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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 2 occurrences of 2 keywords
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Results
Found 6 publication records. Showing 6 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Junping Zhou, Minghao Yin, Xiangtao Li, Jinyan Wang |
Phase Transitions of EXPSPACE-Complete Problems: a Further Step.  |
Int. J. Found. Comput. Sci.  |
2012 |
DBLP DOI BibTeX RDF |
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| 1 | Zhihua Dong, Jinyan Wang, C. P. Wen, Shenghou Liu, Rumin Gong, Min Yu, Yilong Hao, Fujun Xu, Bo Shen, Yangyuan Wang |
High temperature induced failure in Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructure. |
Microelectronics Reliability |
2012 |
DBLP DOI BibTeX RDF |
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| 1 | Jinyan Wang, Minghao Yin, Wenxiang Gu |
Soft polygroups. |
Computers & Mathematics with Applications |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Xiangtao Li, Jinyan Wang, Junping Zhou, Minghao Yin |
A perturb biogeography based optimization with mutation for global numerical optimization. |
Applied Mathematics and Computation |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Wei Wang, Jinyan Wang, Chengxi Wang, Dongbing Pu |
A Novel Watermarking Algorithm Based on Phase Congruency Corner Detection and SVD. |
FCST |
2010 |
DBLP DOI BibTeX RDF |
corner detector, SVD, phase congruency |
| 1 | Ru Huang, Jinyan Wang, Jin He, Min Yu, Xing Zhang, Yangyuan Wang |
Hot carrier degradation behavior in SOI dynamic-threshold-voltage nMOSFET's (n-DTMOSFET) measured by gated-diode configuration. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
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