| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Baker Mohammad, Jacob A. Abraham |
A reduced voltage swing circuit using a single supply to enable lower voltage operation for SRAM-based memory.  |
Microelectronics Journal  |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham |
Path Criticality Computation in Parameterized Statistical Timing Analysis Using a Novel Operator. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Jaeyong Chung, Jacob A. Abraham |
Refactoring of Timing Graphs and Its Use in Capturing Topological Correlation in SSTA. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Junyoung Park, H. Mert Ustun, Jacob A. Abraham |
Run-time Prediction of the Optimal Performance Point in DVS-based Dynamic Thermal Management. |
VLSI Design |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Hyunjin Kim, Jacob A. Abraham |
On-chip source synchronous interface timing test scheme with calibration. |
DATE |
2012 |
DBLP BibTeX RDF |
|
| 1 | Ramtilak Vemu, Jacob A. Abraham |
CEDA: Control-Flow Error Detection Using Assertions. |
IEEE Trans. Computers |
2011 |
DBLP DOI BibTeX RDF |
Control-flow errors, software-based detection, fault tolerance, error detection |
| 1 | Byoungho Kim, Jacob A. Abraham |
Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic Specifications. |
IEEE T. Instrumentation and Measurement |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Byoungho Kim, Jacob A. Abraham |
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. |
IEEE Trans. on Circuits and Systems |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Kihyuk Han, Joonsung Park, Jae Wook Lee, Jaeyong Chung, Eonjo Byun, Cheol-Jong Woo, Sejang Oh, Jacob A. Abraham |
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. |
J. Electronic Testing |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Joonsung Park, Hongjoong Shin, Jacob A. Abraham |
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model. |
J. Electronic Testing |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Junyoung Park, Jacob A. Abraham |
A fast, accurate and simple critical path monitor for improving energy-delay product in DVS systems. |
ISLPED |
2011 |
DBLP BibTeX RDF |
|
| 1 | Eun Jung Jang, Jaeyong Chung, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham |
Post-Silicon Timing Validation Method Using Path Delay Measurements. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Hyunjin Kim, Jacob A. Abraham |
On-Chip Programmable Dual-Capture for Double Data Rate Interface Timing Test. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham |
Testability driven statistical path selection. |
DAC |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Tung-Yeh Wu, Shih-Hsin Hu, Jacob A. Abraham |
Robust power gating reactivation by dynamic wakeup sequence throttling. |
ASP-DAC |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham |
Path criticality computation in parameterized statistical timing analysis. |
ASP-DAC |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Joonsoo Kim, Joonsoo Lee, Jacob A. Abraham |
System accuracy estimation of SRAM-based device authentication. |
ASP-DAC |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham |
Efficient and product-representative timing model validation. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Jacob A. Abraham |
Tutorial: "Manufacturing test of systems-on-a-chip (SoCs)". |
SoCC |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Hongjoong Shin, Joonsung Park, Jacob A. Abraham |
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. |
J. Electronic Testing |
2010 |
DBLP BibTeX RDF |
|
| 1 | Ramyanshu Datta, Antony Sebastine, Ashwin Raghunathan, Gary D. Carpenter, Kevin J. Nowka, Jacob A. Abraham |
On-Chip Delay Measurement Based Response Analysis for Timing Characterization. |
J. Electronic Testing |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Sachin Dileep Dasnurkar, Jacob A. Abraham |
Real-time dynamic hybrid BiST solution for Very-Low-Cost ATE production testing of A/D converters with controlled DPPM. |
ISQED |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Hyunjin Kim, Jacob A. Abraham |
A Low Cost Built-In Self-Test Circuit for High-Speed Source Synchronous Memory Interfaces. |
Asian Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Joonsung Park, Jae Wook Lee, Jaeyong Chung, Kihyuk Han, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh |
At-speed Test of High-Speed DUT Using Built-Off Test Interface. |
Asian Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham |
A delay measurement method using a shrinking clock signal. |
ACM Great Lakes Symposium on VLSI |
2010 |
DBLP DOI BibTeX RDF |
edge placement accuracy, tester, measurement, delay |
| 1 | Sachin Dileep Dasnurkar, Jacob A. Abraham |
Calibration-enabled scalable built-in current sensor compatible with very low cost ATE. |
European Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Hyunjin Kim, Jaeyong Chung, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo |
A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge control. |
European Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Ji Hwan (Paul) Chun, Jae Wook Lee, Jacob A. Abraham |
A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection. |
ASP-DAC |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Jaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo |
Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Mohamad A. Zeidan, Aritra Banerjee, Ranjit Gharpurey, Jacob A. Abraham |
Multitone digital signal based test for RF receivers. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Shakeel S. Abdulla, Haewoon Nam, Earl E. Swartzlander Jr., Jacob A. Abraham |
High speed recursion-free CORDIC architecture. |
SoCC |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Tung-Yeh Wu, Sriram Sambamurthy, Jacob A. Abraham |
Estimation of maximum application-level power supply noise. |
SoCC |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Joonsoo Kim, Joonsoo Lee, Jacob A. Abraham |
Toward reliable SRAM-based device identification. |
ICCD |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Vinod Viswanath, Shobha Vasudevan, Jacob A. Abraham |
Dedicated Rewriting: Automatic Verification of Low Power Transformations in Register Transfer Level. |
J. Low Power Electronics |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Rajeshwary Tayade, Jacob A. Abraham |
Critical Path Selection for Delay Testing Considering Coupling Noise. |
J. Electronic Testing |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Savithri Sundareswaran, Rajendran Panda, Jacob A. Abraham, Yun Zhang, Amit Mittal |
Characterization of sequential cells for constraint sensitivities. |
ISQED |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Sriram Sambamurthy, Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham |
Functionally valid gate-level peak power estimation for processors. |
ISQED |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham |
A Random Jitter RMS Estimation Technique for BIST Applications. |
Asian Test Symposium |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Joonsung Park, Jaeyong Chung, Jacob A. Abraham |
LFSR-Based Performance Characterization of Nonlinear Analog and Mixed-Signal Circuits. |
Asian Test Symposium |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Rajeshwary Tayade, Jacob A. Abraham |
Critical Path Selection for Delay Test Considering Coupling Noise. |
European Test Symposium |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh |
Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. |
European Test Symposium |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Jaeyong Chung, Jacob A. Abraham |
Recursive Path Selection for Delay Fault Testing. |
VTS |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham |
On-Line Calibration and Power Optimization of RF Systems Using a Built-In Detector. |
VTS |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Vinod Viswanath, Shobha Vasudevan, Jacob A. Abraham |
Dedicated Rewriting: Automatic Verification of Low Power Transformations in RTL. |
VLSI Design |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Sachin Dileep Dasnurkar, Jacob A. Abraham |
Hybrid BiST Solution for Analog to Digital Converters with Low-cost Automatic Test Equipment Compatibility. |
ISCAS |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Tung-Yeh Wu, Samaneh Gharahi, Jacob A. Abraham |
An Area Efficient On-chip Static IR Drop Detector/Evaluator. |
ISCAS |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Shih-Hsin Hu, Tung-Yeh Wu, Jacob A. Abraham |
SNR-Aware Error Detection for Low-Power Discrete Wavelet Lifting Transform in JPEG 2000. |
DFT |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Abhijit Chatterjee, Jacob A. Abraham, Adit D. Singh, Elie Maricau, Rakesh Kumar, Chris Papachristou |
Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?. |
IOLTS |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Shih-Hsin Hu, Jacob A. Abraham |
Error detection in 2-D Discrete Wavelet lifting transforms. |
IOLTS |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Jaeyong Chung, Jacob A. Abraham |
A hierarchy of subgraphs underlying a timing graph and its use in capturing topological correlation in SSTA. |
ICCAD |
2009 |
DBLP BibTeX RDF |
|
| 1 | Shakeel S. Abdulla, Haewoon Nam, Mark McDermot, Jacob A. Abraham |
A high throughput FFT processor with no multipliers. |
ICCD |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Shobha Vasudevan, Vinod Viswanath, Jacob A. Abraham, Jiajin Tu |
Sequential equivalence checking between system level and RTL descriptions. |
Design Autom. for Emb. Sys. |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Rajeshwary Tayade, Jacob A. Abraham |
Small-delay defect detection in the presence of process variations. |
Microelectronics Journal |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Ramyanshu Datta, Ravi Gupta, Antony Sebastine, Jacob A. Abraham, Manuel A. d'Abreu |
Controllability of Static CMOS Circuits for Timing Characterization. |
J. Electronic Testing |
2008 |
DBLP DOI BibTeX RDF |
Design for test, Delay fault testing, Scan design |
| 1 | Ramyanshu Datta, Jacob A. Abraham, Abdulkadir Utku Diril, Abhijit Chatterjee, Kevin J. Nowka |
Performance-Optimized Design for Parametric Reliability. |
J. Electronic Testing |
2008 |
DBLP DOI BibTeX RDF |
Adaptive design, Process variation compensation, Parametric reliability, Noise tolerance |
| 1 | Savithri Sundareswaran, Jacob A. Abraham, Alexandre Ardelea, Rajendran Panda |
Characterization of Standard Cells for Intra-Cell Mismatch Variations. |
ISQED |
2008 |
DBLP DOI BibTeX RDF |
Statistical Characterization, Intra-Cell Variations, Random Variations, Mismatch Variations |
| 1 | Baker Mohammad, Martin Saint-Laurent, Paul Bassett, Jacob A. Abraham |
Cache Design for Low Power and High Yield. |
ISQED |
2008 |
DBLP DOI BibTeX RDF |
reduce voltage swing, sram yield, SRAM 6T cell, cache design, parametric failure |
| 1 | Rajeshwary Tayade, Jacob A. Abraham |
On-chip Programmable Capture for Accurate Path Delay Test and Characterization. |
ITC |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham, Suriyaprakash Natarajan |
On efficient generation of instruction sequences to test for delay defects in a processor. |
ACM Great Lakes Symposium on VLSI |
2008 |
DBLP DOI BibTeX RDF |
native-mode self-test, delay test, software based self-test |
| 1 | Rajeshwary Tayade, Jacob A. Abraham |
Critical Path Selection for Delay Test Considering Coupling Noise. |
European Test Symposium |
2008 |
DBLP DOI BibTeX RDF |
Coupling noise, weighted partial max sat, critical path selection, delay test |
| 1 | Qingqi Dou, Jacob A. Abraham |
Jitter Decomposition in High-Speed Communication Systems. |
European Test Symposium |
2008 |
DBLP DOI BibTeX RDF |
Jitter Test, Jitter Analysis, Jitter Decomposition, Autocorrelation, Time domain |
| 1 | Rajeshwary Tayade, Sani R. Nassif, Jacob A. Abraham |
Analytical model for the impact of multiple input switching noise on timing. |
ASP-DAC |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham |
Low Cost RF Receiver Parameter Measurement with On-Chip Amplitude Detectors. |
VTS |
2008 |
DBLP DOI BibTeX RDF |
Amplitude detector, RF detector, RF receiver, Built-in test, RF test |
| 1 | Joonsung Park, Hongjoong Shin, Jacob A. Abraham |
Parallel Loopback Test of Mixed-Signal Circuits. |
VTS |
2008 |
DBLP DOI BibTeX RDF |
Test Quality and Reliability, Loopback Test, Characterization, Mixed-signal Test, Parallel Test |
| 1 | Byoungho Kim, Nash Khouzam, Jacob A. Abraham |
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. |
VTS |
2008 |
DBLP DOI BibTeX RDF |
Loopback Test, Aperture Jitter, Digital-to-Analog Converter, Analog-to-Digital Converter, ADC, Mixed-Signal Testing, DAC |
| 1 | Qingqi Dou, Jacob A. Abraham |
Low-cost Test of Timing Mismatch Among Time-Interleaved A/D Converters in High-speed Communication Systems. |
VTS |
2008 |
DBLP DOI BibTeX RDF |
Time-Interleaved ADC, Timing Mismatch, Mixed-signal testing, Low-cost test, High speed testing |
| 1 | Sriram Sambamurthy, Jacob A. Abraham, Raghuram S. Tupuri |
A Robust Top-Down Dynamic Power Estimation Methodology for Delay Constrained Register Transfer Level Sequential Circuits. |
VLSI Design |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Ramtilak Vemu, Abhijit Jas, Jacob A. Abraham, Srinivas Patil, Rajesh Galivanche |
A low-cost concurrent error detection technique for processor control logic. |
DATE |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Jacob A. Abraham |
Implications of Technology Trends on System Dependability. |
DATE |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Ramtilak Vemu, Jacob A. Abraham |
Budget-Dependent Control-Flow Error Detection. |
IOLTS |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Savithri Sundareswaran, Lucie Nechanicka, Rajendran Panda, Sergey Gavrilov, Roman Solovyev, Jacob A. Abraham |
A timing methodology considering within-die clock skew variations. |
SoCC |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Baker Mohammad, Stephen Bijansky, Adnan Aziz, Jacob A. Abraham |
Adaptive SRAM memory for low power and high yield. |
ICCD |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Shobha Vasudevan, Vinod Viswanath, Robert W. Sumners, Jacob A. Abraham |
Automatic Verification of Arithmetic Circuits in RTL Using Stepwise Refinement of Term Rewriting Systems. |
IEEE Trans. Computers |
2007 |
DBLP DOI BibTeX RDF |
Register Transfer Level implementation, Verification, Hardware Description Languages, arithmetic logic unit |
| 1 | Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham |
Predicting mixed-signal dynamic performance using optimised signature-based alternate test. |
IET Computers & Digital Techniques |
2007 |
DBLP BibTeX RDF |
|
| 1 | Shobha Vasudevan, E. Allen Emerson, Jacob A. Abraham |
Improved verification of hardware designs through antecedent conditioned slicing. |
STTT |
2007 |
DBLP DOI BibTeX RDF |
LTL property, Antecedent conditioned slicing, Verilog RTL, Model checking, Program slicing, Hardware description languages, Hardware verification |
| 1 | Joonsung Park, Hongjoong Shin, Jacob A. Abraham |
Pseudorandom Test for Nonlinear Circuits Based on a Simplified Volterra Series Model. |
ISQED |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Rajeshwary Tayade, Savithri Sundareswaran, Jacob A. Abraham |
Small-Delay Defect Detection in the Presence of Process Variations. |
ISQED |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham |
Built-In Test of RF Mixers Using RF Amplitude Detectors. |
ISQED |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Ramtilak Vemu, Sankar Gurumurthy, Jacob A. Abraham |
ACCE: Automatic correction of control-flow errors. |
ITC |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Rajeshwary Tayade, Vijay Kiran Kalyanam, Sani R. Nassif, Michael Orshansky, Jacob A. Abraham |
Estimating path delay distribution considering coupling noise. |
ACM Great Lakes Symposium on VLSI |
2007 |
DBLP DOI BibTeX RDF |
dynamic delay variation, coupling, crosstalk |
| 1 | Jen-Chieh Ou, Daniel G. Saab, Qiang Qiang, Jacob A. Abraham |
Reducing verification overhead with RTL slicing. |
ACM Great Lakes Symposium on VLSI |
2007 |
DBLP DOI BibTeX RDF |
verification, test, CAD |
| 1 | Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham, Daniel G. Saab |
Automatic Generation of Instructions to Robustly Test Delay Defects in Processors. |
European Test Symposium |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Byoungho Kim, Zhenhai Fu, Jacob A. Abraham |
Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications. |
VTS |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Jacob A. Abraham, Daniel G. Saab |
Tutorial T4A: Formal Verification Techniques and Tools for Complex Designs. |
VLSI Design |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Shobha Vasudevan, Vinod Viswanath, Jacob A. Abraham |
Efficient Microprocessor Verification using Antecedent Conditioned Slicing. |
VLSI Design |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Qingqi Dou, Jacob A. Abraham |
Jitter Decomposition by Time Lag Correlation. |
ISQED |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Jen-Chieh Ou, Daniel G. Saab, Jacob A. Abraham |
HDL Program Slicing to Reduce Bounded Model Checking Search Overhead. |
ITC |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Sankar Gurumurthy, Shobha Vasudevan, Jacob A. Abraham |
Automatic generation of instruction sequences targeting hard-to-detect structural faults in a processor. |
ITC |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Hongjoong Shin, Joonsung Park, Jacob A. Abraham |
Built-in Fault Diagnosis for Tunable Analog Systems Using an Ensemble Method. |
ITC |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Shobha Vasudevan, Jacob A. Abraham, Vinod Viswanath, Jiajin Tu |
Automatic decomposition for sequential equivalence checking of system level and RTL descriptions. |
MEMOCODE |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Sriram Sambamurthy, Jacob A. Abraham, Raghuram S. Tupuri |
Delay Constrained Register Transfer Level Dynamic Power Estimation. |
PATMOS |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham |
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters. |
European Test Symposium |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Qingqi Dou, Jacob A. Abraham |
Jitter decomposition in ring oscillators. |
ASP-DAC |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Hongjoong Shin, Byoungho Kim, Jacob A. Abraham |
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. |
VTS |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Ramyanshu Datta, Gary D. Carpenter, Kevin J. Nowka, Jacob A. Abraham |
A Scheme for On-Chip Timing Characterization. |
VTS |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Qiang Qiang, Daniel G. Saab, Jacob A. Abraham |
Checking Nested Properties Using Bounded Model Checking and Sequential ATPG. |
VLSI Design |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Vinod Viswanath, Jacob A. Abraham, Warren A. Hunt Jr. |
Automatic insertion of low power annotations in RTL for pipelined microprocessors. |
DATE |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Ramyanshu Datta, Jacob A. Abraham, Abdulkadir Utku Diril, Abhijit Chatterjee, Kevin J. Nowka |
Adaptive Design for Performance-Optimized Robustness. |
DFT |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Ramtilak Vemu, Jacob A. Abraham |
CEDA: Control-flow Error Detection through Assertions. |
IOLTS |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Shobha Vasudevan, E. Allen Emerson, Jacob A. Abraham |
Efficient Model Checking of Hardware Using Conditioned Slicing. |
Electr. Notes Theor. Comput. Sci. |
2005 |
DBLP DOI BibTeX RDF |
|
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