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Found 52 publication records. Showing 52 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | F. Infante, Philippe Perdu, H. B. Kor, C. L. Gan, Dean Lewis |
Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization.  |
Microelectronics Reliability  |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Arkadiusz Glowacki, Christian Boit, Philippe Perdu |
Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Guillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet |
LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | G. Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, Dean Lewis |
Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis |
CADless laser assisted methodologies for failure analysis and device reliability. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet |
Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Philippe Perdu, Jerome Di-Battista, Sylvain Dudit, Tomonori Nakamura |
VLSI functional analysis by dynamic emission microscopy. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | F. Infante, Philippe Perdu, Dean Lewis |
Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Jerome Di-Battista, Jean-Christophe Courrège, Bruno Rouzeyre, Lionel Torres, Philippe Perdu |
When Failure Analysis Meets Side-Channel Attacks. |
CHES |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | F. Molière, B. Foucher, Philippe Perdu, A. Bravaix |
Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics. |
Microelectronics Reliability |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | F. Infante, Philippe Perdu, Dean Lewis |
Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package. |
Microelectronics Reliability |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | M. Bouya, N. Malbert, Nathalie Labat, D. Carisetti, Philippe Perdu, J. C. Clement, B. Lambert, M. Bonnet |
Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques. |
Microelectronics Reliability |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | M. Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, O. Crépel, Dean Lewis |
Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs. |
Microelectronics Reliability |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Antoine Reverdy, M. de la Bardonnie, P. Poirier, H. Murray, Philippe Perdu, A. Boukkali |
Dynamic study of the thermal laser stimulation response on advanced technology structures. |
Microelectronics Reliability |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Aziz Machouat, G. Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, F. Essely |
Effect of physical defect on shmoos in CMOS DSM technologies. |
Microelectronics Reliability |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Antoine Reverdy, Philippe Perdu, H. Murray, M. de la Bardonnie, P. Poirier |
Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology. |
Microelectronics Reliability |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Julie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gerald Haller, Vincent Goubier |
Generic simulator for faulty IC. |
Microelectronics Reliability |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | M. Bouya, D. Carisetti, N. Malbert, Nathalie Labat, Philippe Perdu, J. C. Clement, M. Bonnet, G. Pataut |
Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Felix Beaudoin, Kevin Sanchez, Philippe Perdu |
Dynamic laser stimulation techniques for advanced failure analysis and design debug applications. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | A. Crosson, L. Escotte, M. Bafleur, D. Talbourdet, L. Crétinon, Philippe Perdu, G. Perez |
Long-term reliability of silicon bipolar transistors subjected to low constraints. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis |
Identification of process/design issues during 0.18 µm technology qualification for space application. |
DATE |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat |
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. |
Microelectronics Reliability |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | F. Essely, F. Darracq, Vincent Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, André Touboul, Dean Lewis |
Application of various optical techniques for ESD defect localization. |
Microelectronics Reliability |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | C. De Nardi, Romain Desplats, Philippe Perdu, J.-L. Gauffier, C. Guérin |
Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards. |
Microelectronics Reliability |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Abdellatif Firiti, Felix Beaudoin, G. Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat |
Impact of semiconductors material on IR Laser Stimulation signal. |
Microelectronics Reliability |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | N. Guitard, F. Essely, D. Trémouilles, M. Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis |
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. |
Microelectronics Reliability |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis |
NIR laser stimulation for dynamic timing analysis. |
Microelectronics Reliability |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | M. Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit |
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. |
Microelectronics Reliability |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, J. M. Nicot, J. P. Roux, M. Otte |
Dynamic Laser Stimulation Case Studies. |
Microelectronics Reliability |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | D. Briand, Felix Beaudoin, J. Courbat, N. F. de Rooij, Romain Desplats, Philippe Perdu |
Failure analysis of micro-heating elements suspended on thin membranes. |
Microelectronics Reliability |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier |
Oxide charge measurements in EEPROM devices. |
Microelectronics Reliability |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu |
Electrical Modeling for Laser Testing with Different Pulse Durations. |
IOLTS |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | O. Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Ph. Descamps, Felix Beaudoin, L. Marina |
Magnetic emission mapping for passive integrated components characterisation. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | T. Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Y. Danto |
A physical approach on SCOBIC investigation in VLSI. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | T. Beauchêne, D. Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat |
Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | D. Trémouilles, G. Bertrand, M. Bafleur, Felix Beaudoin, Philippe Perdu, N. Guitard, L. Lescouzères |
TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, G. Haller, Vincent Pouget, Dean Lewis |
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Kevin Sanchez, Romain Desplats, G. Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu |
Solar Cell Analysis with Light Emission and OBIC Techniques. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | M. Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis |
Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Abdellatif Firiti, D. Faujour, Gerald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis |
Short defect characterization based on TCR parameter extraction. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari |
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | T. Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles |
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted Lundquist, Ketan Shah |
Fault Localization using Time Resolved Photon Emission and STIL Waveforms. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | O. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis |
Backside Hot Spot Detection Using Liquid Crystal Microscopy. |
Microelectronics Reliability |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Felix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, Dean Lewis |
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. |
Microelectronics Reliability |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | O. Crépel, C. Goupil, B. Domengès, Ph. Descamps, Philippe Perdu, A. Doukkali |
Magnetic field measurements for Non Destructive Failure Analysis. |
Microelectronics Reliability |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement |
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. |
Microelectronics Reliability |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Romain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, Dean Lewis |
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. |
Microelectronics Reliability |
2001 |
DBLP BibTeX RDF |
|
| 1 | Dean Lewis, Vincent Pouget, T. Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu |
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. |
Microelectronics Reliability |
2001 |
DBLP BibTeX RDF |
|
| 1 | Felix Beaudoin, X. Chauffleur, J. P. Fradin, Philippe Perdu, Romain Desplats, Dean Lewis |
Modeling Thermal Laser Stimulation. |
Microelectronics Reliability |
2001 |
DBLP BibTeX RDF |
|
| 1 | Felix Beaudoin, Philippe Perdu, Romain Desplats, S. Rigo, Dean Lewis |
Silicon Thinning and Polishing on Packaged Devices. |
Microelectronics Reliability |
2001 |
DBLP BibTeX RDF |
|
| 1 | Romain Desplats, Philippe Perdu, Felix Beaudoin |
A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. |
Microelectronics Reliability |
2001 |
DBLP BibTeX RDF |
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