Search results for "Rajesh Galivanche"

Found 13 publication records. Showing 13 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Cecilia Metra, Rajesh Galivanche	Guest Editors' Introduction: Special Section on Concurrent On-Line Testing and Error/Fault Resilience of Digital Systems.	IEEE Trans. Computers	2011	DBLP DOI BibTeX RDF
1	Suriyaprakash Natarajan, Arun Krishnamachary, Eli Chiprout, Rajesh Galivanche	Path coverage based functional test generation for processor marginality validation.	ITC	2010	DBLP DOI BibTeX RDF
1	Amir Nahir, Avi Ziv, Rajesh Galivanche, Alan J. Hu, Miron Abramovici, Albert Camilleri, Bob Bentley, Harry Foster, Valeria Bertacco, Shakti Kapoor	Bridging pre-silicon verification and post-silicon validation.	DAC	2010	DBLP DOI BibTeX RDF	post-silicon, pre-silicon, verification, validation
1	Daniele Rossi, Martin Omaña, Gianluca Berghella, Cecilia Metra, Abhijit Jas, Chandra Tirumurti, Rajesh Galivanche	Low cost and low intrusive approach to test on-line the scheduler of high performance microprocessors.	Conf. Computing Frontiers	2010	DBLP DOI BibTeX RDF	microprocessor, on-line testing, control logic
1	Gadi Singer, Rajesh Galivanche, Srinivas Patil, Mike Tripp	The Challenges of Nanotechnology and Gigacomplexity.	IEEE Design & Test of Computers	2009	DBLP DOI BibTeX RDF
1	Cecilia Metra, Daniele Rossi, Martin Omaña, Abhijit Jas, Rajesh Galivanche	Function-Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic.	European Test Symposium	2008	DBLP DOI BibTeX RDF	microprocessor, error detecting codes, on-line testing, control logic
1	Ramtilak Vemu, Abhijit Jas, Jacob A. Abraham, Srinivas Patil, Rajesh Galivanche	A low-cost concurrent error detection technique for processor control logic.	DATE	2008	DBLP DOI BibTeX RDF
1	Rajesh Galivanche, Rohit Kapur, Antonio Rubio	Testing in the year 2020.	DATE	2007	DBLP DOI BibTeX RDF
1	Rajesh Galivanche, Bob Gottlieb	Session Abstract.	VTS	2006	DBLP DOI BibTeX RDF
1	Rajesh Galivanche	Is the concern for soft-error overblown?	ITC	2005	DBLP DOI BibTeX RDF
1	Sandip Kundu, T. M. Mak, Rajesh Galivanche	Trends in manufacturing test methods and their implications.	ITC	2004	DBLP DOI BibTeX RDF
1	Bill Grundmann, Rajesh Galivanche, Sandip Kundu	Circuit and Platform Design Challenges in Technologies beyond 90nm.	DATE	2003	DBLP DOI BibTeX RDF
1	Sandip Kundu, Sujit T. Zachariah, Sanjay Sengupta, Rajesh Galivanche	Test Challenges in Nanometer Technologies.	J. Electronic Testing	2001	DBLP DOI BibTeX RDF	circuit marginality testing, process marginality testing, defect based testing, path delay testing

Publications of "Rajesh Galivanche" ( http://dblp.L3S.de/Authors/Rajesh_Galivanche )