Search results for "Rohit Kapur"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur	A Diagnosability Metric for Test Set Selection Targeting Better Fault Detection.	VLSI Design	2012	DBLP DOI BibTeX RDF
1	Jyotirmoy Saikia, Pramod Notiyath, Santosh Kulkarni, Ashok Anbalan, Rajesh Uppuluri, Tammy Fernandes, Parthajit Bhattacharya, Rohit Kapur	Predicting Scan Compression IP Configurations for Better QoR.	Asian Test Symposium	2011	DBLP DOI BibTeX RDF
1	Anshuman Chandra, Jyotirmoy Saikia, Rohit Kapur	Breaking the Test Application Time Barriers in Compression: Adaptive Scan-Cyclical (AS-C).	Asian Test Symposium	2011	DBLP DOI BibTeX RDF
1	Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg	Special session 5B: Panel How much toggle activity should we be testing with?	VTS	2011	DBLP DOI BibTeX RDF
1	Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur	Multiple Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization.	VLSI Design	2011	DBLP DOI BibTeX RDF
1	Rohit Kapur	Conference Reports.	IEEE Design & Test of Computers	2010	DBLP DOI BibTeX RDF
1	Rohit Kapur	Conference Reports.	IEEE Design & Test of Computers	2010	DBLP DOI BibTeX RDF
1	Rohit Kapur	Conference Reports.	IEEE Design & Test of Computers	2010	DBLP DOI BibTeX RDF
1	Rohit Kapur, Paul Reuter, Sandeep Bhatia, Brion L. Keller	CTL and Its Usage in the EDA Industry.	IEEE Design & Test of Computers	2009	DBLP DOI BibTeX RDF
1	Anshuman Chandra, Yasunari Kanzawa, Rohit Kapur	Proactive management of X's in scan chains for compression.	ISQED	2009	DBLP DOI BibTeX RDF
1	Anshuman Chandra, Rohit Kapur, Yasunari Kanzawa	Scalable Adaptive Scan (SAS).	DATE	2009	DBLP BibTeX RDF
1	Rohit Kapur, Subhasish Mitra, Thomas W. Williams	Historical Perspective on Scan Compression.	IEEE Design & Test of Computers	2008	DBLP DOI BibTeX RDF	scan compression, test data volume reduction, IC testing, test application time reduction
1	Anshuman Chandra, Rohit Kapur	Interval Based X-Masking for Scan Compression Architectures.	ISQED	2008	DBLP DOI BibTeX RDF	X masking, test, compression, DFT, scan
1	Anshuman Chandra, Rohit Kapur	Bounded Adjacent Fill for Low Capture Power Scan Testing.	VTS	2008	DBLP DOI BibTeX RDF	capture power, random fill, shift power, test, low power, scan
1	Anshuman Chandra, Felix Ng, Rohit Kapur	Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction.	DATE	2008	DBLP DOI BibTeX RDF
1	Rohit Kapur, T. Finklea, Felix Ng, Anshuman Chandra, Sanjay Ramnath, Peter Wohl, Thomas W. Williams, Ashok Anbalan, Sandeep S. Kulkarni, Tammy Fernandes, Pramod Notiyath, Rajesh Uppuluri	DFT MAX and Power.	J. Low Power Electronics	2007	DBLP DOI BibTeX RDF
1	Rohit Kapur, Jindrich Zejda, Thomas W. Williams	Fundamentals of timing information for test: How simple can we get?	ITC	2007	DBLP DOI BibTeX RDF
1	Anshuman Chandra, Haihua Yan, Rohit Kapur	Multimode Illinois Scan Architecture for Test Application Time and Test Data Volume Reduction.	VTS	2007	DBLP DOI BibTeX RDF
1	Peter Wohl, John A. Waicukauski, Rohit Kapur, Sanjay Ramnath, Emil Gizdarski, Thomas W. Williams, P. Jaini	Minimizing the Impact of Scan Compression.	VTS	2007	DBLP DOI BibTeX RDF
1	Rajesh Galivanche, Rohit Kapur, Antonio Rubio	Testing in the year 2020.	DATE	2007	DBLP DOI BibTeX RDF
1	Maria Gkatziani, Rohit Kapur, Qing Su, Ben Mathew, Roberto Mattiuzzo, Laura Tarantini, Cy Hay, Salvatore Talluto, Thomas W. Williams	Accurately Determining Bridging Defects from Layout.	DDECS	2007	DBLP BibTeX RDF
1	Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie	OCI: Open Compression Interface.	ITC	2006	DBLP DOI BibTeX RDF
1	Peter Wohl, John A. Waicukauski, Sanjay Patel, Francisco DaSilva, Thomas W. Williams, Rohit Kapur	Efficient compression of deterministic patterns into multiple PRPG seeds.	ITC	2005	DBLP DOI BibTeX RDF
1	Rohit Kapur	Test the test experts: do we know what we are doing?	ITC	2005	DBLP DOI BibTeX RDF
1	Rohit Kapur	Security vs. Test Quality: Are they mutually exclusive?.	ITC	2004	DBLP DOI BibTeX RDF
1	Nodari Sitchinava, Samitha Samaranayake, Rohit Kapur, Emil Gizdarski, Frederic Neuveux, Thomas W. Williams	Changing the Scan Enable during Shift.	VTS	2004	DBLP DOI BibTeX RDF
1	Bruce Cory, Rohit Kapur, Bill Underwood	Speed Binning with Path Delay Test in 150-nm Technology.	IEEE Design & Test of Computers	2003	DBLP DOI BibTeX RDF
1	Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur	Overview of the IEEE P1500 Standard.	ITC	2003	DBLP DOI BibTeX RDF
1	Samitha Samaranayake, Emil Gizdarski, Nodari Sitchinava, Frederic Neuveux, Rohit Kapur, Thomas W. Williams	A Reconfigurable Shared Scan-in Architecture.	VTS	2003	DBLP DOI BibTeX RDF
1	Nahmsuk Oh, Rohit Kapur, Thomas W. Williams, Jim Sproch	Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture.	DATE	2003	DBLP DOI BibTeX RDF
1	Samitha Samaranayake, Nodari Sitchinava, Rohit Kapur, Minesh B. Amin, Thomas W. Williams	Dynamic Scan: Driving Down the Cost of Test.	IEEE Computer	2002	DBLP DOI BibTeX RDF
1	Erik Jan Marinissen, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti, Yervant Zorian	On IEEE P1500's Standard for Embedded Core Test.	J. Electronic Testing	2002	DBLP DOI BibTeX RDF	core test wrapper, core test language, compliance levels, standardization, embedded cores
1	Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams	Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme.	ITC	2002	DBLP DOI BibTeX RDF
1	Loïs Guiller, Frederic Neuveux, S. Duggirala, R. Chandramouli, Rohit Kapur	Integrating DFT in the Physical Synthesis Flow.	ITC	2002	DBLP DOI BibTeX RDF
1	Rohit Kapur, Thomas W. Williams	Manufacturing Test of SoCs.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF
1	Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams	Enhancing test efficiency for delay fault testing using multiple-clocked schemes.	DAC	2002	DBLP DOI BibTeX RDF	transition fault model, delay testing, statistical timing analysis
1	Rohit Kapur, Thomas W. Williams, M. Ray Mercer	Directed-Binary Search in Logic BIST Diagnostics.	DATE	2002	DBLP DOI BibTeX RDF
1	Nahmsuk Oh, Rohit Kapur, Thomas W. Williams	Fast seed computation for reseeding shift register in test pattern compression.	ICCAD	2002	DBLP DOI BibTeX RDF
1	Rohit Kapur, R. Chandramouli, Thomas W. Williams	Strategies for Low-Cost Test.	IEEE Design & Test of Computers	2001	DBLP DOI BibTeX RDF
1	Rohit Kapur, Thomas W. Williams	Tester retargetable patterns.	ITC	2001	DBLP DOI BibTeX RDF
1	Rohit Kapur, Maurice Lousberg, Tony Taylor, Brion L. Keller, Paul Reuter, Douglas Kay	CTL the language for describing core-based test.	ITC	2001	DBLP DOI BibTeX RDF
1	Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir	A new methodology for improved tester utilization.	ITC	2001	DBLP DOI BibTeX RDF
1	Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti	IP and Automation to Support IEEE P1500.	VTS	2001	DBLP DOI BibTeX RDF
1	Rohit Kapur, Cy Hay, Thomas W. Williams	The Mutating Metric for Benchmarking Test.	IEEE Design & Test of Computers	2000	DBLP DOI BibTeX RDF
1	Thomas W. Williams, Rohit Kapur	Design for Testability in Nanometer Technologies; Searching for Quality.	ISQED	2000	DBLP DOI BibTeX RDF
1	Yervant Zorian, Erik Jan Marinissen, Rohit Kapur	On using IEEE P1500 SECT for test plug-n-play.	ITC	2000	DBLP DOI BibTeX RDF
1	F. Hayat, Thomas W. Williams, Rohit Kapur, D. Hsu	DFT closure.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	area requirement, power requirement, timing closure flow, logic testing, SoC, integrated circuit testing, design for testability, automatic testing, application specific integrated circuits, ASIC, testability
1	Rohit Kapur, Thomas W. Williams	Tough Challenges as Design and Test Go Nanometer - Guest Editors' Introduction.	IEEE Computer	1999	DBLP DOI BibTeX RDF
1	Yervant Zorian, Erik Jan Marinissen, Rohit Kapur, Tony Taylor, Lee Whetsel	Towards a standard for embedded core test: an example.	ITC	1999	DBLP DOI BibTeX RDF
1	Rohit Kapur	High level ATPG is important and is on its way!	ITC	1999	DBLP DOI BibTeX RDF
1	Magdy S. Abadir, Rohit Kapur	Cost-Driven Ranking of Memory Elements for Partial Intrusion.	IEEE Design & Test of Computers	1997	DBLP DOI BibTeX RDF
1	Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams	A weighted random pattern test generation system.	IEEE Trans. on CAD of Integrated Circuits and Systems	1996	DBLP DOI BibTeX RDF
1	Rohit Kapur, Edward F. Miller	System Test and Reliability: Techniques for Avoiding Failure (Guest Editors' Introduction).	IEEE Computer	1996	DBLP BibTeX RDF
1	Thomas W. Williams, Robert H. Dennard, Rohit Kapur, M. Ray Mercer, Wojciech Maly	IDDQ Test: Sensitivity Analysis of Scaling.	ITC	1996	DBLP DOI BibTeX RDF
1	Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams	Design of an Efficient Weighted-Random-Pattern Generation System.	ITC	1994	DBLP DOI BibTeX RDF
1	Rohit Kapur, M. Ray Mercer	Bounding Signal Probabilities for Testability Measurement Using Conditional Syndromes.	IEEE Trans. Computers	1992	DBLP DOI BibTeX RDF	bounding algorithm, circuit faults, conditional syndromes, auxiliary gate, pseudorandom pattern resistant faults, circuit structure, computational complexity, lower bounds, built-in self test, integrated circuit testing, circuit analysis computing, signal probabilities, testability measurement, random pattern testability
1	Rohit Kapur, Jaehong Park, M. Ray Mercer	All Tests for a Fault Are Not Equally Valuable for Defect Detection.	ITC	1992	DBLP DOI BibTeX RDF
1	M. Ray Mercer, Rohit Kapur, Don E. Ross	Functional Approaches to Generating Orderings for Efficient Symbolic Representations.	DAC	1992	DBLP BibTeX RDF
1	Kenneth M. Butler, Don E. Ross, Rohit Kapur, M. Ray Mercer	Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams.	DAC	1991	DBLP DOI BibTeX RDF

Publications of "Rohit Kapur" ( http://dblp.L3S.de/Authors/Rohit_Kapur )