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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 17 occurrences of 10 keywords
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Results
Found 23 publication records. Showing 23 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
Diagnosis of full open defects in interconnect lines with fan-out.  |
European Test Symposium  |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras |
Delay caused by resistive opens in interconnecting lines. |
Integration |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras |
Experimental Characterization of CMOS Interconnect Open Defects. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
Time-dependent Behaviour of Full Open Defects in Interconnect Lines. |
ITC |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman |
Full Open Defects in Nanometric CMOS. |
VTS |
2008 |
DBLP DOI BibTeX RDF |
interconnect open, gate leakage current, CMOS |
| 1 | Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. |
VTS |
2007 |
DBLP DOI BibTeX RDF |
Current Based Diagnosis, Current Signatures, I_DDQ, Very Low Voltage, CMOS, Bridging Defect |
| 1 | Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
Diagnosis of Full Open Defects in Interconnecting Lines. |
VTS |
2007 |
DBLP DOI BibTeX RDF |
Defect Diagnosis, Full Open Defect, Interconnecting Line, CMOS |
| 1 | L. Balado, Emili Lupon, L. García, Rosa Rodríguez-Montañés, Joan Figueras |
Lissajous Based Mixed-Signal Testing for N-Observable Signals. |
DDECS |
2006 |
DBLP BibTeX RDF |
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| 1 | Rosa Rodríguez-Montañés, D. Muñoz, L. Balado, Joan Figueras |
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. |
J. Electronic Testing |
2004 |
DBLP DOI BibTeX RDF |
Analog Switch, DC defective behaviour, DC test, open defect, bridging defect |
| 1 | Salvador Manich, L. García, L. Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras |
BIST Technique by Equally Spaced Test Vector Sequences. |
VTS |
2004 |
DBLP DOI BibTeX RDF |
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| 1 | Doru P. Munteanu, Víctor Suñé, Rosa Rodríguez-Montañés, Juan A. Carrasco |
A Combinatorial Method for the Evaluation of Yield of Fault-Tolerant Systems-on-Chip. |
DSN |
2003 |
DBLP DOI BibTeX RDF |
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| 1 | José Pineda de Gyvez, Rosa Rodríguez-Montañés |
Threshold Voltage Mismatch (DeltaVT) Fault Modeling. |
VTS |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Rosa Rodríguez-Montañés, Paul Volf, José Pineda de Gyvez |
Resistance Characterization for Weak Open Defects. |
IEEE Design & Test of Computers |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Rosa Rodríguez-Montañés, Joan Figueras |
RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
| 1 | Rosa Rodríguez-Montañés, D. Muñoz, L. Balado, Joan Figueras |
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. |
IOLTW |
2002 |
DBLP DOI BibTeX RDF |
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| 1 | Antoni Ferré, Eugeni Isern, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras |
IDDQ testing: state of the art and future trends. |
Integration |
1998 |
DBLP DOI BibTeX RDF |
|
| 1 | Rosa Rodríguez-Montañés, Joan Figueras |
Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs. |
DATE |
1998 |
DBLP DOI BibTeX RDF |
IDDQ testability, CMOS, deep-submicron |
| 1 | Rosa Rodríguez-Montañés, Joan Figueras |
Bridges in sequential CMOS circuits: current-voltage signatur. |
VTS |
1997 |
DBLP DOI BibTeX RDF |
sequential CMOS circuits, current-voltage signature, I/sub DDQ/-V/sub DD/ signature, control loop nodes, fault diagnosis, fault diagnosis, temperature dependence, bridging defects |
| 1 | Rosa Rodríguez-Montañés, E. M. J. G. Bruls, Joan Figueras |
Bridging defects resistance in the metal layer of a CMOS process. |
J. Electronic Testing |
1996 |
DBLP DOI BibTeX RDF |
resistance of the bridge, defect modelling, bridging defects, CMOS process |
| 1 | Rosa Rodríguez-Montañés, Joan Figueras |
Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability. |
EDAC-ETC-EUROASIC |
1994 |
DBLP BibTeX RDF |
|
| 1 | J. A. Segura, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio |
Quiescent current analysis and experimentation of defective CMOS circuits. |
J. Electronic Testing |
1992 |
DBLP DOI BibTeX RDF |
Bridging failures, floating gate opens, intentionally designed defective circuits defects, current testing, defect modeling, gate oxide shorts |
| 1 | Rosa Rodríguez-Montañés, Joan Figueras, Eric Bruls |
Bridging Defects Resistance Measurements in a CMOS Process. |
ITC |
1992 |
DBLP DOI BibTeX RDF |
|
| 1 | Rosa Rodríguez-Montañés, J. A. Segura, Víctor H. Champac, Joan Figueras, J. A. Rubio |
Current vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in CMOS. |
ITC |
1991 |
DBLP DOI BibTeX RDF |
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Displaying result #1 - #23 of 23 (100 per page; Change: )
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