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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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Results
Found 12 publication records. Showing 12 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Rajiv V. Joshi, Keunwoo Kim, Richard Q. Williams, Edward J. Nowak, Ching-Te Chuang |
A High-Performance, Low Leakage, and Stable SRAM Row-Based Back-Gate Biasing Scheme in FinFET Technology.  |
VLSI Design  |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Scott Hanson, Bo Zhai, Kerry Bernstein, David Blaauw, Andres Bryant, Leland Chang, Koushik K. Das, Wilfried Haensch, Edward J. Nowak, Dennis Sylvester |
Ultralow-voltage, minimum-energy CMOS.  |
IBM Journal of Research and Development  |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Kerry Bernstein, David J. Frank, Anne E. Gattiker, Wilfried Haensch, Brian L. Ji, Sani R. Nassif, Edward J. Nowak, Dale J. Pearson, Norman J. Rohrer |
High-performance CMOS variability in the 65-nm regime and beyond.  |
IBM Journal of Research and Development  |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Wilfried Haensch, Edward J. Nowak, Robert H. Dennard, Paul M. Solomon, Andres Bryant, Omer H. Dokumaci, Arvind Kumar, Xinlin Wang, Jeffrey B. Johnson, Massimo V. Fischetti |
Silicon CMOS devices beyond scaling.  |
IBM Journal of Research and Development  |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Ernest Y. Wu, Jordi Suñé, Wing L. Lai, Alex Vayshenker, Edward J. Nowak, David L. Harmon |
Critical reliability challenges in scaling SiO2-based dielectric to its limit.  |
Microelectronics Reliability  |
2003 |
DBLP DOI BibTeX RDF |
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| 1 | Ernest Y. Wu, Edward J. Nowak, Alex Vayshenker, Wing L. Lai, David L. Harmon |
CMOS scaling beyond the 100-nm node with silicon-dioxide-based gate dielectrics.  |
IBM Journal of Research and Development  |
2002 |
DBLP DOI BibTeX RDF |
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| 1 | Edward J. Nowak |
Maintaining the benefits of CMOS scaling when scaling bogs down.  |
IBM Journal of Research and Development  |
2002 |
DBLP DOI BibTeX RDF |
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| 1 | Kerry Bernstein, John E. Bertsch, William F. Clark, John J. Ellis-Monaghan, Larry G. Heller, Edward J. Nowak |
Practical performance/power alternatives within an existing CMOS technology generation.  |
ISLPED  |
1996 |
DBLP DOI BibTeX RDF |
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| 1 | Kerry Bernstein, John E. Bertsch, Lawrence G. Heller, Edward J. Nowak, Francis R. White |
Reduced-voltage power/performance optimization of the 3.6-volt PowerPC 601 Microprocessor.  |
IBM Journal of Research and Development  |
1995 |
DBLP BibTeX RDF |
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| 1 | Yuan Taur, Yuh-Jier Mii, David J. Frank, H.-S. Philip Wong, Douglas A. Buchanan, Shalom J. Wind, Stephen A. Rishton, Watson A. Sai-Halasz, Edward J. Nowak |
CMOS scaling into the 21st century: 0.1 µm and beyond.  |
IBM Journal of Research and Development  |
1995 |
DBLP BibTeX RDF |
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| 1 | Charles W. Koburger III, William F. Clark, James W. Adkisson, Eric Adler, Paul E. Bakeman, Albert S. Bergendahl, Alan B. Botula, W. Chang, Bijan Davari, John H. Givens, Howard H. Hansen, Steven J. Holmes, David V. Horak, Chung Hon Lam, Jerome B. Lasky, Stephen E. Luce, Randy W. Mann, Glen L. Miles, James S. Nakos, Edward J. Nowak, Ghavam Shahidi, Yuan Taur, Francis R. White, Matthew R. Wordeman |
A half-micron CMOS logic generation.  |
IBM Journal of Research and Development  |
1995 |
DBLP BibTeX RDF |
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| 1 | Donald G. Chesebro, James W. Adkisson, Lyman R. Clark, Steven N. Eslinger, Margaret A. Faucher, Steven J. Holmes, Raymond P. Mallette, Edward J. Nowak, Edward W. Sengle, Steven H. Voldman, Thomas W. Weeks |
Overview of gate linewidth control in the manufacture of CMOS logic chips.  |
IBM Journal of Research and Development  |
1995 |
DBLP BibTeX RDF |
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Displaying result #1 - #12 of 12 (100 per page; Change: )
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