|
|
|
|
Venues (Conferences, Journals, ...)
|
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 2 occurrences of 2 keywords
|
|
|
|
|
Results
Found 5 publication records. Showing 5 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Toni T. Mattila, Jue Li, Jorma K. Kivilahti |
On the effects of temperature on the drop reliability of electronic component boards.  |
Microelectronics Reliability  |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Jussi Hokka, Toni T. Mattila, Jue Li, Jarmo Teeri, Jorma K. Kivilahti |
A novel impact test system for more efficient reliability testing. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Guorong Xuan, Yun Q. Shi, Peiqi Chai, Xuefeng Tong, Jianzhong Teng, Jue Li |
Reversible binary image data hiding by run-length histogram modification. |
ICPR |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Tomi Laurila, Toni T. Mattila, V. Vuorinen, J. S. Karppinen, Jue Li, M. Sippola, Jorma K. Kivilahti |
Evolution of microstructure and failure mechanism of lead-free solder interconnections in power cycling and thermal shock tests. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Guorong Xuan, Xiuming Zhu, Yun Q. Shi, Peiqi Chai, Xia Cui, Jue Li |
A Novel Bayesian Classifier with Smaller Eigenvalues Reset by Threshold Based on Given Database. |
ICIAR |
2007 |
DBLP DOI BibTeX RDF |
Improved Bayesian classifier, handwritten digit recognition Csteganalysis, threshold, eigenvalues |
Displaying result #1 - #5 of 5 (100 per page; Change: )
|
|
![[Valid RSS]](Pics/valid-rss.png "Validate my RSS feed")