| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Hassan Salmani, Mohammad Tehranipoor, Jim Plusquellic |
A Novel Technique for Improving Hardware Trojan Detection and Reducing Trojan Activation Time.  |
IEEE Trans. VLSI Syst.  |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Charles Lamech, Reza M. Rad, Mohammad Tehranipoor, Jim Plusquellic |
An Experimental Analysis of Power and Delay Signal-to-Noise Requirements for Detecting Trojans and Methods for Achieving the Required Detection Sensitivities. |
IEEE Transactions on Information Forensics and Security |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Jim Plusquellic, Dhruva Acharyya, Kanak Agarwal |
Measuring within-die spatial variation profile through power supply current measurements. |
ISQED |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Jim Aarestad, Charles Lamech, Jim Plusquellic, Dhruva Acharyya, Kanak Agarwal |
Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect. |
DAC |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Charles Lamech, Jim Aarestad, Jim Plusquellic, Reza M. Rad, Kanak Agarwal |
REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations. |
ICCAD |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Reza M. Rad, James F. Plusquellic, Mohammad Tehranipoor |
A Sensitivity Analysis of Power Signal Methods for Detecting Hardware Trojans Under Real Process and Environmental Conditions. |
IEEE Trans. VLSI Syst. |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Jim Aarestad, Dhruva Acharyya, Reza M. Rad, Jim Plusquellic |
Detecting Trojans Through Leakage Current Analysis Using Multiple Supply Pad IDDQ s. |
IEEE Transactions on Information Forensics and Security |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Dhruva Acharyya, Kanak Agarwal, Jim Plusquellic |
Leveraging existing power control circuits and power delivery architecture for variability measurement. |
ITC |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Ryan Helinski, Dhruva Acharyya, Jim Plusquellic |
Quality metric evaluation of a physical unclonable function derived from an IC's power distribution system. |
DAC |
2010 |
DBLP DOI BibTeX RDF |
unique identifier, process variations, hardware security |
| 1 | Jim Plusquellic, Ken Mai (eds.) |
HOST 2010, Proceedings of the 2010 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), 13-14 June 2010, Anaheim Convention Center, California, USA |
HOST |
2010 |
DBLP BibTeX RDF |
|
| 1 | Reza M. Rad, Jim Plusquellic |
A Novel Fault Localization Technique Based on Deconvolution and Calibration of Power Pad Transients Signals. |
J. Electronic Testing |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Ryan Helinski, Dhruva Acharyya, Jim Plusquellic |
A physical unclonable function defined using power distribution system equivalent resistance variations. |
DAC |
2009 |
DBLP DOI BibTeX RDF |
unique identifier, process variations, hardware security |
| 1 | Mohammad Tehranipoor, Jim Plusquellic (eds.) |
IEEE International Workshop on Hardware-Oriented Security and Trust, HOST 2009, San Francisco, CA, USA, July 27, 2009. Proceedings |
HOST |
2009 |
DBLP BibTeX RDF |
|
| 1 | Hassan Salmani, Mohammad Tehranipoor, Jim Plusquellic |
New Design Strategy for Improving Hardware Trojan Detection and Reducing Trojan Activation Time. |
HOST |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Kanak Agarwal, Dhruva Acharyya, Jim Plusquellic |
Characterizing within-die variation from multiple supply port IDDQ measurements. |
ICCAD |
2009 |
DBLP BibTeX RDF |
|
| 1 | Xiaoxiao Wang, Hassan Salmani, Mohammad Tehranipoor, James F. Plusquellic |
Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis. |
DFT |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Mohammad Tehranipoor, Jim Plusquellic (eds.) |
IEEE International Workshop on Hardware-Oriented Security and Trust, HOST 2008, Anaheim, CA, USA, June 9, 2008. Proceedings |
HOST |
2008 |
DBLP BibTeX RDF |
|
| 1 | Xiaoxiao Wang, Mohammad Tehranipoor, Jim Plusquellic |
Detecting Malicious Inclusions in Secure Hardware: Challenges and Solutions. |
HOST |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Reza M. Rad, Jim Plusquellic, Mohammad Tehranipoor |
Sensitivity Analysis to Hardware Trojans using Power Supply Transient Signals. |
HOST |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Reza M. Rad, Xiaoxiao Wang, Mohammad Tehranipoor, Jim Plusquellic |
Power supply signal calibration techniques for improving detection resolution to hardware Trojans. |
ICCAD |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Jeremy Lee, Mohammad Tehranipoor, Chintan Patel, Jim Plusquellic |
Securing Designs against Scan-Based Side-Channel Attacks. |
IEEE Trans. Dependable Sec. Comput. |
2007 |
DBLP DOI BibTeX RDF |
Security and Privacy Protection, Scan-Based Design, Secure Design, Reliability and Testing |
| 1 | Abhishek Singh, Jim Plusquellic, Dhananjay S. Phatak, Chintan Patel |
Defect Simulation Methodology for iDDT Testing. |
J. Electronic Testing |
2006 |
DBLP DOI BibTeX RDF |
iDDT, transient current testing, device testing, ATPG, fault simulation, IDDQ, defect simulation, defect-based test |
| 1 | Jim Plusquellic, Dhruva Acharyya, Abhishek Singh, Mohammad Tehranipoor, Chintan Patel |
Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method. |
IEEE Design & Test of Computers |
2006 |
DBLP DOI BibTeX RDF |
Quiescent Signal Analysis, defect detection, IDDQ |
| 1 | Jeremy Lee, Mohammad Tehranipoor, Jim Plusquellic |
A Low-Cost Solution for Protecting IPs Against Scan-Based Side-Channel Attacks. |
VTS |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Sanat Kamal Bahl, James F. Plusquellic, Joseph Thomas |
A Comparitive Study of W-cdma Cell Search Designs. |
Journal of Circuits, Systems, and Computers |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Chintan Patel, Abhishek Singh, Jim Plusquellic |
Defect Detection Using Quiescent Signal Analysis. |
J. Electronic Testing |
2005 |
DBLP DOI BibTeX RDF |
multiple current measurements, Quiescent Signal Analysis, IDDQ, current testing, defect-based testing, parametric testing |
| 1 | Dhruva Acharyya, Jim Plusquellic |
Hardware Results Demonstrating Defect Detection Using Power Supply Signal Measurements. |
VTS |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Nisar Ahmed, C. P. Ravikumar, Mohammad Tehranipoor, Jim Plusquellic |
At-Speed Transition Fault Testing With Low Speed Scan Enable. |
VTS |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Jeremy Lee, Mohammad Tehranipoor, Chintan Patel, Jim Plusquellic |
Securing Scan Design Using Lock and Key Technique. |
DFT |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Chintan Patel, Abhishek Singh, Jim Plusquellic |
Defect detection under Realistic Leakage Models using Multiple IDDQ Measurement. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
|
| 1 | Abhishek Singh, Chintan Patel, Jim Plusquellic |
On-Chip Impulse Response Generation for Analog and Mixed-Signal Testing. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
|
| 1 | Abhishek Singh, Chintan Patel, Jim Plusquellic |
Fault Simulation Model for i{DDT} Testing: An Investigation. |
VTS |
2004 |
DBLP DOI BibTeX RDF |
|
| 1 | James F. Plusquellic, Abhishek Singh, Chintan Patel, Anne E. Gattiker |
Power supply transient signal analysis for defect-oriented test. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Abhishek Singh, Dhananjay S. Phatak, Tom Goff, Mike Riggs, James F. Plusquellic, Chintan Patel |
Comparison of Branching CORDIC Implementations. |
ASAP |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Dhananjay S. Phatak, Tom Goff, Jim Plusquellic |
IP-in-IP tunneling to enable the simultaneous use of multiple IP interfaces for network level connection striping. |
Computer Networks |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Chintan Patel, Ernesto Staroswiecki, Smita Pawar, Dhruva Acharyya, Jim Plusquellic |
Defect Diagnosis Using a Current Ratio Based Quiescent Signal Analysis Model for Commercial Power Grids. |
J. Electronic Testing |
2003 |
DBLP DOI BibTeX RDF |
I DDT, quiescent signal analysis, test, power grids, I DDQ |
| 1 | Dhruva Acharyya, Jim Plusquellic |
Impedance Profile of a Commercial Power Grid and Test System. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Sanat Kamal Bahl, Jim Plusquellic |
FPGA implementation of a fast Hadamard transformer for WCDMA. |
FPGA |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Abhishek Singh, Jitin Tharian, Jim Plusquellic |
Path Delay Estimation using Power Supply Transient Signals: A Comparative Study using Fourier and Wavelet Analysis. |
ICCAD |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Abhishek Singh, Jim Plusquellic, Anne E. Gattiker |
Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models. |
VTS |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Abhishek Singh, Chintan Patel, Shirong Liao, James F. Plusquellic, Anne E. Gattiker |
Detecting delay faults using power supply transient signal analysis. |
ITC |
2001 |
DBLP DOI BibTeX RDF |
|
| 1 | Chintan Patel, Fidel Muradali, James F. Plusquellic |
Power supply transient signal integration circuit. |
ITC |
2001 |
DBLP DOI BibTeX RDF |
|
| 1 | Jim Plusquellic |
IC Diagnosis Using Multiple Supply Pad IDDQs. |
IEEE Design & Test of Computers |
2001 |
DBLP DOI BibTeX RDF |
|
| 1 | Chintan Patel, Jim Plusquellic |
A Process and Technology-Tolerant IDDQ Method for IC Diagnosis. |
VTS |
2001 |
DBLP DOI BibTeX RDF |
|
| 1 | James F. Plusquellic, Amy Germida, Jonathan Hudson, Ernesto Staroswiecki, Chintan Patel |
Predicting device performance from pass/fail transient signal analysis data. |
ITC |
2000 |
DBLP DOI BibTeX RDF |
|
| 1 | Amy Germida, James F. Plusquellic |
Detection of CMOS Defects under Variable Processing Conditions. |
VTS |
2000 |
DBLP DOI BibTeX RDF |
Built-In Differential Temperature Sensors, Fault Location, Mixed-Signal Circuits, Thermal Testing, Temperature Measurements |
| 1 | Amy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali |
Defect detection using power supply transient signal analysis. |
ITC |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | James F. Plusquellic, Amy Germida, Zheng Yan |
8-Bit Multiplier Simulation Experiments Investigating the Use of Power Supply Transient Signals for the Detection of CMOS Defects. (PDF / PS) |
DFT |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan |
Characterization of CMOS Defects using Transient Signal Analysis. (PDF / PS) |
DFT |
1998 |
DBLP DOI BibTeX RDF |
transient signal analysis, CMOS defect characterization, defect diagnosis, failure analysis |
| 1 | James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan |
Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data. |
ITC |
1997 |
DBLP DOI BibTeX RDF |
|
| 1 | James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan |
Digital Integrated Circuit Testing using Transient Signal Analysis. |
ITC |
1996 |
DBLP DOI BibTeX RDF |
|
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