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Found 4 publication records. Showing 4 according to the selection in the facets
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Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Valeria Kilchytska, Joaquín Alvarado, S. Put, Nadine Collaert, Eddy Simoen, Cor Claeys, O. Militaru, G. Berger, Denis Flandre |
High-energy neutrons effect on strained and non-strained SOI MuGFETs and planar MOSFETs.  |
Microelectronics Reliability  |
2012 |
DBLP DOI BibTeX RDF |
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| 1 | C. Roda Neve, Valeria Kilchytska, Joaquín Alvarado, D. Lederer, O. Militaru, Denis Flandre, Jean-Pierre Raskin |
Impact of neutron irradiation on the RF properties of oxidized high-resistivity silicon substrates with and without a trap-rich passivation layer. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Joaquín Alvarado, E. Boufouss, Valeria Kilchytska, Denis Flandre |
Compact model for single event transients and total dose effects at high temperatures for partially depleted SOI MOSFETs. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Joaquín Alvarado, Antonio Cerdeira, Valeria Kilchytska, Denis Flandre |
Harmonic distortion analysis using an improved charge sheet model for PD SOI MOSFETs. |
Microelectronics Journal |
2007 |
DBLP DOI BibTeX RDF |
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