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Venues (Conferences, Journals, ...)
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Found 7 publication records. Showing 7 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Toni T. Mattila, Jue Li, Jorma K. Kivilahti |
On the effects of temperature on the drop reliability of electronic component boards.  |
Microelectronics Reliability  |
2012 |
DBLP DOI BibTeX RDF |
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| 1 | Jussi Hokka, Toni T. Mattila, Jue Li, Jarmo Teeri, Jorma K. Kivilahti |
A novel impact test system for more efficient reliability testing.  |
Microelectronics Reliability  |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Tomi Laurila, J. Hurtig, V. Vuorinen, Jorma K. Kivilahti |
Effect of Ag, Fe, Au and Ni on the growth kinetics of Sn-Cu intermetallic compound layers.  |
Microelectronics Reliability  |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Marika P. Immonen, Mikko Karppinen, Jorma K. Kivilahti |
Investigation of environmental reliability of optical polymer waveguides embedded on printed circuit boards.  |
Microelectronics Reliability  |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Tomi Laurila, Toni T. Mattila, V. Vuorinen, J. S. Karppinen, Jue Li, M. Sippola, Jorma K. Kivilahti |
Evolution of microstructure and failure mechanism of lead-free solder interconnections in power cycling and thermal shock tests.  |
Microelectronics Reliability  |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Tuomas F. Waris, Markus P. K. Turunen, Tomi Laurila, Jorma K. Kivilahti |
Evaluation of electrolessly deposited NiP integral resistors on flexible polyimide substrate.  |
Microelectronics Reliability  |
2005 |
DBLP DOI BibTeX RDF |
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| 1 | Markus P. K. Turunen, Pekka Marjamäki, Matti Paajanen, Jouko Lahtinen, Jorma K. Kivilahti |
Pull-off test in the assessment of adhesion at printed wiring board metallisation/epoxy interface.  |
Microelectronics Reliability  |
2004 |
DBLP DOI BibTeX RDF |
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