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Found 5 publication records. Showing 5 according to the selection in the facets
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Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Stanislav Tyaginov, Ivan Starkov, Hubert Enichlmair, C. Jungemann, J. M. Park, E. Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser |
An analytical approach for physical modeling of hot-carrier induced degradation.  |
Microelectronics Reliability  |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Stanislav Tyaginov, Ivan Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, S. Carniello, J. M. Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, E. Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser |
Interface traps density-of-states as a vital component for hot-carrier degradation modeling. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | M. Schrems, M. Knaipp, Hubert Enichlmair, V. Vescoli, Rainer Minixhofer, E. Seebacher, F. Leisenberger, E. Wachmann, G. Schatzberger, H. Gensinger |
Scalable High Voltage CMOS technology for Smart Power and sensor applications. |
Elektrotechnik und Informationstechnik |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Robert Entner, Tibor Grasser, Oliver Triebl, Hubert Enichlmair, Rainer Minixhofer |
Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Hubert Enichlmair, S. Carniello, J. M. Park, Rainer Minixhofer |
Analysis of hot carrier effects in a 0.35 µm high voltage n-channel LDMOS transistor. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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