| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Rob Aitken |
Yield Learning Perspectives.  |
IEEE Design & Test of Computers  |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Rob Aitken, Krisztián Flautner, John Goodacre |
High-Performance Multiprocessor System on Chip: Trends in Chip Architecture for the Mass Market. |
Multiprocessor System-on-Chip |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Daeyeon Kim, Vikas Chandra, Robert C. Aitken, David Blaauw, Dennis Sylvester |
Variation-aware static and dynamic writability analysis for voltage-scaled bit-interleaved 8-T SRAMs. |
ISLPED |
2011 |
DBLP BibTeX RDF |
|
| 1 | Vikas Chandra, Robert C. Aitken |
On the impact of gate oxide degradation on SRAM dynamic and static write-ability. |
ASP-DAC |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Satyanand Nalam, Vikas Chandra, Robert C. Aitken, Benton H. Calhoun |
Dynamic write limited minimum operating voltage for nanoscale SRAMs. |
DATE |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Vikas Chandra, Robert C. Aitken |
Analytical model for SRAM dynamic write-ability degradation due to gate oxide breakdown. |
DATE |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Rob Aitken |
Time to retire our benchmarks. |
IEEE Design & Test of Computers |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | John Goodenough, Rob Aitken |
Post-silicon is too late avoiding the $50 million paperweight starts with validated designs. |
DAC |
2010 |
DBLP DOI BibTeX RDF |
low power design, emulation, post-silicon validation |
| 1 | Satyanand Nalam, Vikas Chandra, Cezary Pietrzyk, Robert C. Aitken, Benton H. Calhoun |
Asymmetric 6T SRAM with two-phase write and split bitline differential sensing for low voltage operation. |
ISQED |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | S. Saqib Khursheed, Shida Zhong, Robert C. Aitken, Bashir M. Al-Hashimi, Sandip Kundu |
Modeling the impact of process variation on resistive bridge defects. |
ITC |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Nagaraj Ns, Juan C. Rey, Jamil Kawa, Robert C. Aitken, Christian Lütkemeyer, Vijay Pitchumani, Andrzej J. Strojwas, Steve Trimberger |
Who solves the variability problem? |
DAC |
2010 |
DBLP DOI BibTeX RDF |
IC variability |
| 1 | Vikas Chandra, Cezary Pietrzyk, Robert C. Aitken |
On the efficacy of write-assist techniques in low voltage nanoscale SRAMs. |
DATE |
2010 |
DBLP BibTeX RDF |
|
| 1 | Mihir R. Choudhury, Vikas Chandra, Kartik Mohanram, Robert C. Aitken |
TIMBER: Time borrowing and error relaying for online timing error resilience. |
DATE |
2010 |
DBLP BibTeX RDF |
|
| 1 | Michael Wieckowski, Dennis Sylvester, David Blaauw, Vikas Chandra, Sachin Idgunji, Cezary Pietrzyk, Robert C. Aitken |
A black box method for stability analysis of arbitrary SRAM cell structures. |
DATE |
2010 |
DBLP BibTeX RDF |
|
| 1 | Mihir R. Choudhury, Vikas Chandra, Kartik Mohanram, Robert C. Aitken |
Analytical model for TDDB-based performance degradation in combinational logic. |
DATE |
2010 |
DBLP BibTeX RDF |
|
| 1 | Shidhartha Das, David Blaauw, David M. Bull, Krisztián Flautner, Rob Aitken |
Addressing design margins through error-tolerant circuits. |
DAC |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
The challenges of correlating silicon and models in high variability CMOS processes. |
ISPD |
2009 |
DBLP DOI BibTeX RDF |
design validation |
| 1 | Robert C. Aitken |
DFX and Productivity. |
VLSI Design |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Vikas Chandra, Robert C. Aitken |
Impact of voltage scaling on nanoscale SRAM reliability. |
DATE |
2009 |
DBLP BibTeX RDF |
|
| 1 | Rob Aitken, Erik Jan Marinissen |
Guest Editors' Introduction: Addressing the Challenges of Debug and Diagnosis. |
IEEE Design & Test of Computers |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Juan C. Rey, N. S. Nagaraj, Andrew B. Kahng, Fabian Klass, Rob Aitken, Cliff Hou, Luigi Capodieci, Vivek Singh |
DFM in practice: hit or hype? |
DAC |
2008 |
DBLP DOI BibTeX RDF |
critical area analysis, CMP, yield, DFM, OPC, lithography |
| 1 | Rob Aitken |
Special Session 4: Reliability and Circuit Simulation. |
IOLTS |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Rob Aitken, Jerry Bautista, Wojciech Maly, Jan M. Rabaey |
More Moore: foolish, feasible, or fundamentally different? |
ICCAD |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | S. Turnoy, Peter Wintermayr, Robert C. Aitken, Rudy Lauwereins, J. Tracy Weed, V. Kiefer, J. Hartmann |
Panel Session - Caution Ahead: The Road to Design and Manufacturing at 32 and 22 nm. |
DATE |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Vikas Chandra, Robert C. Aitken |
Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS. |
DFT |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Dimitris Gizopoulos, Robert C. Aitken, S. Kundu |
Guest Editorial: Special Section on "Autonomous Silicon Validation and Testing of Microprocessors and Microprocessor-Based Systems". |
IEEE Trans. VLSI Syst. |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
Defect or Variation? Characterizing Standard Cell Behavior at 90nm and below. |
ISQED |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken, Sachin Idgunji |
Worst-case design and margin for embedded SRAM. |
DATE |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Marco Casale-Rossi, Andrzej J. Strojwas, Robert C. Aitken, Antun Domic, Carlo Guardiani, Philippe Magarshack, Douglas Pattullo, Joseph Sawicki |
DFM/DFY: should you trust the surgeon or the family doctor? |
DATE |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
DFM Metrics for Standard Cells. |
ISQED |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
The Design and Validation of IP for DFM/DFY Assurance. |
ITC |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Enrico Macii, Massoud Pedram, Dirk Friebel, Robert C. Aitken, Antun Domic, Roberto Zafalon |
Low-power design tools: are EDA vendors taking this matter seriously? |
DATE |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
Reliability Issues for Embedded SRAM at 90nm and Below. |
IOLTS |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
ITC is Cool. |
IEEE Design & Test of Computers |
2005 |
DBLP DOI BibTeX RDF |
high-frequency test, board and system test, test compression, silicon debug, International Test Conference, ITC |
| 1 | Robert C. Aitken, Betina Hold |
Modeling Soft-Error Susceptibility for IP Blocks. |
IOLTS |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Carol Stolicny, Tapio Koivukangas, Rubin A. Parekhji, Ian G. Harris, Rob Aitken |
ITC 2003 panels: Part 1. |
IEEE Design & Test of Computers |
2004 |
DBLP BibTeX RDF |
|
| 1 | Rob Aitken, Stefan Eichenberger, Gary Maier, Sandip Kundu, Hank Walker |
ITC 2003 Roundtable: Design for Manufacturability. |
IEEE Design & Test of Computers |
2004 |
DBLP BibTeX RDF |
|
| 1 | Rob Aitken |
Test at Gbps: Megaproblem or micromanagement? |
IEEE Design & Test of Computers |
2004 |
DBLP BibTeX RDF |
|
| 1 | Robert C. Aitken |
A Modular Wrapper Enabling High Speed BIST and Repair for Small Wide Memories. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken, Fidel Muradali |
From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions. |
DATE |
2004 |
DBLP BibTeX RDF |
|
| 1 | Robert C. Aitken |
Redundancy & It's Not Just for Defects Anymore. |
MTDT |
2004 |
DBLP DOI BibTeX RDF |
|
| 1 | Rob Aitken, Neeraj Dogra, Dhrumil Gandhi, Scott Becker |
Redundancy, Repair, and Test Features of a 90nm Embedded SRAM Generator. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken, Gordon W. Roberts |
ITC 2003: Breaking Test Interface Bottlenecks. |
IEEE Design & Test of Computers |
2003 |
DBLP BibTeX RDF |
|
| 1 | Gordon W. Roberts, Robert C. Aitken |
ITC Highlights. |
IEEE Design & Test of Computers |
2003 |
DBLP BibTeX RDF |
|
| 1 | Robert C. Aitken |
DFM: The Real 90nm Hurdle. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
Silicon IP And Successful DFM. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
Applying Defect-Based Test to Embedded Memories in a COT Model. |
MTDT |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Julie Segal, Rene Segers, Rob Aitken, S. Eichenberge, A. Gattike, M. Millegen, R. Seger, S. Venkataraman |
Test as a Key Enabler for Faster Yield Ramp-Up. (PDF / PS) |
VTS |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken, Donald L. Wheater |
Guest Editors' Introduction: Stressing the Fundamentals. |
IEEE Design & Test of Computers |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
Test Generation and Fault Modeling for Stress Testing (invited). (PDF / PS) |
ISQED |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken, Mustapha Slamani, H. Ding, William R. Eisenstadt, Sanghoon Choi, John McLaughlin |
Wireless Test. (PDF / PS) |
VTS |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman |
Current ratios: a self-scaling technique for production IDDQ testing. |
ITC |
2000 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
Nanometer Technology Effects on Fault Models for IC Testing. |
IEEE Computer |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman |
Current ratios: a self-scaling technique for production I_DDQ testing. |
ITC |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
It Makes Sense to Combine DFT and DFR/DFY. |
ITC |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken, Fidel Muradali |
Trends in SLI design and their effect on test. |
ITC |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
Extending the Pseudo-Stuck-At Fault Model to Provide Complete IDDQ Coverage. |
VTS |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
On-chip versus off-chip test: an artificial dichotomy. |
ITC |
1998 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken, Jason Cong, Randy Harr, Kenneth L. Shepard, Wayne Wolf |
How will CAD handle billion-transistor systems? (panel). |
ICCAD |
1998 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
Modeling the Unmodelable: Algorithmic Fault Diagnosis. |
IEEE Design & Test of Computers |
1997 |
DBLP DOI BibTeX RDF |
|
| 1 | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly |
So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. |
ITC |
1997 |
DBLP DOI BibTeX RDF |
|
| 1 | Vishwani D. Agrawal, Robert C. Aitken, J. Braden, Joan Figueras, S. Kumar, Hans-Joachim Wunderlich, Yervant Zorian |
Power Dissipation During Testing: Should We Worry About it? (PDF / PS) |
VTS |
1997 |
DBLP DOI BibTeX RDF |
|
| 1 | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken |
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. |
VTS |
1997 |
DBLP DOI BibTeX RDF |
semiconductor testing, stuck-fault testing, ASIC device, application specific integrated circuits, functional testing, IDDQ testing, delay-fault testing, scan testing |
| 1 | Robert C. Aitken |
When tools cry wolf: Testability pitfalls of synthesized designs. |
IEEE Design & Test of Computers |
1996 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
Modelling the Unmodellable: Algorithmic Fault Diagnosis. |
ITC |
1996 |
DBLP DOI BibTeX RDF |
|
| 1 | Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown |
IDDQ and AC Scan: The War Against Unmodelled Defects. |
ITC |
1996 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken, J. Hutcheson, N. Murthy, Phil Nigh, Nicholas Sporck |
Volume Manufacturing - ICs and Boards: DFT to the Rescue? (PDF / PS) |
VTS |
1996 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
An Overview of Test Synthesis Tools. |
IEEE Design & Test of Computers |
1995 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
Finding Defects with Fault Models. |
ITC |
1995 |
DBLP DOI BibTeX RDF |
|
| 1 | Peter C. Maxwell, Robert C. Aitken, Leendert M. Huisman |
The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability. |
ITC |
1994 |
DBLP DOI BibTeX RDF |
|
| 1 | Peter C. Maxwell, Robert C. Aitken |
Test Sets and Reject Rates: All Fault Coverages are Not Created Equal. |
IEEE Design & Test of Computers |
1993 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
BP-1992 A Comparison of Defect Models for Fault Location with IDDQ Measurements. |
ITC |
1993 |
DBLP DOI BibTeX RDF |
|
| 1 | Peter C. Maxwell, Robert C. Aitken |
Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic. |
ITC |
1993 |
DBLP DOI BibTeX RDF |
|
| 1 | Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal |
Using an asymmetric error model to study aliasing in signature analysis registers. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
1992 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
Diagnosis of leakage faults with IDDQ. |
J. Electronic Testing |
1992 |
DBLP DOI BibTeX RDF |
leakage fault model, Fault diagnosis, I DDQ testing |
| 1 | Peter C. Maxwell, Robert C. Aitken |
IDDQ testing as a component of a test suite: The need for several fault coverage metrics. |
J. Electronic Testing |
1992 |
DBLP DOI BibTeX RDF |
quality, fault coverage, scan, functional testing, Current testing, physical defects |
| 1 | Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang |
The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need? |
ITC |
1992 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
A Comparison of Defect Models for Fault Location with IDDQ Measurements. |
ITC |
1992 |
DBLP DOI BibTeX RDF |
|
| 1 | Robert C. Aitken |
Fault Location with Current Monitoring. |
ITC |
1991 |
DBLP DOI BibTeX RDF |
|
| 1 | Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang |
The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%? |
ITC |
1991 |
DBLP DOI BibTeX RDF |
|
| 1 | Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal |
: Experiments on Aliasing in Signature Analysis Registers. |
ITC |
1989 |
DBLP DOI BibTeX RDF |
|
![[Valid RSS]](Pics/valid-rss.png "Validate my RSS feed")