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Found 7 publication records. Showing 7 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Stanislav Tyaginov, Ivan Starkov, Hubert Enichlmair, C. Jungemann, J. M. Park, E. Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser |
An analytical approach for physical modeling of hot-carrier induced degradation.  |
Microelectronics Reliability  |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Stanislav Tyaginov, Ivan Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, S. Carniello, J. M. Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, E. Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser |
Interface traps density-of-states as a vital component for hot-carrier degradation modeling. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Hubert Enichlmair, S. Carniello, J. M. Park, Rainer Minixhofer |
Analysis of hot carrier effects in a 0.35 µm high voltage n-channel LDMOS transistor. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | M. Knaipp, J. M. Park, V. Vescoli |
Evolution of a CMOS Based Lateral High Voltage Technology Concept. |
Microelectronics Journal |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | J. M. Park, R. Klima, Siegfried Selberherr |
High-voltage lateral trench gate SOI-LDMOSFETs. |
Microelectronics Journal |
2004 |
DBLP DOI BibTeX RDF |
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| 1 | J. M. Park, S. W. Choi, S. C. Park, B. W. Yoon |
Secure web PACS using government-licensed certificate. |
CARS |
2004 |
DBLP BibTeX RDF |
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| 1 | T. Ayalew, Andreas Gehring, J. M. Park, Tibor Grasser, Siegfried Selberherr |
Improving SiC lateral DMOSFET reliability under high field stress. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
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