Search results for "Nirnjan M. Devashrayee"

Found 7 publication records. Showing 7 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee	Suitability of Various Low-Power Testing Techniques for IP Core-Based SoC: A Survey.	VLSI Design	2011	DBLP DOI BibTeX RDF
1	Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee	Weighted Transition Based Reordering, Columnwise Bit Filling, and Difference Vector: A Power-Aware Test Data Compression Method.	VLSI Design	2011	DBLP DOI BibTeX RDF
1	Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee	Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A Survey.	VLSI Design	2010	DBLP DOI BibTeX RDF
1	Usha Sandeep Mehta, Niranjan M. Devashrayee, Kankar S. Dasgupta	Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead.	ISVLSI	2010	DBLP DOI BibTeX RDF
1	Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee	Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead.	J. Electronic Testing	2010	DBLP DOI BibTeX RDF
1	Usha S. Mehla, Kankar S. Dasgupta, Nirnjan M. Devashrayee	Hamming Distance Based Reordering and Columnwise Bit Stuffing with Difference Vector: A Better Scheme for Test Data Compression with Run Length Based Codes.	VLSI Design	2010	DBLP DOI BibTeX RDF	Golomb Codes, Bit Stuffing, Difference Vector, Hamming Distance, Test Data Compression, Run Length Codes
1	Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee	Survey of Test Data Compression Technique Emphasizing Code Based Schemes.	DSD	2009	DBLP DOI BibTeX RDF

Displaying result #1 - #7 of 7 (100 per page; Change: )

Publications of Nirnjan M. Devashrayee Niranjan M. Devashrayee ( http://dblp.L3S.de/Authors/Nirnjan_M._Devashrayee )