Search    Browse

The FacetedDBLP logo    Search for: in:

Disable automatic phrases ?     Syntactic query expansion: ?

Publications of "Peter Ersland" ( http://dblp.L3S.de/Authors/Peter_Ersland )

  Author page on DBLP  Author page in RDF  Community of Peter Ersland in ASPL-2

Publication years (Num. hits)
2003-2012 (15)
Publication types (Num. hits)
article(15)
Venues (Conferences, Journals, ...)
Microelectronics Reliability(12) Microelectronics Journal(3)
Authors
Peter Ersland(15) Roberto Menozzi(9) C. Gil(3) Samson Mil'shtein(3) Shivarajiv Somisetty(2) Xinxing Yang(2) A. Li(1) Hei-Ruey Jen(1) Jason Barrett(1)
GrowBag graphs for keyword ? (Num. hits/coverage)

Group by:
No Growbag Graphs found.
Results
Found 15 publication records. Showing 15 according to the selection in the facets
Hits ?▲ Authors Title Venue Year Link Author keywords
1Peter Ersland, Roberto Menozzi Editorial. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Peter Ersland, Roberto Menozzi Editorial. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Peter Ersland, Roberto Menozzi Editorial. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1C. Gil, Peter Ersland, A. Li Determining DC/RF survivability limits of GaAs semiconductor circuits. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Peter Ersland, Roberto Menozzi Editorial. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Samson Mil'shtein, Peter Ersland Progress of quantum electronics and the future of wireless technologies. Search on Bibsonomy Microelectronics Journal The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Peter Ersland, Roberto Menozzi Editorial. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Peter Ersland, Roberto Menozzi Editorial. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Shivarajiv Somisetty, Peter Ersland, Xinxing Yang, Jason Barrett Reliability investigation and characterization of failure modes in Schottky diodes. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Peter Ersland, Roberto Menozzi Editorial. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Samson Mil'shtein, C. Gil, Peter Ersland Heterojunction semiconductor triode - a new vertical device. Search on Bibsonomy Microelectronics Journal The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Peter Ersland, Roberto Menozzi Editorial. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Peter Ersland, Hei-Ruey Jen, Xinxing Yang Lifetime acceleration model for HAST tests of a pHEMT process. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Peter Ersland, Roberto Menozzi Editorial. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Samson Mil'shtein, Peter Ersland, Shivarajiv Somisetty, C. Gil p-HEMT with tailored field. Search on Bibsonomy Microelectronics Journal The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
Displaying result #1 - #15 of 15 (100 per page; Change: )
Valid XHTML 1.1! Valid CSS! [Valid RSS]
Maintained by Jörg Diederich.
Based upon DBLP by Michael Ley.