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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 2 occurrences of 2 keywords
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Results
Found 38 publication records. Showing 38 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Zhixiang Shao, Ruifeng Guo, Jie Li, Jianjun Peng |
Accurate Modeling Method for Generalized Tool Swept Volume in 5-axis NC Machining Simulation.  |
JSW  |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Jianjun Peng, Ruifeng Guo, Jiping Li, Zhixiang Shao, Jie Li |
Research on tool swept volume in NC simulation. |
EMEIT |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Xun Tang, Wu-Tung Cheng, Ruifeng Guo, Huaxing Tang, Sudhakar M. Reddy |
Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree. |
DFT |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Xiuwu Zhang, Ruifeng Guo, Weimin Lei, Wei Zhang 0033 |
A Topology-Aware Relay Lookup Scheme for P2P VoIP System. |
IJCNS |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Xun Tang, Wu-Tung Cheng, Ruifeng Guo, Sudhakar M. Reddy |
Diagnosis of Multiple Physical Defects Using Logic Fault Models. |
Asian Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang, Kun-Han Tsai, Ken Amstutz |
Scan based speed-path debug for a microprocessor. |
European Test Symposium |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Ke Peng, Yu Huang 0005, Ruifeng Guo, Wu-Tung Cheng, Mohammad Tehranipoor |
Emulating and diagnosing IR-drop by using dynamic SDF. |
ASP-DAC |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Wanfu Ding, Ruifeng Guo |
Enhancing the Success Rate of Primary Version While Guaranteeing Fault-Tolerant Capability for Real-Time Systems. |
PRDC |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Wanfu Ding, Ruifeng Guo |
An Effective RM-Based Scheduling Algorithm for Fault-Tolerant Real-Time Systems. |
CSE |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Kun-Han Tsai, Ruifeng Guo, Wu-Tung Cheng |
At-Speed Scan Test Method for the Timing Optimization and Calibration. |
Asian Test Symposium |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy, Yu Huang 0005 |
On Improving Diagnostic Test Generation for Scan Chain Failures. |
Asian Test Symposium |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Yu Huang 0005, Wu-Tung Cheng, Ruifeng Guo, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen |
Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns. |
Asian Test Symposium |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Ruifeng Guo, Wu-Tung Cheng, Kun-Han Tsai |
Speed-Path Debug Using At-Speed Scan Test Patterns. |
European Test Symposium |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy |
Improving compressed test pattern generation for multiple scan chain failure diagnosis. |
DATE |
2009 |
DBLP BibTeX RDF |
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| 1 | Yu Huang 0005, Ruifeng Guo, Wu-Tung Cheng, James Chien-Mo Li |
Survey of Scan Chain Diagnosis. |
IEEE Design & Test of Computers |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Ruifeng Guo, Liyang Lai, Yu Huang 0005, Wu-Tung Cheng |
Detection and Diagnosis of Static Scan Cell Internal Defect. |
ITC |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Yu Huang 0005, Wu-Tung Cheng, Ruifeng Guo |
Diagnose Multiple Stuck-at Scan Chain Faults. |
European Test Symposium |
2008 |
DBLP DOI BibTeX RDF |
chain diagnosis, multiple faults, dynamic learning |
| 1 | Wanfu Ding, Ruifeng Guo |
Design and Evaluation of Sectional Real-Time Scheduling Algorithms Based on System Load. |
ICYCS |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Ruifeng Guo, Yu Huang 0005, Wu-Tung Cheng |
A complete test set to diagnose scan chain failures. |
ITC |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Yu Huang 0005, Wu-Tung Cheng, Ruifeng Guo, Will Hsu, Yuan-Shih Chen, Albert Mann |
Diagnose compound scan chain and system logic defects. |
ITC |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Vishnu C. Vimjam, Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang |
Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. |
VTS |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Ruifeng Guo, Srikanth Venkataraman |
An algorithmic technique for diagnosis of faulty scan chains. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2006 |
DBLP DOI BibTeX RDF |
|
| 1 | Ruifeng Guo, Subhasish Mitra, Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman |
Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. |
VTS |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Zoran Stanojevic, Ruifeng Guo, Subhasish Mitra, Srikanth Venkataraman |
Enabling yield analysis with X-compact. |
ITC |
2005 |
DBLP DOI BibTeX RDF |
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| 1 | Dong Yu, Hu Lin, Ruifeng Guo, Jiangang Yang, Pengfei Xiao |
The Research on Real-Time Middleware for Open Architecture Controller. |
RTCSA |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Srikanth Venkataraman, Srihari Sivaraj, Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo |
An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. |
VTS |
2004 |
DBLP DOI BibTeX RDF |
|
| 1 | Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz |
Reverse-order-restoration-based static test compaction for synchronous sequential circuits. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2003 |
DBLP DOI BibTeX RDF |
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| 1 | Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz |
PROPTEST: a property-based test generator for synchronous sequential circuits. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2003 |
DBLP DOI BibTeX RDF |
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| 1 | Xiaoming Yu, Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz |
Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. |
VTS |
2003 |
DBLP DOI BibTeX RDF |
|
| 1 | Ruifeng Guo, Srikanth Venkataraman |
A technique for fault diagnosis of defects in scan chains. |
ITC |
2001 |
DBLP DOI BibTeX RDF |
|
| 1 | Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz |
On Improving a Fault Simulation Based Test Generator for Synchronous Sequential Circuits. |
Asian Test Symposium |
2001 |
DBLP DOI BibTeX RDF |
|
| 1 | Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy |
On Improving Static Test Compaction for Sequential Circuits. |
VLSI Design |
2001 |
DBLP DOI BibTeX RDF |
|
| 1 | Irith Pomeranz, Sudhakar M. Reddy, Ruifeng Guo |
Static test compaction for synchronous sequential circuits based on vector restoration. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Yun Shao 0002, Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz |
The effects of test compaction on fault diagnosis. |
ITC |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz |
Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction. |
DAC |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy |
A Fault Simulation Based Test Pattern Generator for Synchronous Sequential Circuits. |
VTS |
1999 |
DBLP DOI BibTeX RDF |
|
| 1 | Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy |
On Speeding-Up Vector Restoration Based Static Compaction of Test Sequences for Sequential Circuits . |
Asian Test Symposium |
1998 |
DBLP DOI BibTeX RDF |
|
| 1 | Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy |
Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits Based on Vector Restoration. |
DATE |
1998 |
DBLP DOI BibTeX RDF |
static test compaction synchronous sequential circuits |
Displaying result #1 - #38 of 38 (100 per page; Change: )
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