Search results for "Ho Fai Ko"

Found 16 publication records. Showing 16 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Ho Fai Ko, Adam B. Kinsman, Nicola Nicolici	Design-for-Debug Architecture for Distributed Embedded Logic Analysis.	IEEE Trans. VLSI Syst.	2011	DBLP DOI BibTeX RDF
1	Ho Fai Ko, Nicola Nicolici	Automated trace signals selection using the RTL descriptions.	ITC	2010	DBLP DOI BibTeX RDF
1	Ho Fai Ko, Nicola Nicolici	Combining scan and trace buffers for enhancing real-time observability in post-silicon debugging.	European Test Symposium	2010	DBLP DOI BibTeX RDF
1	Ho Fai Ko, Nicola Nicolici	Algorithms for State Restoration and Trace-Signal Selection for Data Acquisition in Silicon Debug.	IEEE Trans. on CAD of Integrated Circuits and Systems	2009	DBLP DOI BibTeX RDF
1	Nicola Nicolici, Ho Fai Ko	Design-for-debug for post-silicon validation: Can high-level descriptions help?	HLDVT	2009	DBLP DOI BibTeX RDF
1	Ho Fai Ko, Nicola Nicolici	Resource-Efficient Programmable Trigger Units for Post-Silicon Validation.	European Test Symposium	2009	DBLP DOI BibTeX RDF	programmable trigger unit, false trigger analysis, post-silicon validation
1	Ho Fai Ko, Nicola Nicolici	Automated Scan Chain Division for Reducing Shift and Capture Power During Broadside At-Speed Test.	IEEE Trans. on CAD of Integrated Circuits and Systems	2008	DBLP DOI BibTeX RDF
1	Ho Fai Ko, Nicola Nicolici	Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy.	J. Electronic Testing	2008	DBLP DOI BibTeX RDF	Skewed-load, Scan division, At-speed test, Low-power test
1	Ho Fai Ko, Nicola Nicolici	A Novel Automated Scan Chain Division Method for Shift and Capture Power Reduction in Broadside At-Speed Test.	ISQED	2008	DBLP DOI BibTeX RDF
1	Ho Fai Ko, Adam B. Kinsman, Nicola Nicolici	Distributed Embedded Logic Analysis for Post-Silicon Validation of SOCs.	ITC	2008	DBLP DOI BibTeX RDF
1	Ho Fai Ko, Nicola Nicolici	On Automated Trigger Event Generation in Post-Silicon Validation.	DATE	2008	DBLP DOI BibTeX RDF
1	Ho Fai Ko, Nicola Nicolici	Automated Trace Signals Identification and State Restoration for Improving Observability in Post-Silicon Validation.	DATE	2008	DBLP DOI BibTeX RDF
1	Ho Fai Ko, Nicola Nicolici	RTL Scan Design for Skewed-Load At-speed Test under Power Constraints.	ICCD	2006	DBLP BibTeX RDF
1	Ho Fai Ko, Qiang Xu, Nicola Nicolici	Register-transfer level functional scan for hierarchical designs.	ASP-DAC	2005	DBLP DOI BibTeX RDF
1	Ho Fai Ko, Nicola Nicolici	Functional Scan Chain Design at RTL for Skewed-Load Delay Fault Testing.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF	High-level DFT, Delay-fault testing
1	Ho Fai Ko, Nicola Nicolici	Functional Illinois Scan Design at RTL.	ICCD	2004	DBLP DOI BibTeX RDF

Publications of "Ho Fai Ko" ( http://dblp.L3S.de/Authors/Ho_Fai_Ko )