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Found 10 publication records. Showing 10 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | R. Arinero, En-xia Zhang, Nadia Rezzak, Ronald D. Schrimpf, Daniel M. Fleetwood, B. K. Choï, A. B. Hmelo, J. Mekki, André Touboul, Frédéric Saigné |
High fluence 1.8 MeV proton irradiation effects on n-type MOS capacitors.  |
Microelectronics Reliability  |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Nadia Rezzak, Michael L. Alles, Ronald D. Schrimpf, Sarah Kalemeris, Lloyd W. Massengill, John Sochacki, Hugh J. Barnaby |
The sensitivity of radiation-induced leakage to STI topology and sidewall doping. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Tania Roy, Yevgeniy S. Puzyrev, En-xia Zhang, Sandeepan DasGupta, Sarah A. Francis, Daniel M. Fleetwood, Ronald D. Schrimpf, Umesh K. Mishra, Jim S. Speck, Sokrates T. Pantelides |
1/f Noise in GaN HEMTs grown under Ga-rich, N-rich, and NH3-rich conditions. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Federico Faccio, Hugh J. Barnaby, Xiao J. Chen, Daniel M. Fleetwood, Laura Gonella, Michael L. McLain, Ronald D. Schrimpf |
Total ionizing dose effects in shallow trench isolation oxides. |
Microelectronics Reliability |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Sokrates T. Pantelides, L. Tsetseris, S. N. Rashkeev, X. J. Zhou, Daniel M. Fleetwood, Ronald D. Schrimpf |
Hydrogen in MOSFETs - A primary agent of reliability issues. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Daniel M. Fleetwood, M. P. Rodgers, L. Tsetseris, X. J. Zhou, I. Batyrev, S. Wang, Ronald D. Schrimpf, Sokrates T. Pantelides |
Effects of device aging on microelectronics radiation response and reliability. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | A. M. Albadri, Ronald D. Schrimpf, Kenneth F. Galloway, D. G. Walker |
Single event burnout in power diodes: Mechanisms and models. |
Microelectronics Reliability |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | P. C. Adell, Ronald D. Schrimpf, C. R. Cirba, W. T. Holman, X. Zhu, Hugh J. Barnaby, O. Mion |
Single event transient effects in a voltage reference. |
Microelectronics Reliability |
2005 |
DBLP DOI BibTeX RDF |
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| 1 | Loren J. Wise, Ronald D. Schrimpf, Harold G. Parks, Kenneth F. Galloway |
A generalized model for the lifetime of microelectronic components, applied to storage conditions. |
Microelectronics Reliability |
2001 |
DBLP DOI BibTeX RDF |
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| 1 | D. G. Walker, T. S. Fisher, J. Liu, Ronald D. Schrimpf |
Thermal modeling of single event burnout failure in semiconductor power devices. |
Microelectronics Reliability |
2001 |
DBLP DOI BibTeX RDF |
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