Search results for "Gilson I. Wirth"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Lucas Brusamarello, Gilson I. Wirth, Philippe Roussel, Miguel Miranda	Fast and accurate statistical characterization of standard cell libraries.	Microelectronics Reliability	2011	DBLP DOI BibTeX RDF
1	Miguel Miranda, Philippe Roussel, Lucas Brusamarello, Gilson I. Wirth	Statistical characterization of standard cells using design of experiments with response surface modeling.	DAC	2011	DBLP DOI BibTeX RDF
1	Maurício Banaszeski da Silva, Gilson I. Wirth	Modeling the impact of RTS on the reliability of ring oscillators.	SBCCI	2010	DBLP DOI BibTeX RDF
1	Dalton Martini Colombo, Gilson Inacio Wirth, Christian Jesús B. Fayomi	Design methodology using inversion coefficient for low-voltage low-power CMOS voltage reference.	SBCCI	2010	DBLP DOI BibTeX RDF
1	Lucas Brusamarello, Gilson I. Wirth, Roberto da Silva	Statistical RTS model for digital circuits.	Microelectronics Reliability	2009	DBLP DOI BibTeX RDF
1	Gustavo Neuberger, Gilson I. Wirth, Ricardo Reis	Protecting digital circuits against hold time violation due to process variability.	SBCCI	2009	DBLP DOI BibTeX RDF	flip-flop characterization, hold time violations, race immunity, clock skew, process variability
1	Christian Jesús B. Fayomi, Gilson I. Wirth, David Binkley, Akira Matsuzawa	An experimental 0.6-V 57.5-fJ/conversion-step 250-kS/s 8-bit rail-to-rail successive approximation ADC in 0.18µm CMOS.	ICECS	2009	DBLP DOI BibTeX RDF
1	Gilson I. Wirth	Bulk built in current sensors for single event transient detection in deep-submicron technologies.	Microelectronics Reliability	2008	DBLP DOI BibTeX RDF
1	Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Lima Kastensmidt	Modeling the sensitivity of CMOS circuits to radiation induced single event transients.	Microelectronics Reliability	2008	DBLP DOI BibTeX RDF
1	Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo A. L. Reis	Probabilistic Approach for Yield Analysis of Dynamic Logic Circuits.	IEEE Trans. on Circuits and Systems	2008	DBLP DOI BibTeX RDF
1	Egas Henes Neto, Gilson I. Wirth, Fernanda Lima Kastensmidt	Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors.	J. Electronic Testing	2008	DBLP DOI BibTeX RDF	Fault-tolerance, Reliability, Testing, Built-in tests, Error-checking
1	Peter Glösekötter, Ulrich Greveler, Gilson I. Wirth	Device degradation and resilient computing.	ISCAS	2008	DBLP DOI BibTeX RDF
1	Christian Jesús B. Fayomi, Gilson I. Wirth, Jaime Ramírez-Angulo, Akira Matsuzawa	"The flipped voltage follower"-based low voltage fully differential CMOS sample-and-hold circuit.	ISCAS	2008	DBLP DOI BibTeX RDF
1	Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo Augusto da Luz Reis	Técnicas probabilísticas para análise de yield em nível elétrico usando propagação de erros e derivadas numéricas.	RITA	2007	DBLP BibTeX RDF
1	Carlos Arthur Lang Lisbôa, Fernanda Lima Kastensmidt, Egas Henes Neto, Gilson I. Wirth, Luigi Carro	Using built-in sensors to cope with long duration transient faults in future technologies.	ITC	2007	DBLP DOI BibTeX RDF
1	Lucas Brusamarello, Roberto da Silva, Ricardo A. L. Reis, Gilson I. Wirth	Yield Analysis by Error Propagation Using Numerical Derivatives Considering WD and D2D variations.	ISVLSI	2007	DBLP DOI BibTeX RDF
1	Dalton M. Colombo, Gilson I. Wirth, Sergio Bampi	Trim range limited by noise in bandgap voltage references.	SBCCI	2007	DBLP DOI BibTeX RDF	bandgap, trim circuit, noise, CMOS, voltage reference
1	Egas Henes Neto, Fernanda Lima Kastensmidt, Gilson I. Wirth	A built-in current sensor for high speed soft errors detection robust to process and temperature variations.	SBCCI	2007	DBLP DOI BibTeX RDF	fault-tolerance, process variations, built-in current sensor
1	Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo A. L. Reis	Obtaining delay distribution of dynamic logic circuits by error propagation at the electrical level.	VLSI-SoC	2007	DBLP DOI BibTeX RDF
1	Gustavo Neuberger, Fernanda Gusmão de Lima Kastensmidt, Ricardo Reis, Gilson I. Wirth, Ralf Brederlow, Christian Pacha	Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies.	VLSI-SoC	2007	DBLP DOI BibTeX RDF
1	Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt	Using Bulk Built-in Current Sensors to Detect Soft Errors.	IEEE Micro	2006	DBLP DOI BibTeX RDF	Reliability, Built-in tests, Error-checking, Testing and Fault-Tolerance
1	Gilson I. Wirth, Ivandro Ribeiro, Michele G. Vieira, Fernanda Gusmão de Lima Kastensmidt	Single event transients in dynamic logic.	SBCCI	2006	DBLP DOI BibTeX RDF	integrated circuits, dynamic logic, single event transients
1	Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt	Generation and Propagation of Single Event Transients in CMOS Circuits.	DDECS	2006	DBLP BibTeX RDF
1	Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt	Single event transients in combinatorial circuits.	SBCCI	2005	DBLP DOI BibTeX RDF	soft errors, integrated circuits, single event transients
1	Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt	Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic.	SBCCI	2005	DBLP DOI BibTeX RDF	SEU and soft error detection, SET, BICS

Publications of Gilson I. Wirth Gilson Inacio Wirth ( http://dblp.L3S.de/Authors/Gilson_I._Wirth )