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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 2 occurrences of 2 keywords
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Results
Found 14 publication records. Showing 14 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Lucas Brusamarello, Gilson I. Wirth, Philippe Roussel, Miguel Miranda |
Fast and accurate statistical characterization of standard cell libraries.  |
Microelectronics Reliability  |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Miguel Miranda, Philippe Roussel, Lucas Brusamarello, Gilson I. Wirth |
Statistical characterization of standard cells using design of experiments with response surface modeling. |
DAC |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Miguel Miranda, Paul Zuber, Petr Dobrovolný, Philippe Roussel |
Variability aware modeling for yield enhancement of SRAM and logic. |
DATE |
2011 |
DBLP BibTeX RDF |
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| 1 | Jouke Verbree, Erik Jan Marinissen, Philippe Roussel, Dimitrios Velenis |
On the cost-effectiveness of matching repositories of pre-tested wafers for wafer-to-wafer 3D chip stacking. |
European Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Amadou Ndiaye, Guy Della Valle, Philippe Roussel |
Qualitative modelling of a multi-step process: The case of French breadmaking. |
Expert Syst. Appl. |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Miguel Miranda, Bart Dierickx, Paul Zuber, P. Dobrovoln, F. Kutscherauer, Philippe Roussel, Pavel Poliakov |
Variability aware modeling of SoCs: From device variations to manufactured system yield. |
ISQED |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Paul Zuber, Vladimir Matvejev, Philippe Roussel, Petr Dobrovolný, Miguel Miranda |
Exponent Monte Carlo for Quick Statistical Circuit Simulation. |
PATMOS |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | D. Trémouilles, Steven Thijs, Philippe Roussel, M. I. Natarajan, Vesselin K. Vassilev, Guido Groeseneken |
Transient voltage overshoot in TLP testing - Real or artifact? |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Isodiana Crupi, Robin Degraeve, Bogdan Govoreanu, David P. Brunco, Philippe Roussel, Jan Van Houdt |
Distribution and generation of traps in SiO2/Al2O3 gate stacks. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Ben Kaczer, Robin Degraeve, Philippe Roussel, Guido Groeseneken |
Gate oxide breakdown in FET devices and circuits: From nanoscale physics to system-level reliability. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Antonis Papanikolaou, T. Grabner, Miguel Miranda, Philippe Roussel, Francky Catthoor |
Yield prediction for architecture exploration in nanometer technology nodes: : a model and case study for memory organizations. |
CODES+ISSS |
2006 |
DBLP DOI BibTeX RDF |
system exploration, process variability, parametric yield |
| 1 | Y.-L. Li, Zs. Tökei, Philippe Roussel, Guido Groeseneken, Karen Maex |
Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. |
Microelectronics Reliability |
2005 |
DBLP DOI BibTeX RDF |
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| 1 | Alain Colmerauer, Philippe Roussel |
The Birth of Prolog. |
HOPL Preprints |
1993 |
DBLP DOI BibTeX RDF |
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| 1 | Maria Virginia Aponte, José Alberto Fernández, Philippe Roussel |
Editing First-Order Proofs: Programmed Rules vs Derived Rules. |
SLP |
1984 |
DBLP BibTeX RDF |
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