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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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Results
Found 2 publication records. Showing 2 according to the selection in the facets
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| 1 | R. Arinero, En-xia Zhang, Nadia Rezzak, Ronald D. Schrimpf, Daniel M. Fleetwood, B. K. Choï, A. B. Hmelo, J. Mekki, André Touboul, Frédéric Saigné |
High fluence 1.8 MeV proton irradiation effects on n-type MOS capacitors.  |
Microelectronics Reliability  |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | W. Hourani, B. Gautier, L. Militaru, D. Albertini, A. Descamps-Mandine, R. Arinero |
Influence of the surrounding ambient on the reliability of the electrical characterization of thin oxide layers using an atomic force microscope.  |
Microelectronics Reliability  |
2011 |
DBLP DOI BibTeX RDF |
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