Search results for "Hei Wong"

Hits ?▲	Authors	Title	Venue	Year	Link
1	Hei Wong	Advances in non-volatile memory technology.	Microelectronics Reliability	2012	DBLP DOI BibTeX RDF
1	Wing-Shan Tam, Sik-Lam Siu, Bing-Liang Yang, Chi-Wah Kok, Hei Wong	Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation.	Microelectronics Reliability	2011	DBLP DOI BibTeX RDF
1	Wing-Shan Tam, Oi-Ying Wong, Ka-Yan Mok, Chi-Wah Kok, Hei Wong	An Energy Efficient Half-Static Clock-Gating d-Type flip-Flop.	Journal of Circuits, Systems, and Computers	2010	DBLP DOI BibTeX RDF
1	Oi-Ying Wong, Wing-Shan Tam, Jun Liu, Oi-Kan Shea, Shiu Hung Cheung, Chi-Wah Kok, Hei Wong	Modeling of high-frequency characteristics for epoxy-sealed micro vacuum capacitors.	Microelectronics Reliability	2010	DBLP DOI BibTeX RDF
1	Wing-Shan Tam, Oi-Ying Wong, Tsz-Ching Ng, Chi-Wah Kok, Hei Wong	Analysis of ESD discharge current distribution and area optimization of VDMOS gate protection structure.	Microelectronics Reliability	2010	DBLP DOI BibTeX RDF
1	Yu. N. Novikov, A. V. Vishnyakov, V. A. Gritsenko, K. A. Nasyrov, Hei Wong	Modeling the charge transport mechanism in amorphous Al2O3 with multiphonon trap ionization effect.	Microelectronics Reliability	2010	DBLP DOI BibTeX RDF
1	Wing-Shan Tam, Oi-Ying Wong, Chi-Wah Kok, Hei Wong	Generating sub-1V reference voltages from a resistorless CMOS bandgap reference circuit by using a piecewise curvature temperature compensation technique.	Microelectronics Reliability	2010	DBLP DOI BibTeX RDF
1	Sik-Lam Siu, Hei Wong, Wing-Shan Tam, Kuniyuki Kakushima, Hiroshi Iwai	Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors.	Microelectronics Reliability	2009	DBLP DOI BibTeX RDF
1	Oi-Ying Wong, Wing-Shan Tam, Oi-Kan Shea, Shiu Hung Cheung, Jun Liu, Chi-Wah Kok, Hei Wong	Effects of periphery encapsulation material on the characteristics of micro vacuum dielectric capacitor.	Microelectronics Reliability	2009	DBLP DOI BibTeX RDF
1	Oi-Ying Wong, Wing-Shan Tam, Chi-Wah Kok, Hei Wong	Area Efficient 2n× Switched Capacitor Charge Pump.	ISCAS	2009	DBLP DOI BibTeX RDF
1	Banani Sen, Bing-Liang Yang, Hei Wong, Chi-Wah Kok, P. K. Chu, A. Huang	Effects of aluminum incorporation on hafnium oxide film using plasma immersion ion implantation.	Microelectronics Reliability	2008	DBLP DOI BibTeX RDF
1	C. K. Wong, Hei Wong, M. Chan, Y. T. Chow, H. P. Chan	Silicon oxynitride integrated waveguide for on-chip optical interconnects applications.	Microelectronics Reliability	2008	DBLP DOI BibTeX RDF
1	Sergey Shaimeev, Vladimir Gritsenko, Kaupo Kukli, Hei Wong, Eun-Hong Lee, Chungwoo Kim	Single band electronic conduction in hafnium oxide prepared by atomic layer deposition.	Microelectronics Reliability	2007	DBLP DOI BibTeX RDF
1	Hei Wong, V. Filip, C. K. Wong, P. S. Chung	Silicon integrated photonics begins to revolutionize.	Microelectronics Reliability	2007	DBLP DOI BibTeX RDF
1	V. Filip, Hei Wong, D. Nicolaescu	Definition of curve fitting parameter to study tunneling and trapping of electrons in Si/ultra-thin SiO2/metal structures.	Microelectronics Reliability	2006	DBLP DOI BibTeX RDF
1	C. K. Wong, Hei Wong, M. Chan, Chi-Wah Kok, H. P. Chan	Minimizing hydrogen content in silicon oxynitride by thermal oxidation of silicon-rich silicon nitride.	Microelectronics Reliability	2006	DBLP DOI BibTeX RDF
1	Nian Zhan, M. C. Poon, Hei Wong, K. L. Ng, Chi-Wah Kok	Dielectric breakdown characteristics and interface trapping of hafnium oxide films.	Microelectronics Journal	2005	DBLP DOI BibTeX RDF
1	Bing-Liang Yang, P. T. Lai, Hei Wong	Conduction mechanisms in MOS gate dielectric films.	Microelectronics Reliability	2004	DBLP DOI BibTeX RDF
1	K. L. Ng, Nian Zhan, Chi-Wah Kok, M. C. Poon, Hei Wong	Electrical characterization of the hafnium oxide prepared by direct sputtering of Hf in oxygen with rapid thermal annealing.	Microelectronics Reliability	2003	DBLP DOI BibTeX RDF
1	Jackie Chan, Hei Wong, M. C. Poon, Chi-Wah Kok	Oxynitride gate dielectric prepared by thermal oxidation of low-pressure chemical vapor deposition silicon-rich silicon nitride.	Microelectronics Reliability	2003	DBLP DOI BibTeX RDF
1	Hei Wong	Low-frequency noise study in electron devices: review and update.	Microelectronics Reliability	2003	DBLP DOI BibTeX RDF
1	V. A. Gritsenko, A. V. Shaposhnikov, Yu. N. Novikov, A. P. Baraban, Hei Wong, G. M. Zhidomirov, M. Roger	Onefold coordinated oxygen atom: an electron trap in the silicon oxide.	Microelectronics Reliability	2003	DBLP DOI BibTeX RDF
1	Bing-Liang Yang, N. W. Cheung, S. Denholm, J. Shao, Hei Wong, P. T. Lai, Y. C. Cheng	Ultra-shallow n+p junction formed by PH3 and AsH3 plasma immersion ion implantation.	Microelectronics Reliability	2002	DBLP DOI BibTeX RDF
1	Hei Wong, V. A. Gritsenko	Defects in silicon oxynitride gate dielectric films.	Microelectronics Reliability	2002	DBLP DOI BibTeX RDF
1	Hei Wong	Recent developments in silicon optoelectronic devices.	Microelectronics Reliability	2002	DBLP DOI BibTeX RDF
1	P. G. Han, Hei Wong, Andy H. P. Chan, M. C. Poon	A novel approach for fabricating light-emitting porous polysilicon films.	Microelectronics Reliability	2002	DBLP DOI BibTeX RDF
1	M. C. Poon, Y. Gao, Ted Chi-Wah Kok, A. M. Myasnikov, Hei Wong	SIMS study of silicon oxynitride prepared by oxidation of silicon-rich silicon nitride layer.	Microelectronics Reliability	2001	DBLP DOI BibTeX RDF
1	Hei Wong, P. G. Han, M. C. Poon, Y. Gao	Investigation of the surface silica layer on porous poly-Si thin films.	Microelectronics Reliability	2001	DBLP DOI BibTeX RDF

Publications of "Hei Wong" ( http://dblp.L3S.de/Authors/Hei_Wong )