Search results for "Pia Sanda"

Found 9 publication records. Showing 9 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Pradeep Ramachandran, Prabhakar Kudva, Jeffrey W. Kellington, John Schumann, Pia Sanda	Statistical Fault Injection.	DSN	2008	DBLP DOI BibTeX RDF
1	Dimitris Gizopoulos, Kaushik Roy, Subhasish Mitra, Pia Sanda	Soft Errors: System Effects, Protection Techniques and Case Studies.	DATE	2008	DBLP DOI BibTeX RDF
1	Subhasish Mitra, Pia Sanda, Norbert Seifert	Soft Errors: Technology Trends, System Effects, and Protection Techniques.	IOLTS	2007	DBLP DOI BibTeX RDF	Memory soft errors, Logic soft errors, timing derating, logic derating, architectural derating, Built-In Soft Error Resilience, reliability, data integrity, availability, Error Correcting Codes, error detection, recovery, Soft errors, FITs, radiation hardening
1	Sarita V. Adve, Pia Sanda	Guest Editors' Introduction: Reliability-Aware Microarchitecture.	IEEE Micro	2005	DBLP DOI BibTeX RDF	Reliability-aware microarchitecture, reliability management, soft errors, CMOS scaling
1	Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda, Philip Wu, Steve Wilson	Latchup Analysis Using Emission Microscopy.	Microelectronics Reliability	2003	DBLP DOI BibTeX RDF
1	Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda	Optical and Electrical Testing of Latchup in I/O Interface Circuits.	ITC	2003	DBLP DOI BibTeX RDF
1	Stanislav Polonsky, Moyra K. McManus, Daniel R. Knebel, Steve Steen, Pia Sanda	Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	imaging circuit analysis, IBM G6 microprocessor, non-invasive backside timing, Picosecond Imaging Circuit Analysis, waveform extraction, integrated circuit testing, timing analysis, race condition, circuit switching, integrated memory circuits, hazards and race conditions, L1 cache
1	William V. Huott, Moyra K. McManus, Daniel R. Knebel, Steve Steen, Dennis Manzer, Pia Sanda, Steve Wilson, Yuen H. Chan, Antonio Pelella, Stanislav Polonsky	The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA).	ITC	1999	DBLP DOI BibTeX RDF
1	Daniel R. Knebel, Pia Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika	Diagnosis and characterization of timing-related defects by time-dependent light emission.	ITC	1998	DBLP DOI BibTeX RDF

Publications of "Pia Sanda" ( http://dblp.L3S.de/Authors/Pia_Sanda )