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Found 32 publication records. Showing 32 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni |
Chip and package-related degradation of high power white LEDs.  |
Microelectronics Reliability  |
2012 |
DBLP DOI BibTeX RDF |
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| 1 | Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Gaudenzio Meneghesso, Enrico Zanoni |
Degradation mechanisms of high-power white LEDs activated by current and temperature. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | D. Bari, N. Wrachien, R. Tagliaferro, S. Penna, T. M. Brown, A. Reale, A. Di Carlo, Gaudenzio Meneghesso, A. Cester |
Thermal stress effects on Dye-Sensitized Solar Cells (DSSCs). |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | J. Iannacci, A. Faes, A. Repchankova, Augusto Tazzoli, Gaudenzio Meneghesso |
An active heat-based restoring mechanism for improving the reliability of RF-MEMS switches. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | A. Massenz, M. Barbato, V. Giliberto, B. Margesin, S. Colpo, Gaudenzio Meneghesso |
Investigation methods and approaches for alleviating charge trapping phenomena in ohmic RF-MEMS switches submitted to cycling test. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Augusto Tazzoli, Isabella Rossetto, Enrico Zanoni, Dai Yufeng, Tiziana Tomasi, Gaudenzio Meneghesso |
ESD sensitivity of a GaAs MMIC microwave power amplifier. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Nicola Trivellin, Matteo Meneghini, C. De Santi, S. Vaccari, Gaudenzio Meneghesso, Enrico Zanoni, Kenji Orita, S. Takigawa, Tsuyoshi Tanaka, Daisuke Ueda |
Degradation of InGaN lasers: Role of non-radiative recombination and injection efficiency. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | J. Iannacci, A. Repchankova, A. Faes, Augusto Tazzoli, Gaudenzio Meneghesso, Gian Franco Dalla Betta |
Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Augusto Tazzoli, M. Barbato, F. Mattiuzzo, V. Ritrovato, Gaudenzio Meneghesso |
Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Valerio Di Lecce, Michele Esposto, Matteo Bonaiuti, Gaudenzio Meneghesso, Enrico Zanoni, Fausto Fantini, Alessandro Chini |
Experimental and simulated dc degradation of GaN HEMTs by means of gate-drain and gate-source reverse bias stress. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Augusto Tazzoli, M. Cordoni, P. Colombo, C. Bergonzoni, Gaudenzio Meneghesso |
Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Matteo Meneghini, D. Barbisan, Y. Bilenko, M. Shatalov, J. Yang, R. Gaska, Gaudenzio Meneghesso, Enrico Zanoni |
Defect-related degradation of Deep-UV-LEDs. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | A. Cester, D. Bari, J. Framarin, N. Wrachien, Gaudenzio Meneghesso, S. Xia, V. Adamovich, J. J. Brown |
Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Matteo Meneghini, Nicola Trivellin, Kenji Orita, Masaaki Yuri, Tsuyoshi Tanaka, Daisuke Ueda, Enrico Zanoni, Gaudenzio Meneghesso |
Reliability evaluation for Blu-Ray laser diodes. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Nicola Trivellin, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni, Kenji Orita, Masaaki Yuri, Tsuyoshi Tanaka, Daisuke Ueda |
Reliability analysis of InGaN Blu-Ray laser diode. |
Microelectronics Reliability |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Augusto Tazzoli, L. Cerati, A. Andreini, Gaudenzio Meneghesso |
Breakdown characterization of gate oxides in 35 and 70 Å BCD8 smart power technology. |
Microelectronics Reliability |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | N. Ronchi, Franco Zanon, A. Stocco, Augusto Tazzoli, Enrico Zanoni, Gaudenzio Meneghesso |
Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test. |
Microelectronics Reliability |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Augusto Tazzoli, Gaudenzio Meneghesso, Franco Zanon, Francesca Danesin, Enrico Zanoni, P. Bove, R. Langer, J. Thorpe |
Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields. |
Microelectronics Reliability |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Francesca Danesin, Augusto Tazzoli, Franco Zanon, Gaudenzio Meneghesso, Enrico Zanoni, Antonio Cetronio, Claudio Lanzieri, Simone Lavanga, Marco Peroni, Paolo Romanini |
Thermal storage effects on AlGaN/GaN HEMT. |
Microelectronics Reliability |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Matteo Meneghini, L. Trevisanello, C. Sanna, G. Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni |
High temperature electro-optical degradation of InGaN/GaN HBLEDs. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | M. Faqir, G. Verzellesi, Fausto Fantini, Francesca Danesin, F. Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Anna Cavallini, Antonio Castaldini, Nathalie Labat, André Touboul, Christian Dua |
Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Augusto Tazzoli, F. A. Marino, M. Cordoni, A. Benvenuti, P. Colombo, Enrico Zanoni, Gaudenzio Meneghesso |
Holding voltage investigation of advanced SCR-based protection structures for CMOS technology. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Matteo Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni |
High brightness GaN LEDs degradation during dc and pulsed stress. |
Microelectronics Reliability |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Francesca Danesin, Franco Zanon, Simone Gerardin, F. Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Alessandro Paccagnella |
Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. |
Microelectronics Reliability |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Augusto Tazzoli, Gaudenzio Meneghesso, Enrico Zanoni |
A novel fast and versatile temperature measurement system for LDMOS transistors. |
Microelectronics Reliability |
2005 |
DBLP DOI BibTeX RDF |
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| 1 | G. Verzellesi, Gaudenzio Meneghesso, Alessandro Chini, Enrico Zanoni, C. Canali |
DC-to-RF dispersion effects in GaAs- and GaN-based heterostructure FETs: performance and reliability issues. |
Microelectronics Reliability |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Gaudenzio Meneghesso, N. Novembre, Enrico Zanoni, L. Sponton, L. Cerati, G. Croce |
Optimization of ESD protection structures suitable for BCD6 smart power technology. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Gaudenzio Meneghesso, S. Levada, Enrico Zanoni, G. Scamarcio, G. Mura, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich |
Reliability of visible GaN LEDs in plastic package. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Gaudenzio Meneghesso, Enrico Zanoni |
Failure modes and mechanisms of InP-based and metamorphic high electron mobility transistors. |
Microelectronics Reliability |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Gaudenzio Meneghesso, A. Cocco, G. Mura, Simona Podda, Massimo Vanzi |
Backside Failure Analysis of GaAs ICs after ESD tests. |
Microelectronics Reliability |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | L. Sponton, L. Cerati, G. Croce, G. Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni |
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. |
Microelectronics Reliability |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Gaudenzio Meneghesso, Gaudenzio Chini, Enrico Zanoni |
Long Term Stability of InGaAs/AlInAs/GaAs Methamorphic HEMTs. |
Microelectronics Reliability |
2001 |
DBLP BibTeX RDF |
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