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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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Results
Found 22 publication records. Showing 22 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Jon G. Elerath, Michael Pecht |
IEEE 1413: A Standard for Reliability Predictions.  |
IEEE Transactions on Reliability  |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Francesco Di Maio, J. Hu, Peter W. Tse, Michael Pecht, K. Tsui, Enrico Zio |
Ensemble-approaches for clustering health status of oil sand pumps. |
Expert Syst. Appl. |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Shunfeng Cheng, Michael Pecht |
Using cross-validation for model parameter selection of sequential probability ratio test. |
Expert Syst. Appl. |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Sachin Kumar, Nikhil M. Vichare, Eli Dolev, Michael Pecht |
A health indicator method for degradation detection of electronic products. |
Microelectronics Reliability |
2012 |
DBLP DOI BibTeX RDF |
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| 1 | C.-H. Wu, C.-H. Yang, S.-C. Lo, Nikhil M. Vichare, E. Rhem, Michael Pecht |
Automatic data mining for telemetry database of computer systems. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Qiang Miao, Liu Liu, Yuan Feng, Michael Pecht |
Complex system maintainability verification with limited samples. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Mohammed A. Alam, Michael H. Azarian, Michael D. Osterman, Michael Pecht |
Temperature and voltage aging effects on electrical conduction mechanism in epoxy-BaTiO3 composite dielectric used in embedded capacitors. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Gang Niu, Satnam Singh, Steven W. Holland, Michael Pecht |
Health monitoring of electronic products based on Mahalanobis distance and Weibull decision metrics. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Kirk A. Gray, Michael Pecht |
Long-Term Thermal Overstressing of Computers. |
IEEE Design & Test of Computers |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Gang Niu, Bo-Suk Yang, Michael Pecht |
Development of an optimized condition-based maintenance system by data fusion and reliability-centered maintenance. |
Rel. Eng. & Sys. Safety |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Vasilis A. Sotiris, Peter W. Tse, Michael Pecht |
Anomaly Detection Through a Bayesian Support Vector Machine. |
IEEE Transactions on Reliability |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Sachin Kumar, Eli Dolev, Michael Pecht |
Parameter selection for health monitoring of electronic products. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Michael Pecht, Rubyca Jaai |
A prognostics and health management roadmap for information and electronics-rich systems. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Shuang Yang, Ji Wu, Michael Pecht |
Reliability Assessment of Land Grid Array Sockets Subjected to Mixed Flowing Gas Environment. |
IEEE Transactions on Reliability |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Jon G. Elerath, Michael Pecht |
A Highly Accurate Method for Assessing Reliability of Redundant Arrays of Inexpensive Disks (RAID). |
IEEE Trans. Computers |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Chaitanya Sankavaram, Bharath R. Pattipati, Anuradha Kodali, Krishna R. Pattipati, Mohammad Azam, Sachin Kumar, Michael Pecht |
Model-based and data-driven prognosis of automotive and electronic systems. |
CASE |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Shunfeng Cheng, Michael Pecht |
A fusion prognostics method for remaining useful life prediction of electronic products. |
CASE |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Sachin Kumar, Myra Torres, Y. C. Chan, Michael Pecht |
A hybrid prognostics methodology for electronic products. |
IJCNN |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Mohammadreza Keimasi, Michael H. Azarian, Michael Pecht |
Isothermal aging effects on flex cracking of multilayer ceramic capacitors with standard and flexible terminations. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Jie Gu, Donald Barker, Michael Pecht |
Prognostics implementation of electronics under vibration loading. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Jon G. Elerath, Michael Pecht |
Enhanced Reliability Modeling of RAID Storage Systems. |
DSN |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Michael Pecht, Yuliang Deng |
Electronic device encapsulation using red phosphorus flame retardants. |
Microelectronics Reliability |
2006 |
DBLP DOI BibTeX RDF |
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Displaying result #1 - #22 of 22 (100 per page; Change: )
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