Search results for "Hideo Tamamoto"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Katsuya Fujiwara, Hideo Fujiwara, Hideo Tamamoto	Differential Behavior Equivalent Classes of Shift Register Equivalents for Secure and Testable Scan Design.	IEICE Transactions	2011	DBLP BibTeX RDF
1	Hideo Fujiwara, Katsuya Fujiwara, Hideo Tamamoto	Secure scan design using shift register equivalents against differential behavior attack.	ASP-DAC	2011	DBLP DOI BibTeX RDF
1	Takeshi Miura, Kazutaka Mitobe, Takashi Yukawa, Takaaki Kaiga, Toshiyuki Taniguchi, Hideo Tamamoto	Adaptation of Grouping Structure Analysis in GTTM to Hierarchical Segmentation of Dance Motion.	JIP	2010	DBLP DOI BibTeX RDF
1	Takeshi Miura, Kazutaka Mitobe, Takashi Yukawa, Takaaki Kaiga, Toshiyuki Taniguchi, Hideo Tamamoto	Extraction of Motion Characteristics in Dances by Statistical Analysis of Joint Motions.	JIP	2010	DBLP DOI BibTeX RDF
1	Takeshi Miura, Kazutaka Mitobe, Takaaki Kaiga, Takashi Yukawa, Toshiyuki Taniguchi, Hideo Tamamoto, Noboru Yoshimura	Multi-level segmentation of dance motion by piecewise regression.	SIGGRAPH Posters	2010	DBLP DOI BibTeX RDF
1	Hiroshi Yokoyama, Hideo Tamamoto, Kewal K. Saluja	Controlling Peak Power Consumption for Scan Based Multiple Weighted Random BIST.	Asian Test Symposium	2010	DBLP DOI BibTeX RDF
1	Katsuya Fujiwara, Hideo Fujiwara, Marie Engelene J. Obien, Hideo Tamamoto	SREEP: Shift Register Equivalents Enumeration and Synthesis Program for secure scan design.	DDECS	2010	DBLP DOI BibTeX RDF
1	Takeshi Miura, Kazutaka Mitobe, Takaaki Kaiga, Takashi Yukawa, Toshiyuki Taniguchi, Hideo Tamamoto	Qualitative evaluation of quantitative dance motion data.	SIGGRAPH ASIA Posters	2009	DBLP DOI BibTeX RDF
1	Takeshi Miura, Kazutaka Mitobe, Takaaki Kaiga, Takashi Yukawa, Toshiyuki Taniguchi, Hideo Tamamoto	Extraction of characteristic postures in a dance by statistical analysis of a database of motion data.	SIGGRAPH Posters	2009	DBLP DOI BibTeX RDF
1	Xiaoqing Wen, Seiji Kajihara, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita	On Design for IDDQ-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies.	IEICE Transactions	2005	DBLP DOI BibTeX RDF
1	Xiaoqing Wen, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita	Fault Diagnosis of Physical Defects Using Unknown Behavior Model.	J. Comput. Sci. Technol.	2005	DBLP DOI BibTeX RDF
1	Takashi Yukawa, Naoko Obara, Hideo Tamamoto	Automatic Construction of the Motion Database which Allows to Search Contents by a Motion Name.	MVA	2005	DBLP BibTeX RDF
1	Xiaoqing Wen, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita	Fault Diagnosis for Physical Defects of Unknown Behaviors.	Asian Test Symposium	2003	DBLP DOI BibTeX RDF
1	Hiroshi Yokoyama, Xiaoqing Wen, Hideo Tamamoto	Random pattern testable design with partial circuit duplication and IDDQ testing.	Systems and Computers in Japan	1999	DBLP DOI BibTeX RDF
1	Josep Altet, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire, E. Schaub, Hideo Tamamoto	Differential Thermal Testing: An Approach to its Feasibility.	J. Electronic Testing	1999	DBLP DOI BibTeX RDF	test of integrated circuits, built-in self testing, thermal testing, thermal sensors
1	Xiaoqing Wen, Tooru Honzawa, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita	Design for Diagnosability of CMOS Circuits.	Asian Test Symposium	1998	DBLP DOI BibTeX RDF
1	Xiaoqing Wen, Hideo Tamamoto, Kozo Kinoshita	IDDQ test vector selection for transistor short fault testing.	Systems and Computers in Japan	1997	DBLP DOI BibTeX RDF
1	Josep Altet, Antonio Rubio, Hideo Tamamoto	Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	Test Pattern Generation, Thermal Testing, Thermal Sensors
1	Hiroshi Yokoyama, Xiaoqing Wen, Hideo Tamamoto	Random Pattern Testable Design with Partial Circuit Duplication.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	Partial circuit duplication, Random testing Built-in self test, Design for testability
1	Xiaoqing Wen, Kozo Kinoshita, Hideo Tamamoto, Hiroshi Yokoyama	Efficient Guided-Probe Fault Location Method for Sequential Circuits.	IEICE Transactions	1995	DBLP BibTeX RDF
1	Xiaoqing Wen, Hideo Tamamoto, Kozo Kinoshita	Testing of k-FR Circuits under Highly Observable Condition.	IEICE Transactions	1995	DBLP BibTeX RDF
1	Xiaoqing Wen, Hideo Tamamoto, Kozo Kinoshita	Transistor leakage fault location with ZDDQ measurement.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	field effect transistor circuits, transistor leakage fault location, I/sub DDQ/ measurement, equivalence fault collapsing, diagnosed faults, gate-array circuit, fault diagnosis, logic testing, random tests, fault location, CMOS logic circuits, leakage currents, logic arrays, CMOS circuit, deterministic tests, electric current measurement, diagnostic resolution
1	Hideo Tamamoto, Yuichi Narita, Akira Yanase, Futoshi Saito, Kazuto Komatsu	A Measuring System for Traffic Flow of Passers-by by Processing ITV Image in Real Time.	MVA	1992	DBLP BibTeX RDF

Publications of "Hideo Tamamoto" ( http://dblp.L3S.de/Authors/Hideo_Tamamoto )