Search results for "Kenneth M. Butler"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Ender Yilmaz, Sule Ozev, Kenneth M. Butler	Adaptive multidimensional outlier analysis for analog and mixed signal circuits.	ITC	2011	DBLP DOI BibTeX RDF
1	Hsiu-Ming Chang, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, Kenneth M. Butler	Test cost reduction through performance prediction using virtual probe.	ITC	2011	DBLP DOI BibTeX RDF
1	Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar	Die-level adaptive test: Real-time test reordering and elimination.	ITC	2011	DBLP DOI BibTeX RDF
1	Mohammad Tehranipoor, Kenneth M. Butler	Power Supply Noise: A Survey on Effects and Research.	IEEE Design & Test of Computers	2010	DBLP DOI BibTeX RDF	power supply noise (PSN), transition delay fault testing, timing analysis, design and test, path delay testing
1	Ender Yilmaz, Sule Ozev, Kenneth M. Butler	Adaptive test flow for mixed-signal/RF circuits using learned information from device under test.	ITC	2010	DBLP DOI BibTeX RDF
1	Erik Jan Marinissen, Adit Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli	Adapting to adaptive testing.	DATE	2010	DBLP BibTeX RDF
1	Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch	Multidimensional Test Escape Rate Modeling.	IEEE Design & Test of Computers	2009	DBLP DOI BibTeX RDF
1	Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger	Quality improvement and cost reduction using statistical outlier methods.	ICCD	2009	DBLP DOI BibTeX RDF
1	Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena	Modeling Test Escape Rate as a Function of Multiple Coverages.	ITC	2008	DBLP DOI BibTeX RDF
1	Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar, Kenneth M. Butler	Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers.	IEEE Trans. on CAD of Integrated Circuits and Systems	2007	DBLP DOI BibTeX RDF
1	Mohammad Tehranipoor, Kenneth M. Butler	Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs.	IEEE Design & Test of Computers	2007	DBLP DOI BibTeX RDF	PSN, IR drop, power supply noise, deep-submicron designs
1	Kenneth M. Butler	Guest Editor's Introduction: ITC Helps Get More Out of Test.	IEEE Design & Test of Computers	2006	DBLP DOI BibTeX RDF	test, International Test Conference
1	Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington	Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques.	ITC	2004	DBLP DOI BibTeX RDF
1	Kenneth M. Butler	Sure You Can Get to 100 DPPM in Deep Submicron, But It'll Cost Ya.	ITC	2004	DBLP DOI BibTeX RDF
1	Kenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang	Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs. (PDF / PS)	IEEE Design & Test of Computers	2003	DBLP DOI BibTeX RDF
1	Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger	A Case Study of IR-Drop in Structured At-Speed Testing.	ITC	2003	DBLP DOI BibTeX RDF
1	Kenneth M. Butler	Is ITC Bored with Board Test?	ITC	2002	DBLP DOI BibTeX RDF
1	Hari Balachandran, Kenneth M. Butler, Neil Simpson	Facilitating Rapid First Silicon Debug.	ITC	2002	DBLP DOI BibTeX RDF
1	Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech	Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges .	ITC	2002	DBLP DOI BibTeX RDF
1	Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang	Defect-Oriented Testing and Defective-Part-Level Prediction.	IEEE Design & Test of Computers	2001	DBLP DOI BibTeX RDF
1	Jayashree Saxena, Kenneth M. Butler, Lee Whetsel	An analysis of power reduction techniques in scan testing.	ITC	2001	DBLP DOI BibTeX RDF
1	Frank F. Hsu, Kenneth M. Butler, Janak H. Patel	A case study on the implementation of the Illinois Scan Architecture.	ITC	2001	DBLP DOI BibTeX RDF
1	Jayashree Saxena, Kenneth M. Butler	An empirical study on the effects of test type ordering on overall test efficiency.	ITC	2000	DBLP DOI BibTeX RDF
1	Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler	Computer-aided fault to defect mapping (CAFDM) for defect diagnosis.	ITC	2000	DBLP DOI BibTeX RDF
1	Kenneth M. Butler	Estimating the Economic Benefits of DFT.	IEEE Design & Test of Computers	1999	DBLP DOI BibTeX RDF
1	Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala	Expediting ramp-to-volume production.	ITC	1999	DBLP DOI BibTeX RDF
1	Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith	Correlation of logical failures to a suspect process step.	ITC	1999	DBLP DOI BibTeX RDF
1	Kenneth M. Butler	A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data.	ITC	1999	DBLP DOI BibTeX RDF
1	Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer	REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen.	VTS	1999	DBLP DOI BibTeX RDF
1	Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess	On applying non-classical defect models to automated diagnosis.	ITC	1998	DBLP DOI BibTeX RDF
1	Kenneth M. Butler	The stuck-at fault: it ain't over 'til it's over.	ITC	1998	DBLP DOI BibTeX RDF
1	Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena	Automated Diagnosis in Testing and Failure Analysis.	IEEE Design & Test of Computers	1997	DBLP DOI BibTeX RDF
1	David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, Jayashree Saxena, Kenneth M. Butler	Bridging Fault Diagnosis in the Absence of Physical Information.	ITC	1997	DBLP DOI BibTeX RDF
1	Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly	So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment.	ITC	1997	DBLP DOI BibTeX RDF
1	Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken	An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing.	VTS	1997	DBLP DOI BibTeX RDF	semiconductor testing, stuck-fault testing, ASIC device, application specific integrated circuits, functional testing, IDDQ testing, delay-fault testing, scan testing
1	Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena	Integrating Automated Diagnosis into the Testing and Failure Analysis Operations.	ITC	1996	DBLP DOI BibTeX RDF
1	Graham Hetherington, Greg Sutton, Kenneth M. Butler, Theo J. Powell	Test Generation and Design for Test for a Large Multiprocessing DSP.	ITC	1995	DBLP DOI BibTeX RDF
1	Kenneth M. Butler	Deep Submicron: Is Test Up to the Challenge?	ITC	1995	DBLP DOI BibTeX RDF
1	Don E. Ross, Kenneth M. Butler, M. Ray Mercer	Exact ordered binary decision diagram size when representing classes of symmetric functions.	J. Electronic Testing	1991	DBLP DOI BibTeX RDF	Boolean function representation, Binary decision diagram, symbolic simulation, symmetric functions, ordered binary decision diagram
1	Kenneth M. Butler, Don E. Ross, Rohit Kapur, M. Ray Mercer	Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams.	DAC	1991	DBLP DOI BibTeX RDF
1	Kenneth M. Butler, M. Ray Mercer	The Influences of Fault Type and Topology on Fault Model Performance and the Implications to Test and Testable Design.	DAC	1990	DBLP DOI BibTeX RDF
1	Rhonda Kay Gaede, Don E. Ross, M. Ray Mercer, Kenneth M. Butler	CATAPULT: Concurrent Automatic Testing Allowing Parallelization and Using Limited Topology.	DAC	1988	DBLP BibTeX RDF

Publications of "Kenneth M. Butler" ( http://dblp.L3S.de/Authors/Kenneth_M._Butler )