|
|
|
|
Venues (Conferences, Journals, ...)
|
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
No Growbag Graphs found.
|
|
|
|
|
Results
Found 16 publication records. Showing 16 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Peilin Song, Franco Stellari, Dirk Pfeiffer, Jim Culp, Alan J. Weger, Alyssa Bonnoit, Bob Wisnieff, Marc Taubenblatt |
MARVEL - Malicious alteration recognition and verification by emission of light.  |
HOST  |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Mesut Meterelliyoz, Peilin Song, Franco Stellari, Jaydeep P. Kulkarni, Kaushik Roy |
Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor. |
IEEE Trans. on Circuits and Systems |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Franco Stellari, Peilin Song, John Sylvestri, D. Miles, Orazio P. Forlenza, Donato O. Forlenza |
On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC). |
ITC |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Peilin Song, Stephen Ippolito, Franco Stellari, John Sylvestri, Tim Diemoz, George Smith, Paul Muench, Norm James, Seongwon Kim, Hector Saenz |
Optical Diagnostics for IBM POWER6- Microprocessor. |
ITC |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Franco Stellari, Peilin Song, Tim Diemoz, Alan J. Weger, Tami Vogel, Steve Wilson, John Pennings, Richard F. Rizzolo |
High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images. |
ITC |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Alberto Tosi, Franco Stellari, Franco Zappa |
Innovative packaging technique for backside optical testing of wire-bonded chips. |
Microelectronics Reliability |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Franco Stellari, Peilin Song, John Hryckowian, Otto A. Torreiter, Steve Wilson, Philip Wu, Alberto Tosi |
Characterization of a 0.13 mum CMOS Link Chip using Time Resolved Emission (TRE). |
Microelectronics Reliability |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Peilin Song, Franco Stellari, Bill Huott, Otto Wagner, Uma Srinivasan, Yuen H. Chan, Rick Rizzolo, H. J. Nam, James P. Eckhardt, Timothy G. McNamara, Ching-Lung Tong, Alan J. Weger, Moyra K. McManus |
An advanced optical diagnostic technique of IBM z990 eServer microprocessor. |
ITC |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Franco Stellari, Alberto Tosi, Franco Zappa, Sergio Cova |
CMOS circuit testing via time-resolved luminescence measurements and simulations. |
IEEE T. Instrumentation and Measurement |
2004 |
DBLP DOI BibTeX RDF |
|
| 1 | Peilin Song, Franco Stellari, Alan J. Weger, Tian Xia |
A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
|
| 1 | Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda, Philip Wu, Steve Wilson |
Latchup Analysis Using Emission Microscopy. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Alberto Tosi, Franco Stellari, Franco Zappa, Sergio Cova |
Backside Flip-Chip testing by means of high-bandwidth luminescence detection. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari |
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda |
Optical and Electrical Testing of Latchup in I/O Interface Circuits. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Franco Stellari, Peilin Song, James C. Tsang, Moyra K. McManus, Mark B. Ketchen |
Optical diagnosis of excess IDDQ in low power CMOS circuits. |
Microelectronics Reliability |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Franco Stellari, Franco Zappa, Sergio Cova, L. Vendrame |
Tools for contactless testing and simulation of CMOS circuits. |
Microelectronics Reliability |
2001 |
DBLP DOI BibTeX RDF |
|
Displaying result #1 - #16 of 16 (100 per page; Change: )
|
|
![[Valid RSS]](Pics/valid-rss.png "Validate my RSS feed")