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GrowBag graphs for keyword ? (Num. hits/coverage)
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Found 6 publication records. Showing 6 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Stanislav Tyaginov, Ivan Starkov, Hubert Enichlmair, C. Jungemann, J. M. Park, E. Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser |
An analytical approach for physical modeling of hot-carrier induced degradation.  |
Microelectronics Reliability  |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | R. L. de Orio, Hajdin Ceric, Siegfried Selberherr |
A compact model for early electromigration failures of copper dual-damascene interconnects. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Lado Filipovic, Hajdin Ceric, Johann Cervenka, Siegfried Selberherr |
A simulator for local anodic oxidation of silicon surfaces. |
CCECE |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Stanislav Tyaginov, Ivan Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, S. Carniello, J. M. Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, E. Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser |
Interface traps density-of-states as a vital component for hot-carrier degradation modeling. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | R. L. de Orio, Hajdin Ceric, Siegfried Selberherr |
Physically based models of electromigration: From Black's equation to modern TCAD models. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Hajdin Ceric, Siegfried Selberherr |
Simulative prediction of the resistance change due to electromigration induced void evolution. |
Microelectronics Reliability |
2002 |
DBLP DOI BibTeX RDF |
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