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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 1 occurrences of 1 keywords
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Results
Found 20 publication records. Showing 20 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Narendra Devta-Prasanna, Arun Gunda, Sudhakar M. Reddy, Irith Pomeranz |
Multiple fault activation cycle tests for transistor stuck-open faults.  |
ITC  |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Narendra Devta-Prasanna, Arun Gunda |
Clock Gate Test Points. |
ITC |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Narendra Devta-Prasanna, Sandeep Kumar Goel, Arun Gunda, Mark Ward, P. Krishnamurthy |
Accurate measurement of small delay defect coverage of test patterns. |
ITC |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Sandeep Kumar Goel, Narendra Devta-Prasanna, Mark Ward |
Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study. |
ITC |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
Detectability of internal bridging faults in scan chains. |
ASP-DAC |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Sandeep Kumar Goel, Narendra Devta-Prasanna, Ritesh P. Turakhia |
Effective and Efficient Test Pattern Generation for Small Delay Defect. |
VTS |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
Improving the Detectability of Resistive Open Faults in Scan Cells. |
DFT |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda |
Comparative study of centralised and distributed compatibility-based test data compression. |
IET Computers & Digital Techniques |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
Detection of Internal Stuck-open Faults in Scan Chains. |
ITC |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
On the Detectability of Scan Chain Internal Faults An Industrial Case Study. |
VTS |
2008 |
DBLP DOI BibTeX RDF |
Faults in scan cells, stuck-at and stuck-on faults |
| 1 | Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells. |
DFT |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
An Enhanced Logic BIST Architecture for Online Testing. |
IOLTS |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Erik Chmelar, M. Grinchuk, Arun Gunda |
Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda |
Systematic Scan Reconfiguration. |
ASP-DAC |
2007 |
DBLP DOI BibTeX RDF |
systematic scan reconfiguration, test data compression technique, single-stuck fault test sets, transition fault test sets, scan chains |
| 1 | Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |
A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults. |
European Test Symposium |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |
Test Generation for Open Defects in CMOS Circuits. |
DFT |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |
Methods for improving transition delay fault coverage using broadside tests. |
ITC |
2005 |
DBLP DOI BibTeX RDF |
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| 1 | Narendra Devta-Prasanna, Sudhakar M. Reddy, Arun Gunda, P. Krishnamurthy, Irith Pomeranz |
Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions. |
Asian Test Symposium |
2005 |
DBLP DOI BibTeX RDF |
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| 1 | Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda |
Should Illinois-Scan Based Architectures be Centralized or Distributed? |
DFT |
2005 |
DBLP DOI BibTeX RDF |
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| 1 | Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |
A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals. |
ICCD |
2005 |
DBLP DOI BibTeX RDF |
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