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Found 16 publication records. Showing 16 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Enamul Amyeen, Andal Jayalakshmi, Srikanth Venkataraman, Sundar V. Pathy, Ewe C. Tan |
Logic BIST silicon debug and volume diagnosis methodology.  |
ITC  |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Dongok Kim, Irith Pomeranz, Enamul Amyeen, Srikanth Venkataraman |
Defect diagnosis based on DFM guidelines. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Enamul Amyeen, Srikanth Venkataraman, Mun Wai Mak |
Microprocessor system failures debug and fault isolation methodology. |
ITC |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Dongok Kim, Enamul Amyeen, Srikanth Venkataraman, Irith Pomeranz, Swagato Basumallick, Berni Landau |
Testing for systematic defects based on DFM guidelines. |
ITC |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Vishnu C. Vimjam, Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang |
Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. |
VTS |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Enamul Amyeen, Debashis Nayak, Srikanth Venkataraman |
Improving Precision Using Mixed-level Fault Diagnosis. |
ITC |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, Enamul Amyeen, Sudhakar M. Reddy |
Dominance Based Analysis for Large Volume Production Fail Diagnosis. |
VTS |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Ruifeng Guo, Subhasish Mitra, Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman |
Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. |
VTS |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee |
Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
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| 1 | Srikanth Venkataraman, Srihari Sivaraj, Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo |
An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. |
VTS |
2004 |
DBLP DOI BibTeX RDF |
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| 1 | Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, Enamul Amyeen |
Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. |
VLSI Design |
2004 |
DBLP DOI BibTeX RDF |
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| 1 | Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana |
Fault equivalence identification in combinational circuits using implication and evaluation techniques. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2003 |
DBLP DOI BibTeX RDF |
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| 1 | Xiaoming Yu, Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz |
Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. |
VTS |
2003 |
DBLP DOI BibTeX RDF |
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| 1 | Enamul Amyeen, Irith Pomeranz, W. Kent Fuchs |
Theorems for Efficient Identification of Indistinguishable Fault Pairs in Synchronous Sequential Circuits. |
VTS |
2002 |
DBLP DOI BibTeX RDF |
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| 1 | Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana |
Fault Equivalence Identification Using Redundancy Information and Static and Dynamic Extraction. |
VTS |
2001 |
DBLP DOI BibTeX RDF |
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| 1 | Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana |
Implication and Evaluation Techniques for Proving Fault Equivalence. |
VTS |
1999 |
DBLP DOI BibTeX RDF |
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