Search results for "Ganesh Srinivasan"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force	Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme.	J. Electronic Testing	2011	DBLP DOI BibTeX RDF
1	Aritra Banerjee, Vishwanath Natarajan, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Soumendu Bhattacharya	Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation.	VLSI Design	2011	DBLP DOI BibTeX RDF
1	Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam	Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices.	J. Electronic Testing	2010	DBLP DOI BibTeX RDF
1	Vishwanath Natarajan, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler	Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems.	IEEE Design & Test of Computers	2010	DBLP DOI BibTeX RDF
1	Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzlar, Richard Antley, Craig Force, Falah Mohammed	RADPro: Automatic RF analyzer and diagnostic program generation tool.	ITC	2010	DBLP DOI BibTeX RDF
1	Shyam Kumar Devarakond, Shreyas Sen, Vishwanath Natarajan, Aritra Banerjee, Hyun Choi, Ganesh Srinivasan, Abhijit Chatterjee	Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures.	Asian Test Symposium	2010	DBLP DOI BibTeX RDF
1	Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee	Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers.	IEEE Design & Test of Computers	2008	DBLP DOI BibTeX RDF	wafer probe test, test yield, loopback test, DFT, RF test, low-cost test
1	Ganesh Srinivasan, Hui-Chuan Chao, Friedrich Taenzler	Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms.	ITC	2008	DBLP DOI BibTeX RDF
1	Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler	Optimized EVM Testing for IEEE 802.11a/n RF ICs.	ITC	2008	DBLP DOI BibTeX RDF
1	Vishwanath Natarajan, Ganesh Srinivasan, Abhijit Chatterjee, Craig Force	Novel Cross-Loopback Based Test Approach for Specification Test of Multi-Band, Multi-Hardware Radios.	VTS	2007	DBLP DOI BibTeX RDF
1	Ganesh Srinivasan, Abhijit Chatterjee, Friedrich Taenzler	Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures.	VTS	2006	DBLP DOI BibTeX RDF
1	Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee	Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms.	DATE	2006	DBLP DOI BibTeX RDF
1	Vishwanath Natarajan, Ganesh Srinivasan, Abhijit Chatterjee	On-Line Error Detection in Wireless RF Transmitters Using Real-time Streaming Data.	IOLTS	2006	DBLP DOI BibTeX RDF
1	Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee	Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications.	J. Electronic Testing	2005	DBLP DOI BibTeX RDF	RF transceivers, alternate test, periodic bitstreams, optimization, behavioral modeling
1	Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee	A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode.	VLSI Design	2005	DBLP DOI BibTeX RDF	System-level test, Loop-back test, wireless transceiver test, Analog and mixed-signal test, RF test, Specification test
1	Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee	Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences.	DELTA	2004	DBLP DOI BibTeX RDF
1	Ganesh Srinivasan, Shalabh Goyal, Abhijit Chatterjee	Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF
1	Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee	System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams.	VTS	2004	DBLP DOI BibTeX RDF
1	Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee	Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit.	DATE	2004	DBLP DOI BibTeX RDF

Publications of "Ganesh Srinivasan" ( http://dblp.L3S.de/Authors/Ganesh_Srinivasan )