Search results for "MOS"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Maxim Graubner, Parag S. Mogre, Ralf Steinmetz, Thorsten Lorenzen	A new QoE model and evaluation method for broadcast audio contribution over IP.	NOSSDAV	2010	DBLP DOI BibTeX RDF	acip, aoip, audio communication, mos, peaq, pemo-q, pqos, qoe, wb-pesq, user satisfaction, quality of experience, qos, e-model
1	Chen-Chi Wu, Kuan-Ta Chen, Chun-Ying Huang, Chin-Laung Lei	An empirical evaluation of VoIP playout buffer dimensioning in Skype, Google talk, and MSN Messenger.	NOSSDAV	2009	DBLP DOI BibTeX RDF	mos, VoIP, user satisfaction, quality of experience, e-model, pesq
1	Hussein Muzahim Aziz, Håkan Grahn, Lars Lundberg	Eliminating the freezing frames for the mobile user over unreliable wireless networks.	Mobility Conference	2009	DBLP DOI BibTeX RDF	dropping rate, frame splitting, mobile device, MOS, streaming video, multichannel
1	Abiodun Iwayemi, Chi Zhou	VoIP Performance in Multi-radio Mobile Devices.	ISPA	2009	DBLP DOI BibTeX RDF	Mobile VoIP, WiFi, HSDPA, MOS
1	Marc Sullivan, James Pratt, Philip T. Kortum	Practical issues in subjective video quality evaluation: human factors vs. psychophysical image quality evaluation.	UXTV	2008	DBLP DOI BibTeX RDF	mos, subjective video quality
1	Il-Gu Jung, Eun-Jin Ko, Hyun-Chul Kang, Gilhaeng Lee	Voice quality measurement system for telephone service.	CSTST	2008	DBLP DOI BibTeX RDF	R-factor, SLA (service level agreement), VoIP, MOS, PESQ, PSTN, voice quality
1	Adil Raja, Colin Flanagan	Real-Time, Non-intrusive Speech Quality Estimation: A Signal-Based Model.	EuroGP	2008	DBLP DOI BibTeX RDF	Non-Intrusive, Signal-based, MOS, GP
1	ChenMing Hu	BSIM - making the first international standard MOSFET model.	Science in China Series F: Information Sciences	2008	DBLP DOI BibTeX RDF	BSIM, MOS, compact modeling
1	Amjad M. Daoud	Perfect hash functions for large dictionaries.	CIMS	2007	DBLP DOI BibTeX RDF	indexing, random graphs, MOS, perfect hashing, acyclic
1	Andrea Bacioccola, Claudio Cicconetti, Giovanni Stea	User-level performance evaluation of VoIP using ns-2.	VALUETOOLS	2007	DBLP DOI BibTeX RDF	simulation, QoS, VoIP, ns-2, MOS, e-model
1	Nate Kushman, Srikanth Kandula, Dina Katabi	Can you hear me now?!: it must be BGP.	Computer Communication Review	2007	DBLP DOI BibTeX RDF	burst losses, VoIP, BGP, MOS, PESQ
1	Adil Raja, R. Muhammad Atif Azad, Colin Flanagan, Conor Ryan	Real-Time, Non-intrusive Evaluation of VoIP.	EuroGP	2007	DBLP DOI BibTeX RDF	Non-Intrusive, VoIP, Symbolic Regression, MOS, GP, Speech Quality
1	Kay Suenaga, Rodrigo Picos, Sebastiàn A. Bota, Miquel Roca, Eugeni Isern, Eugenio García	A Module for BiST of CMOS RF Receivers.	J. Electronic Testing	2007	DBLP DOI BibTeX RDF	RF-IC, Test, Built-in-self-test, MOS, Mixers
1	Jagadeesh Balam, Jerry D. Gibson	Multiple descriptions and path diversity using the AMR-WB speech codec for voice communication over MANETs.	IWCMC	2006	DBLP DOI BibTeX RDF	AMR-WB, WPESQ, voice quality indicator, mobile ad-hoc networks, 802.11, MOS, voice communications, path diversity, multiple descriptions
1	Do Young Kim, Jong Won Park	An Embedded Variable Bit-Rate Audio Coder for Ubiquitous Speech Communications.	ICUCT	2006	DBLP DOI BibTeX RDF	Embedded Coder, G.729EV, PESQ-WB, Scalable Audio Coder, Ubiquitous Audio, MOS
1	Johnny Matta, Christine Pépin, Khosrow Lashkari, Ravi Jain	A source and channel rate adaptation algorithm for AMR in VoIP using the Emodel.	NOSSDAV	2003	DBLP DOI BibTeX RDF	emodel, QoS, VoIP, forward error correction, MOS, AMR
1	Wenyu Jiang, Henning Schulzrinne	Comparison and optimization of packet loss repair methods on VoIP perceived quality under bursty loss.	NOSSDAV	2002	DBLP DOI BibTeX RDF	bursty loss, low bit-rate redundancy, perceived quality, VoIP, forward error correction, MOS, mean opinion score
1	Pinaki Mazumder, Janak H. Patel	Parallel Testing for Pattern-Sensitive Faults in Semiconductor Random-Access Memories.	IEEE Trans. Computers	1989	DBLP DOI BibTeX RDF	semiconductor random-access memories, design-for-testability approach, MOS integrated circuits, reliability, integrated circuit testing, linear complexity, MOS, random-access storage, integrated memory circuits, pattern-sensitive faults, design strategy, parallel testing