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Publications of "Jorma K. Kivilahti" ( http://dblp.L3S.de/Authors/Jorma_K._Kivilahti )

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Publication years (Num. hits)
2004-2012 (7)
Publication types (Num. hits)
article(7)
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Found 7 publication records. Showing 7 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Toni T. Mattila, Jue Li, Jorma K. Kivilahti On the effects of temperature on the drop reliability of electronic component boards. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jussi Hokka, Toni T. Mattila, Jue Li, Jarmo Teeri, Jorma K. Kivilahti A novel impact test system for more efficient reliability testing. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Tomi Laurila, J. Hurtig, V. Vuorinen, Jorma K. Kivilahti Effect of Ag, Fe, Au and Ni on the growth kinetics of Sn-Cu intermetallic compound layers. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Marika P. Immonen, Mikko Karppinen, Jorma K. Kivilahti Investigation of environmental reliability of optical polymer waveguides embedded on printed circuit boards. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Tomi Laurila, Toni T. Mattila, V. Vuorinen, J. S. Karppinen, Jue Li, M. Sippola, Jorma K. Kivilahti Evolution of microstructure and failure mechanism of lead-free solder interconnections in power cycling and thermal shock tests. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Tuomas F. Waris, Markus P. K. Turunen, Tomi Laurila, Jorma K. Kivilahti Evaluation of electrolessly deposited NiP integral resistors on flexible polyimide substrate. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Markus P. K. Turunen, Pekka Marjamäki, Matti Paajanen, Jouko Lahtinen, Jorma K. Kivilahti Pull-off test in the assessment of adhesion at printed wiring board metallisation/epoxy interface. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
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