronics Reliability |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | M. Nakabayashi, H. Ohyama, Eddy Simoen, M. Ikegami, Cor Claeys, K. Kobayashi, M. Yoneoka, K. Miyahara |
Reliability of polycrystalline silicon thin film resistors. |
Microelectronics Reliability |
2001 |
DBLP BibTeX RDF |
|
| 1 | M. Da Rold, Eddy Simoen, Sofie Mertens, Marc Schaekers, G. Badenes, Stefaan Decoutere |
Impact of gate oxide nitridation process on 1/f noise in 0.18 mum CMOS. |
Microelectronics Reliability |
2001 |
DBLP DOI BibTeX RDF |
|
| 1 | H. Ohyama, Eddy Simoen, S. Kuroda, Cor Claeys, Y. Takami, T. Hakata, K. Kobayashi, M. Nakabayashi, H. Sunaga |
Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle. |
Microelectronics Reliability |
2001 |
DBLP DOI BibTeX RDF |
|
| 1 | H. Ohyama, M. Nakabayashi, Eddy Simoen, Cor Claeys, T. Tanaka, T. Hirao, S. Onada, K. Kobayashi |
Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation. |
Microelectronics Reliability |
2001 |
DBLP BibTeX RDF |
|
Displaying result #1 - #15 of 15 (100 per page; Change: )
|
|
![[Valid RSS]](Pics/valid-rss.png "Validate my RSS feed")