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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 11 occurrences of 11 keywords
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Results
Found 43 publication records. Showing 43 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Geng-Ming Chiu, James Chien-Mo Li |
A Secure Test Wrapper Design Against Internal and Boundary Scan Attacks for Embedded Cores.  |
IEEE Trans. VLSI Syst.  |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Chester Liu, En-Hua Ma, Wen-En Wei, Chien-Mo James Li, I-Chun Cheng, Yung-Hui Yeh |
Placement Optimization of Flexible TFT Digital Circuits. |
IEEE Design & Test of Computers |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Shianling Wu, Laung-Terng Wang, Xiaoqing Wen, Zhigang Jiang, Lang Tan, Yu Zhang, Yu Hu, Wen-Ben Jone, Michael S. Hsiao, James Chien-Mo Li, Jiun-Lang Huang, Lizhen Yu |
Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Kuan-Yu Liao, Chia-Yuan Chang, James Chien-Mo Li |
A Parallel Test Pattern Generation Algorithm to Meet Multiple Quality Objectives. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | W.-C. Wang, C.-Y. Hsu, James Chien-Mo Li, Y.-C. Sung, A. Rao, L.-T. Wang |
Row-linear feedback shift register-column x-masking technique for simultaneous testing of many-core system chips. |
IET Computers & Digital Techniques |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Chi-Hsuan Cheng, James Chien-Mo Li |
An Asynchronous Design for Testability and Implementation in Thin-film Transistor Technology. |
J. Electronic Testing |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Jen-Yang Wen, Yu-Chuan Huang, Min-Hong Tsai, Kuan-Yu Liao, James Chien-Mo Li, Ming-Tung Chang, Min-Hsiu Tsai, Chih-Mou Tseng, Hung-Chun Li |
Test clock domain optimization for peak power supply noise reduction during scan. |
ITC |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Po-Juei Chen, Wei-Li Hsu, James Chien-Mo Li, Nan-Hsin Tseng, Kuo-Yin Chen, Wei-pin Changchien, Charles C. C. Liu |
An Accurate Timing-Aware Diagnosis Algorithm for Multiple Small Delay Defects. |
Asian Test Symposium |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Yu-Shun Wang, Min-Han Hsieh, Chia-Ming Liu, Chi-Wei Liu, James Chien-Mo Li, Charlie Chung-Ping Chen |
An at-speed self-testable technique for the high speed domino adder. |
CICC |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Wei-Chung Kao, Wei-Shun Chuang, Shiu-Ting Lin, Chien-Mo James Li, Vasco M. Manquinho |
DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-In. |
IEEE Trans. VLSI Syst. |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Chao-Hsuan Hsu, Chester Liu, En-Hua Ma, James Chien-Mo Li |
Static timing analysis for flexible TFT circuits. |
DAC |
2010 |
DBLP DOI BibTeX RDF |
flexible electronics, static timing analysis |
| 1 | Laung-Terng Wang, Nur A. Touba, Zhigang Jiang, Shianling Wu, Jiun-Lang Huang, James Chien-Mo Li |
CSER: BISER-based concurrent soft-error resilience. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Shiue-Tsung Shen, Wei-Hsiao Liu, Chien-Mo James Li, I-Chun Cheng |
Very-Low-Voltage testing of amorphous silicon TFT circuits. |
ITC |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Bing-Chuan Bai, Chien-Mo James Li, Augusli Kifli, Even Tsai, Kun-Cheng Wu |
Power scan: DFT for power switches in VLSI designs. |
ITC |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Bing-Chuan Bai, Augusli Kifli, Chien-Mo James Li, Kun-Cheng Wu |
Fault modeling and testing of retention flip-flops in low power designs. |
ASP-DAC |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | F.-M. Wang, W.-C. Wang, James Chien-Mo Li |
Time-space test response compaction and diagnosis based on BCH codes. |
IET Computers & Digital Techniques |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Po-Juei Chen, James Chien-Mo Li, Hsing Jasmine Chao |
Bridging Fault Diagnosis to Identify the Layer of Systematic Defects. |
Asian Test Symposium |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Shiue-Tsung Shen, Wei-Hsiao Liu, En-Hua Ma, James Chien-Mo Li, I-Chun Cheng |
Very-Low-Voltage Testing of Amorphous Silicon TFT Circuits. |
Asian Test Symposium |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Tzuo-Fan Chien, Wen-Chi Chao, James Chien-Mo Li, Yao-Wen Chang, Kuan-Yu Liao, Ming-Tung Chang, Min-Hsiu Tsai, Chih-Mou Tseng |
BIST design optimization for large-scale embedded memory cores. |
ICCAD |
2009 |
DBLP BibTeX RDF |
|
| 1 | H.-T. Lin, J. C.-M. Li |
Simultaneous capture and shift power reduction test pattern generator for scan testing. |
IET Computers & Digital Techniques |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Wei-Shun Chuang, Shiu-Ting Lin, Wei-Chih Liu, James Chien-Mo Li |
Diagnosis of Multiple Scan Chain Timing Faults. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | James Chien-Mo Li, Po-Chou Lin, Chih-Ming Chiang, Chuo-Jan Pan, Chao-Wen Tseng |
Effective and Economic Phase Noise Testing for Single-Chip TV Tuners. |
IEEE T. Instrumentation and Measurement |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Yu-Te Liaw, Bing-Chuan Bai, James Chien-Mo Li |
A Two-level Simultaneous Test Data and Time Reduction Technique for SOC. |
J. Inf. Sci. Eng. |
2008 |
DBLP BibTeX RDF |
|
| 1 | Yu Huang 0005, Ruifeng Guo, Wu-Tung Cheng, James Chien-Mo Li |
Survey of Scan Chain Diagnosis. |
IEEE Design & Test of Computers |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Wei-Chih Liu, Wei-Lin Tsai, Hsiu-Ting Lin, James Chien-Mo Li |
Diagnosis of Logic-to-chain Bridging Faults. |
ITC |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Geng-Ming Chiu, James Chien-Mo Li |
IEEE 1500 Compatible Secure Test Wrapper For Embedded IP Cores. |
ITC |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Shianling Wu, Laung-Terng Wang, Zhigang Jiang, Jiayong Song, Boryau Sheu, Xiaoqing Wen, Michael S. Hsiao, James Chien-Mo Li, Jiun-Lang Huang, Ravi Apte |
On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs. |
DFT |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Chun-Yi Lee, James Chien-Mo Li |
Design and Chip Implementation of the Segment Weighted Random BIST for Low Power Testing. |
J. Low Power Electronics |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | James Chien-Mo Li, Hung-Mao Lin, Fang-Min Wang |
Column Parity Row Selection (CPRS) BIST Diagnosis Technique: Modeling and Analysis. |
IEEE Trans. Computers |
2007 |
DBLP DOI BibTeX RDF |
fault tolerance, reliability, testing, Diagnostics |
| 1 | Chun-Yi Lee, Hung-Mao Lin, Fang-Min Wang, James Chien-Mo Li |
Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies. |
ASP-DAC |
2007 |
DBLP DOI BibTeX RDF |
systematic defects, cyclic-column parity row selection technique, built-in self tested circuits, cyclic scan chains, masking circuitry, transient errors, circuit under test, nanometer technologies |
| 1 | Yu-Long Kao, Wei-Shun Chuang, James Chien-Mo Li |
Jump Simulation: A Technique for Fast and Precise Scan Chain Fault Diagnosis. |
ITC |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Chien-Mo James Li, Edward J. McCluskey |
Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Min-Hao Chiu, Chien-Mo James Li |
Jump Scan: A DFT Technique for Low Power Testing. |
VTS |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | James Chien-Mo Li |
Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns. |
IEICE Transactions |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | James Chien-Mo Li |
Diagnosis of Multiple Hold-Time and Setup-Time Faults in Scan Chains. |
IEEE Trans. Computers |
2005 |
DBLP DOI BibTeX RDF |
Fault diagnosis, ATPG, scan chain |
| 1 | James Chien-Mo Li |
Diagnosis of single stuck-at faults and multiple timing faults in scan chains. |
IEEE Trans. VLSI Syst. |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Hung-Mao Lin, James Chien-Mo Li |
Column parity and row selection (CPRS): a BIST diagnosis technique for multiple errors in multiple scan chains. |
ITC |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra |
ELF-Murphy Data on Defects and Test Sets. |
VTS |
2004 |
DBLP DOI BibTeX RDF |
|
| 1 | Chien-Mo James Li, Edward J. McCluskey |
Diagnosis of Sequence-Dependent Chips. |
VTS |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey |
Testing for resistive opens and stuck opens. |
ITC |
2001 |
DBLP DOI BibTeX RDF |
|
| 1 | Chien-Mo James Li, Edward J. McCluskey |
Diagnosis of Tunneling Opens. |
VTS |
2001 |
DBLP DOI BibTeX RDF |
|
| 1 | Chien-Mo James Li, Edward J. McCluskey |
Testing for tunneling opens. |
ITC |
2000 |
DBLP DOI BibTeX RDF |
|
| 1 | Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey |
Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. |
ITC |
1998 |
DBLP DOI BibTeX RDF |
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