Search results for "Janusz Rajski"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer	BIST-Based Fault Diagnosis for Read-Only Memories.	IEEE Trans. on CAD of Integrated Circuits and Systems	2011	DBLP DOI BibTeX RDF
1	Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, P. Szczerbicki, Jerzy Tyszer	Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression.	IEEE Trans. on CAD of Integrated Circuits and Systems	2011	DBLP DOI BibTeX RDF
1	Nilanjan Mukherjee, Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer	Ring Generator: An Ultimate Linear Feedback Shift Register.	IEEE Computer	2011	DBLP DOI BibTeX RDF
1	Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer	Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs.	J. Electronic Testing	2011	DBLP DOI BibTeX RDF
1	Janusz Rajski, Elham K. Moghaddam, Sudhakar M. Reddy	Low power compression utilizing clock-gating.	ITC	2011	DBLP DOI BibTeX RDF
1	Jakub Janicki, Jerzy Tyszer, Avijit Dutta, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski	EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism.	ITC	2011	DBLP DOI BibTeX RDF
1	Friedrich Hapke, Jürgen Schlöffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, M. Reese, J. Rearick, Jason Rivers	Cell-aware analysis for small-delay effects and production test results from different fault models.	ITC	2011	DBLP DOI BibTeX RDF
1	Xijiang Lin, Elham K. Moghaddam, Nilanjan Mukherjee, Benoit Nadeau-Dostie, Janusz Rajski, Jerzy Tyszer	Power Aware Embedded Test.	Asian Test Symposium	2011	DBLP DOI BibTeX RDF
1	Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Jakub Janicki	Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating.	Asian Test Symposium	2011	DBLP DOI BibTeX RDF
1	Michal Filipek, Yoshiaki Fukui, Hiroyuki Iwata, Grzegorz Mrugalski, Janusz Rajski, Masahiro Takakura, Jerzy Tyszer	Low Power Decompressor and PRPG with Constant Value Broadcast.	Asian Test Symposium	2011	DBLP DOI BibTeX RDF
1	Grzegorz Mrugalski, Artur Pogiel, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Pawel Urbanek	Fault Diagnosis in Memory BIST Environment with Non-march Tests.	Asian Test Symposium	2011	DBLP DOI BibTeX RDF
1	Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer	Reduced ATE Interface for High Test Data Compression.	European Test Symposium	2011	DBLP DOI BibTeX RDF	channel bandwidth management, embedded deterministic test, test interface, tri-modal compression, test data compression, scan-based designs
1	Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer	Diagnosis of Failing Scan Cells through Orthogonal Response Compaction.	European Test Symposium	2011	DBLP DOI BibTeX RDF
1	Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer	On Compaction Utilizing Inter and Intra-Correlation of Unknown States.	IEEE Trans. on CAD of Integrated Circuits and Systems	2010	DBLP DOI BibTeX RDF
1	Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer	High Volume Diagnosis in Memory BIST Based on Compressed Failure Data.	IEEE Trans. on CAD of Integrated Circuits and Systems	2010	DBLP DOI BibTeX RDF
1	Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jakub Janicki, Jerzy Tyszer	Dynamic channel allocation for higher EDT compression in SoC designs.	ITC	2010	DBLP DOI BibTeX RDF
1	Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Xijiang Lin, Nilanjan Mukherjee, Mark Kassab	Low capture power at-speed test in EDT environment.	ITC	2010	DBLP DOI BibTeX RDF
1	Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, P. Szczerbicki, Jerzy Tyszer	Low power compression of incompatible test cubes.	ITC	2010	DBLP DOI BibTeX RDF
1	Xijiang Lin, Janusz Rajski	Adaptive Low Shift Power Test Pattern Generator for Logic BIST.	Asian Test Symposium	2010	DBLP DOI BibTeX RDF
1	Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer	Diagnosis of failing scan cells through orthogonal response compaction.	European Test Symposium	2010	DBLP DOI BibTeX RDF
1	Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Mark Kassab	At-speed scan test with low switching activity.	VTS	2010	DBLP DOI BibTeX RDF
1	Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer	Low-Power Scan Operation in Test Compression Environment.	IEEE Trans. on CAD of Integrated Circuits and Systems	2009	DBLP DOI BibTeX RDF
1	Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski	Timing-Aware Multiple-Delay-Fault Diagnosis.	IEEE Trans. on CAD of Integrated Circuits and Systems	2009	DBLP DOI BibTeX RDF
1	Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer	Fault diagnosis for embedded read-only memories.	ITC	2009	DBLP DOI BibTeX RDF
1	Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer	Compression based on deterministic vector clustering of incompatible test cubes.	ITC	2009	DBLP DOI BibTeX RDF
1	Gang Chen, Janusz Rajski, Sudhakar M. Reddy, Irith Pomeranz	N-distinguishing Tests for Enhanced Defect Diagnosis.	Asian Test Symposium	2009	DBLP DOI BibTeX RDF
1	Janusz Rajski	We Have Got Compression, What Next?	European Test Symposium	2009	DBLP DOI BibTeX RDF
1	Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer	Highly X-Tolerant Selective Compaction of Test Responses.	VTS	2009	DBLP DOI BibTeX RDF
1	Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer	High-Speed On-Chip Event Counters for Embedded Systems.	VLSI Design	2009	DBLP DOI BibTeX RDF
1	Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer	Defect Aware to Power Conscious Tests - The New DFT Landscape.	VLSI Design	2009	DBLP DOI BibTeX RDF
1	Santiago Remersaro, Janusz Rajski, Sudhakar M. Reddy, Irith Pomeranz	A scalable method for the generation of small test sets.	DATE	2009	DBLP BibTeX RDF
1	Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski	Improving the Resolution of Single-Delay-Fault Diagnosis.	IEEE Trans. on CAD of Integrated Circuits and Systems	2008	DBLP DOI BibTeX RDF
1	Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer	Low-Power Test Data Application in EDT Environment Through Decompressor Freeze.	IEEE Trans. on CAD of Integrated Circuits and Systems	2008	DBLP DOI BibTeX RDF
1	Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee, Mark Kassab	X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector.	IEEE Trans. on CAD of Integrated Circuits and Systems	2008	DBLP DOI BibTeX RDF
1	Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski	Timing-Aware Multiple-Delay-Fault Diagnosis.	ISQED	2008	DBLP DOI BibTeX RDF	defect-diagnosis, diagnosis, ATPG, DFT, delay-testing
1	Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer	High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST.	ITC	2008	DBLP DOI BibTeX RDF
1	Xijiang Lin, Janusz Rajski	Test Generation for Interconnect Opens.	ITC	2008	DBLP DOI BibTeX RDF
1	Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer	Low Power Scan Shift and Capture in the EDT Environment.	ITC	2008	DBLP DOI BibTeX RDF
1	Santiago Remersaro, Janusz Rajski, Thomas Rinderknecht, Sudhakar M. Reddy, Irith Pomeranz	ATPG Heuristics Dependant Observation Point Insertion for Enhanced Compaction and Data Volume Reduction.	DFT	2008	DBLP DOI BibTeX RDF
1	Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer	Fault Diagnosis With Convolutional Compactors.	IEEE Trans. on CAD of Integrated Circuits and Systems	2007	DBLP DOI BibTeX RDF
1	Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Bashir M. Al-Hashimi	Enhancing delay fault coverage through low-power segmented scan.	IET Computers & Digital Techniques	2007	DBLP BibTeX RDF
1	Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer	Isolation of Failing Scan Cells through Convolutional Test Response Compaction.	J. Electronic Testing	2007	DBLP DOI BibTeX RDF	convolutional compactors, fault diagnosis, test response compaction, scan-based designs
1	Jerzy Tyszer, Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Mark Kassab, Wu-Tung Cheng, Manish Sharma, Liyang Lai	X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis.	IEEE Design & Test of Computers	2007	DBLP DOI BibTeX RDF	on-chip collection of test data, selective compaction of test responses, fault diagnosis, DFT, embedded test, scan-based designs
1	Santiago Remersaro, Xijiang Lin, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski	Scan-Based Tests with Low Switching Activity.	IEEE Design & Test of Computers	2007	DBLP DOI BibTeX RDF	scan shift, test response capture, supply current, power dissipation, switching activity, scan-based test
1	Jill Sibert, Janusz Rajski (eds.)	2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007	ITC	2007	DBLP BibTeX RDF
1	Grzegorz Mrugalski, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer	New Test Data Decompressor for Low Power Applications.	DAC	2007	DBLP DOI BibTeX RDF
1	Dhiraj Goswami, Kun-Han Tsai, Mark Kassab, Janusz Rajski	Test Generation in the Presence of Timing Exceptions and Constraints.	DAC	2007	DBLP DOI BibTeX RDF
1	Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware	Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement.	European Test Symposium	2007	DBLP DOI BibTeX RDF
1	Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware	Silicon Evaluation of Static Alternative Fault Models.	VTS	2007	DBLP DOI BibTeX RDF
1	Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer	Low Power Embedded Deterministic Test.	VTS	2007	DBLP DOI BibTeX RDF
1	Santiago Remersaro, Xijiang Lin, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski	Low Shift and Capture Power Scan Tests.	VLSI Design	2007	DBLP DOI BibTeX RDF
1	Janusz Rajski	Logic Diagnosis and Yield Learning.	DDECS	2007	DBLP BibTeX RDF
1	Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer	High Performance Dense Ring Generators.	IEEE Trans. Computers	2006	DBLP DOI BibTeX RDF	ring generators, Built-in self-test, design for testability, linear feedback shift registers, phase shifters
1	Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski	Analysis and methodology for multiple-fault diagnosis.	IEEE Trans. on CAD of Integrated Circuits and Systems	2006	DBLP DOI BibTeX RDF
1	Vishal J. Mehta, Malgorzata Marek-Sadowska, Zhiyuan Wang, Kun-Han Tsai, Janusz Rajski	Delay Fault Diagnosis for Non-Robust Test.	ISQED	2006	DBLP DOI BibTeX RDF
1	Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski	Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology.	ITC	2006	DBLP DOI BibTeX RDF
1	Yu Huang 0005, Wu-Tung Cheng, Nagesh Tamarapalli, Janusz Rajski, Randy Klingenberg, Will Hsu, Yuan-Shih Chen	Diagnosis with Limited Failure Information.	ITC	2006	DBLP DOI BibTeX RDF
1	Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware	A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis.	ITC	2006	DBLP DOI BibTeX RDF
1	Santiago Remersaro, Xijiang Lin, Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski	Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs.	ITC	2006	DBLP DOI BibTeX RDF
1	Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee, Mark Kassab	X-Press Compactor for 1000x Reduction of Test Data.	ITC	2006	DBLP DOI BibTeX RDF
1	Gang Chen, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski	A test pattern ordering algorithm for diagnosis with truncated fail data.	DAC	2006	DBLP DOI BibTeX RDF	test pattern ordering, truncated fail data, diagnosis
1	Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer	Test response compactor with programmable selector.	DAC	2006	DBLP DOI BibTeX RDF	scan chain selection, unknown states, compression, VLSI test
1	Artur Pogiel, Janusz Rajski, Jerzy Tyszer	Convolutional Compactors with Variable Polynomials.	European Test Symposium	2006	DBLP DOI BibTeX RDF
1	Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Bashir M. Al-Hashimi	Enhancing Delay Fault Coverage through Low Power Segmented Scan.	European Test Symposium	2006	DBLP DOI BibTeX RDF
1	Wojciech Rajski, Janusz Rajski	Modular Compactor of Test Responses.	VTS	2006	DBLP DOI BibTeX RDF
1	Xijiang Lin, Janusz Rajski	The Impacts of Untestable Defects on Transition Fault Testing.	VTS	2006	DBLP DOI BibTeX RDF
1	Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Xijiang Lin, Janusz Rajski	Scan Tests with Multiple Fault Activation Cycles for Delay Faults.	VTS	2006	DBLP DOI BibTeX RDF
1	Gang Chen, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski	New Procedures to Identify Redundant Stuck-At Faults and Removal of Redundant Logic.	VLSI Design	2006	DBLP DOI BibTeX RDF
1	Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski	Delay-fault diagnosis using timing information.	IEEE Trans. on CAD of Integrated Circuits and Systems	2005	DBLP DOI BibTeX RDF
1	Janusz Rajski, Jerzy Tyszer, Chen Wang, Sudhakar M. Reddy	Finite memory test response compactors for embedded test applications.	IEEE Trans. on CAD of Integrated Circuits and Systems	2005	DBLP DOI BibTeX RDF
1	Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer	Diagnosis with convolutional compactors in presence of unknown states.	ITC	2005	DBLP DOI BibTeX RDF
1	Yu Huang 0005, Wu-Tung Cheng, Janusz Rajski	Compressed pattern diagnosis for scan chain failures.	ITC	2005	DBLP DOI BibTeX RDF
1	Janusz Rajski	Test compression - real issues and matching solutions.	ITC	2005	DBLP DOI BibTeX RDF
1	Janusz Rajski	Embedded Test Technology - Brief History, Current Status, and Future Directions.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
1	Xijiang Lin, Janusz Rajski	Propagation delay fault: a new fault model to test delay faults.	ASP-DAC	2005	DBLP DOI BibTeX RDF
1	Janusz Rajski, Jerzy Tyszer	Synthesis of X-Tolerant Convolutional Compactors.	VTS	2005	DBLP DOI BibTeX RDF
1	Huaxing Tang, Chen Wang, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Irith Pomeranz	On Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios.	VLSI Design	2005	DBLP DOI BibTeX RDF
1	Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz	Defect Aware Test Patterns.	DATE	2005	DBLP DOI BibTeX RDF
1	Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee	Embedded deterministic test.	IEEE Trans. on CAD of Integrated Circuits and Systems	2004	DBLP DOI BibTeX RDF
1	Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer	Ring generators - new devices for embedded test applications.	IEEE Trans. on CAD of Integrated Circuits and Systems	2004	DBLP DOI BibTeX RDF
1	Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski	Delay Fault Diagnosis Using Timing Information.	ISQED	2004	DBLP DOI BibTeX RDF
1	Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski	Realizing High Test Quality Goals with Smart Test Resource Usage.	ITC	2004	DBLP DOI BibTeX RDF
1	Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski	Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.	ITC	2004	DBLP DOI BibTeX RDF
1	Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski	Fault Diagnosis in Designs with Convolutional Compactors.	ITC	2004	DBLP DOI BibTeX RDF
1	Wu-Tung Cheng, Kun-Han Tsai, Yu Huang 0005, Nagesh Tamarapalli, Janusz Rajski	Compactor Independent Direct Diagnosis.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF
1	Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer	Planar High Performance Ring Generators.	VTS	2004	DBLP DOI BibTeX RDF
1	Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer, Thomas Rinderknecht	Embedded Test for Low Cost Manufacturing. (PDF / PS)	VLSI Design	2004	DBLP DOI BibTeX RDF
1	Janusz Rajski, Kan Thapar	Nanometer Design: What are the Requirements for Manufacturing Test?	DATE	2004	DBLP DOI BibTeX RDF
1	Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski	Diagnosis of Hold Time Defects.	ICCD	2004	DBLP DOI BibTeX RDF
1	Janusz Rajski, Jerzy Tyszer	Primitive Polynomials Over GF(2) of Degree up to 660 with Uniformly Distributed Coefficients.	J. Electronic Testing	2003	DBLP DOI BibTeX RDF	ring generators, linear feedback shift registers, primitive polynomials
1	Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli	High-Frequency, At-Speed Scan Testing.	IEEE Design & Test of Computers	2003	DBLP DOI BibTeX RDF
1	Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Nagesh Tamarapalli, Jerzy Tyszer, Jun Qian	Embedded Deterministic Test for Low-Cost Manufacturing.	IEEE Design & Test of Computers	2003	DBLP DOI BibTeX RDF
1	Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski	2D Test Sequence Generators.	IEEE Design & Test of Computers	2003	DBLP DOI BibTeX RDF
1	Janusz Rajski, Jerzy Tyszer, Chen Wang, Sudhakar M. Reddy	Convolutional Compaction of Test Responses.	ITC	2003	DBLP DOI BibTeX RDF
1	Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski	Impact of Multiple-Detect Test Patterns on Product Quality.	ITC	2003	DBLP DOI BibTeX RDF
1	Zhiyuan Wang, Kun-Han Tsai, Malgorzata Marek-Sadowska, Janusz Rajski	An Efficient and Effective Methodology on the Multiple Fault Diagnosis.	ITC	2003	DBLP DOI BibTeX RDF
1	Janusz Rajski	Test Challenges of Nanometer Technology.	ITC	2003	DBLP DOI BibTeX RDF
1	Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski	Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions.	ITC	2003	DBLP DOI BibTeX RDF
1	Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer	High Speed Ring Generators and Compactors of Test Data.	VTS	2003	DBLP DOI BibTeX RDF
1	Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Jerzy Tyszer	On Compacting Test Response Data Containing Unknown Values.	ICCAD	2003	DBLP DOI BibTeX RDF

Publications of "Janusz Rajski" ( http://dblp.L3S.de/Authors/Janusz_Rajski )