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Publications of "Mohammad Tehranipoor" ( http://dblp.L3S.de/Authors/Mohammad_Tehranipoor )

URL (Homepage):  http://www.engr.uconn.edu/~tehrani/  Author page on DBLP  Author page in RDF  Community of Mohammad Tehranipoor in ASPL-2

Publication years (Num. hits)
2005-2006 (20) 2007-2008 (26) 2009-2010 (26) 2011 (17) 2012 (9)
Publication types (Num. hits)
article(33) book(1) inproceedings(60) proceedings(4)
GrowBag graphs for keyword ? (Num. hits/coverage)

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The graphs summarize 51 occurrences of 42 keywords

Results
Found 98 publication records. Showing 98 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Hassan Salmani, Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty, Patrick Girard, Xiaoqing Wen Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of Transition Delay Fault Patterns. Search on Bibsonomy J. Low Power Electronics The full citation details ... 2012 DBLP  BibTeX  RDF
1Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty Ensuring Power-Safe Application of Test Patterns Using an Effective Gating Approach Considering Current Limits. Search on Bibsonomy J. Low Power Electronics The full citation details ... 2012 DBLP  BibTeX  RDF
1Hassan Salmani, Mohammad Tehranipoor Layout-Aware Switching Activity Localization to Enhance Hardware Trojan Detection. Search on Bibsonomy IEEE Transactions on Information Forensics and Security The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Hassan Salmani, Mohammad Tehranipoor, Jim Plusquellic A Novel Technique for Improving Hardware Trojan Detection and Reducing Trojan Activation Time. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Junxia Ma, Mohammad Tehranipoor, Patrick Girard A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk. Search on Bibsonomy J. Electronic Testing The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Shuo Wang, Mohammad Tehranipoor TSUNAMI: a light-weight on-chip structure for measuring timing uncertainty induced by noise during functional and test operations. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Nicholas Tuzzio, Kan Xiao, Xuehui Zhang, Mohammad Tehranipoor A zero-overhead IC identification technique using clock sweeping and path delay analysis. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Jifeng Chen, Shuo Wang, Mohammad Tehranipoor Efficient selection and analysis of critical-reliability paths and gates. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Min Li, Azadeh Davoodi, Mohammad Tehranipoor A sensor-assisted self-authentication framework for hardware trojan detection. Search on Bibsonomy DATE The full citation details ... 2012 DBLP  BibTeX  RDF
1Charles Lamech, Reza M. Rad, Mohammad Tehranipoor, Jim Plusquellic An Experimental Analysis of Power and Delay Signal-to-Noise Requirements for Detecting Trojans and Methods for Achieving the Required Detection Sensitivities. Search on Bibsonomy IEEE Transactions on Information Forensics and Security The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Junxia Ma, Mohammad Tehranipoor Layout-Aware Critical Path Delay Test Under Maximum Power Supply Noise Effects. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Mohammad Tehranipoor, Hassan Salmani, Xuehui Zhang, Michel Wang, Ramesh Karri, Jeyavijayan Rajendran, Kurt Rosenfeld Trustworthy Hardware: Trojan Detection and Design-for-Trust Challenges. Search on Bibsonomy IEEE Computer The full citation details ... 2011 DBLP  DOI  BibTeX  RDF Hardware Trojans, Side-channel signal analysis, Integrated circuits, Intellectual property
1Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty A Metric to Target Small-Delay Defects in Industrial Circuits. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty Test and Diagnosis for Small-Delay Defects. Search on Bibsonomy 2011   DOI  RDF
1Fang Bao, Ke Peng, Krishnendu Chakrabarty, Mohammad Tehranipoor On Generation of 1-Detect TDF Pattern Set with Significantly Increased SDD Coverage. Search on Bibsonomy Asian Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Shuo Wang, Mohammad Tehranipoor, LeRoy Winemberg In-field aging measurement and calibration for power-performance optimization. Search on Bibsonomy DAC The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor Critical Fault-Based Pattern Generation for Screening SDDs. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Junxia Ma, Nisar Ahmed, Mohammad Tehranipoor Low-cost diagnostic pattern generation and evaluation procedures for noise-related failures. Search on Bibsonomy VTS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty Power-safe test application using an effective gating approach considering current limits. Search on Bibsonomy VTS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor Case Study: Efficient SDD test generation for very large integrated circuits. Search on Bibsonomy VTS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg Special session 5B: Panel How much toggle activity should we be testing with? Search on Bibsonomy VTS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1LeRoy Winemberg, Mohammad Tehranipoor Special session: Hot topic: Smart silicon. Search on Bibsonomy VTS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor Power-aware test generation with guaranteed launch safety for at-speed scan testing. Search on Bibsonomy VTS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Xuehui Zhang, Mohammad Tehranipoor Case study: Detecting hardware Trojans in third-party digital IP cores. Search on Bibsonomy HOST The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Xuehui Zhang, Mohammad Tehranipoor RON: An on-chip ring oscillator network for hardware Trojan detection. Search on Bibsonomy DATE The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Xuehui Zhang, Nicholas Tuzzio, Mohammad Tehranipoor Red team: Design of intelligent hardware trojans with known defense schemes. Search on Bibsonomy ICCD The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Nisar Ahmed, Mohammad Tehranipoor A Novel IR-Drop Tolerant Transition Delay Fault Test Pattern Generation Procedure. Search on Bibsonomy J. Low Power Electronics The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Xiaoqing Wen, Nisar Ahmed A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for Launch-Off-Shift and Launch-Off-Capture Schemes. Search on Bibsonomy J. Low Power Electronics The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Kohei Miyase, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara, Patrick Girard, Laung-Terng Wang, Mohammad Tehranipoor High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme. Search on Bibsonomy IEICE Transactions The full citation details ... 2010 DBLP  BibTeX  RDF
1Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Ramesh Karri, Jeyavijayan Rajendran, Kurt Rosenfeld, Mohammad Tehranipoor Trustworthy Hardware: Identifying and Classifying Hardware Trojans. Search on Bibsonomy IEEE Computer The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Reza M. Rad, James F. Plusquellic, Mohammad Tehranipoor A Sensitivity Analysis of Power Signal Methods for Detecting Hardware Trojans Under Real Process and Environmental Conditions. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Mohammad Tehranipoor, Farinaz Koushanfar A Survey of Hardware Trojan Taxonomy and Detection. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2010 DBLP  DOI  BibTeX  RDF hardware Trojans, Trojan taxonomy and detection, security, design and test, ICs
1Mohammad Tehranipoor, Kenneth M. Butler Power Supply Noise: A Survey on Effects and Research. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2010 DBLP  DOI  BibTeX  RDF power supply noise (PSN), transition delay fault testing, timing analysis, design and test, path delay testing
1Mohammad Tehranipoor, Farinaz Koushanfar Guest Editors' Introduction: Confronting the Hardware Trustworthiness Problem. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2010 DBLP  DOI  BibTeX  RDF hardware Trojans, Trojan attack, design and test, security measures, secret key, IP protection
1Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, Nisar Ahmed Is test power reduction through X-filling good enough? Search on Bibsonomy ITC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Wei Zhao, Junxia Ma, Mohammad Tehranipoor, Sreejit Chakravarty Power-Safe Application of Transition Delay Fault Patterns Considering Current Limit during Wafer Test. Search on Bibsonomy Asian Test Symposium The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Sandeep Kumar Goel, Krishnendu Chakrabarty, Mahmut Yilmaz, Ke Peng, Mohammad Tehranipoor Circuit Topology-Based Test Pattern Generation for Small-Delay Defects. Search on Bibsonomy Asian Test Symposium The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor A Noise-Aware Hybrid Method for SDD Pattern Grading and Selection. Search on Bibsonomy Asian Test Symposium The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Junxia Ma, Jeremy Lee, Mohammad Tehranipoor, Nisar Ahmed, Patrick Girard Pattern grading for testing critical paths considering power supply noise and crosstalk using a layout-aware quality metric. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2010 DBLP  DOI  BibTeX  RDF pattern grading, crosstalk, signal integrity, power supply noise, path delay test
1Ke Peng, Yu Huang 0005, Pinki Mallick, Wu-Tung Cheng, Mohammad Tehranipoor Full-circuit SPICE simulation based validation of dynamic delay estimation. Search on Bibsonomy European Test Symposium The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Ke Peng, Yu Huang 0005, Ruifeng Guo, Wu-Tung Cheng, Mohammad Tehranipoor Emulating and diagnosing IR-drop by using dynamic SDF. Search on Bibsonomy ASP-DAC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Ke Peng, Jason Thibodeau, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor A novel hybrid method for SDD pattern grading and selection. Search on Bibsonomy VTS The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Xiaoxiao Wang, Mohammad Tehranipoor Novel Physical Unclonable Function with process and environmental variations. Search on Bibsonomy DATE The full citation details ... 2010 DBLP  BibTeX  RDF
1Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty High-quality pattern selection for screening small-delay defects considering process variations and crosstalk. Search on Bibsonomy DATE The full citation details ... 2010 DBLP  BibTeX  RDF
1Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Junxia Ma, Wei Zhao, Mohammad Tehranipoor, Xiaoqing Wen Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes. Search on Bibsonomy DDECS The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Nisar Ahmed, Mohammad Tehranipoor A Novel Faster-Than-at-Speed Transition-Delay Test Method Considering IR-Drop Effects. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Xiaoxiao Wang, Mohammad Tehranipoor, Ramyanshu Datta A novel architecture for on-chip path delay measurement. Search on Bibsonomy ITC The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Junxia Ma, Jeremy Lee, Mohammad Tehranipoor Layout-Aware Pattern Generation for Maximizing Supply Noise Effects on Critical Paths. Search on Bibsonomy VTS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Mohammad Tehranipoor, Jim Plusquellic (eds.) IEEE International Workshop on Hardware-Oriented Security and Trust, HOST 2009, San Francisco, CA, USA, July 27, 2009. Proceedings Search on Bibsonomy HOST The full citation details ... 2009 DBLP  BibTeX  RDF
1Hassan Salmani, Mohammad Tehranipoor, Jim Plusquellic New Design Strategy for Improving Hardware Trojan Detection and Reducing Trojan Activation Time. Search on Bibsonomy HOST The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor (eds.) 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA Search on Bibsonomy DFT The full citation details ... 2009 DBLP  BibTeX  RDF
1Jeremy Lee, Mohammad Tehranipoor Layout-Aware Transition-Delay Fault Pattern Generation with Evenly Distributed Switching Activity. Search on Bibsonomy J. Low Power Electronics The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed Low-Transition Test Pattern Generation for BIST-Based Applications. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Low power pattern generation, Test generation, Built-in tests, Testing strategies, Random generation
1Reza M. Rad, Mohammad Tehranipoor SCT: A novel approach for testing and configuring nanoscale devices. Search on Bibsonomy JETC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Configuration and testing, reconfigurable nanoscale devices, fault tolerance, crossbar, nanowire
1Mohammad Tehranipoor, Reza M. Rad Defect Tolerance for Nanoscale Crossbar-Based Devices. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Jeremy Lee, Mohammad Tehranipoor A Novel Pattern Generation Framework for Inducing Maximum Crosstalk Effects on Delay-Sensitive Paths. Search on Bibsonomy ITC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects. Search on Bibsonomy ITC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Junxia Ma, Jeremy Lee, Mohammad Tehranipoor Power Distribution Failure Analysis Using Transition-Delay Fault Patterns. Search on Bibsonomy ITC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Jeremy Lee, Mohammad Tehranipoor LS-TDF: Low-Switching Transition Delay Fault Pattern Generation. Search on Bibsonomy VTS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor Test-Pattern Grading and Pattern Selection for Small-Delay Defects. Search on Bibsonomy VTS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Small-delay defects, pattern grading, pattern selection, ATPG
1Mohammad Tehranipoor, Jim Plusquellic (eds.) IEEE International Workshop on Hardware-Oriented Security and Trust, HOST 2008, Anaheim, CA, USA, June 9, 2008. Proceedings Search on Bibsonomy HOST The full citation details ... 2008 DBLP  BibTeX  RDF
1Xiaoxiao Wang, Mohammad Tehranipoor, Jim Plusquellic Detecting Malicious Inclusions in Secure Hardware: Challenges and Solutions. Search on Bibsonomy HOST The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Reza M. Rad, Jim Plusquellic, Mohammad Tehranipoor Sensitivity Analysis to Hardware Trojans using Power Supply Transient Signals. Search on Bibsonomy HOST The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Jeremy Lee, Sumit Narayan, Mike Kapralos, Mohammad Tehranipoor Layout-Aware, IR-Drop Tolerant Transition Fault Pattern Generation. Search on Bibsonomy DATE The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, Mohammad Tehranipoor (eds.) 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA Search on Bibsonomy DFT The full citation details ... 2008 DBLP  BibTeX  RDF
1Xiaoxiao Wang, Hassan Salmani, Mohammad Tehranipoor, James F. Plusquellic Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis. Search on Bibsonomy DFT The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Reza M. Rad, Xiaoxiao Wang, Mohammad Tehranipoor, Jim Plusquellic Power supply signal calibration techniques for improving detection resolution to hardware Trojans. Search on Bibsonomy ICCAD The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Xiaoxiao Wang, Mohammad Tehranipoor, Ramyanshu Datta Path-RO: a novel on-chip critical path delay measurement under process variations. Search on Bibsonomy ICCAD The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Jeremy Lee, Mohammad Tehranipoor, Chintan Patel, Jim Plusquellic Securing Designs against Scan-Based Side-Channel Attacks. Search on Bibsonomy IEEE Trans. Dependable Sec. Comput. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF Security and Privacy Protection, Scan-Based Design, Secure Design, Reliability and Testing
1Mohammed ElShoukry, Mohammad Tehranipoor, C. P. Ravikumar A critical-path-aware partial gating approach for test power reduction. Search on Bibsonomy ACM Trans. Design Autom. Electr. Syst. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF partial gating, scan cell gating, Low-power testing, scan testing
1Reza M. Rad, Mohammad Tehranipoor Evaluating area and performance of hybrid FPGAs with nanoscale clusters and CMOS routing. Search on Bibsonomy JETC The full citation details ... 2007 DBLP  DOI  BibTeX  RDF performance, FPGA, reliability, CMOS, Nanotechnology
1Mohammad Tehranipoor, Reza M. Rad Built-In Self-Test and Recovery Procedures for Molecular Electronics-Based Nanofabrics. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar, Kenneth M. Butler Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Mohammad Tehranipoor Guest Editorial. Search on Bibsonomy J. Electronic Testing The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Mohammad Tehranipoor, Kenneth M. Butler Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2007 DBLP  DOI  BibTeX  RDF PSN, IR drop, power supply noise, deep-submicron designs
1Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design. Search on Bibsonomy DAC The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram Supply Voltage Noise Aware ATPG for Transition Delay Faults. Search on Bibsonomy VTS The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Nisar Ahmed, Mohammad Tehranipoor Improving Transition Delay Test Using a Hybrid Method. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2006 DBLP  DOI  BibTeX  RDF launch-off-capture, delay testing, test quality
1Jim Plusquellic, Dhruva Acharyya, Abhishek Singh, Mohammad Tehranipoor, Chintan Patel Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2006 DBLP  DOI  BibTeX  RDF Quiescent Signal Analysis, defect detection, IDDQ
1Reza M. Rad, Mohammad Tehranipoor A new hybrid FPGA with nanoscale clusters and CMOS routing. Search on Bibsonomy DAC The full citation details ... 2006 DBLP  DOI  BibTeX  RDF reconfigurable nanoscale devices, FPGA, molecular electronics
1Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram Timing-based delay test for screening small delay defects. Search on Bibsonomy DAC The full citation details ... 2006 DBLP  DOI  BibTeX  RDF test generation, delay testing
1Reza M. Rad, Mohammad Tehranipoor SCT: An Approach For Testing and Configuring Nanoscale Devices. Search on Bibsonomy VTS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Kee Sup Kim, Mohammad Tehranipoor Session Abstract. Search on Bibsonomy VTS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Jeremy Lee, Mohammad Tehranipoor, Jim Plusquellic A Low-Cost Solution for Protecting IPs Against Scan-Based Side-Channel Attacks. Search on Bibsonomy VTS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Mohammad Tehranipoor, Reza M. Rad Fine-grained island style architecture for molecular electronic devices. Search on Bibsonomy FPGA The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Mohammad Tehranipoor, Reza M. Rad Test and recovery for fine-grained nanoscale architectures. Search on Bibsonomy FPGA The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Reza M. Rad, Mohammad Tehranipoor A Reconfiguration-based Defect Tolerance Method for Nanoscale Devices. Search on Bibsonomy DFT The full citation details ... 2006 DBLP  DOI  BibTeX  RDF Nanoscale Devices, Fault Tolerance, Test, Reconfiguration, Redundancy, Crossbar
1Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram A novel framework for faster-than-at-speed delay test considering IR-drop effects. Search on Bibsonomy ICCAD The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Mohammad Tehranipoor, Mehrdad Nourani, Krishnendu Chakrabarty Nine-coded compression technique for testing embedded cores in SoCs. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar Enhanced launch-off-capture transition fault testing. Search on Bibsonomy ITC The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Mohammad Tehranipoor, Mehrdad Nourani, Nisar Ahmed Low Transition LFSR for BIST-Based Applications. Search on Bibsonomy Asian Test Symposium The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Mohammed ElShoukry, Mohammad Tehranipoor, C. P. Ravikumar Partial Gating Optimization for Power Reduction During Test Application. Search on Bibsonomy Asian Test Symposium The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed Pattern Generation and Estimation for Power Supply Noise Analysis. Search on Bibsonomy VTS The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Nisar Ahmed, C. P. Ravikumar, Mohammad Tehranipoor, Jim Plusquellic At-Speed Transition Fault Testing With Low Speed Scan Enable. Search on Bibsonomy VTS The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Nisar Ahmed, Mohammad Tehranipoor Improving Transition Delay Fault Coverage Using Hybrid Scan-Based Technique. Search on Bibsonomy DFT The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Jeremy Lee, Mohammad Tehranipoor, Chintan Patel, Jim Plusquellic Securing Scan Design Using Lock and Key Technique. Search on Bibsonomy DFT The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Mohammad Tehranipoor Defect Tolerance for Molecular Electronics-Based NanoFabrics Using Built-In Self-Test Procedure. Search on Bibsonomy DFT The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
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