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Publications of "R. L. de Orio" ( http://dblp.L3S.de/Authors/R._L._de_Orio )

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Publication years (Num. hits)
2010 (1) 2011 (2)
Publication types (Num. hits)
article(3)
Venues (Conferences, Journals, ...)
Microelectronics Reliability(3)
Authors
Hajdin Ceric(3) R. L. de Orio(3) Siegfried Selberherr(2) C. Jungemann(1) E. Seebacher(1) Hubert Enichlmair(1) Ivan Starkov(1) J. M. Park(1) Stanislav Tyaginov(1) Tibor Grasser(1)
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Found 3 publication records. Showing 3 according to the selection in the facets
Hits ?▲ Authors Title Venue Year Link Author keywords
1Stanislav Tyaginov, Ivan Starkov, Hubert Enichlmair, C. Jungemann, J. M. Park, E. Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser An analytical approach for physical modeling of hot-carrier induced degradation. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1R. L. de Orio, Hajdin Ceric, Siegfried Selberherr A compact model for early electromigration failures of copper dual-damascene interconnects. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1R. L. de Orio, Hajdin Ceric, Siegfried Selberherr Physically based models of electromigration: From Black's equation to modern TCAD models. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
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