Search results for "Sharad C. Seth"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	George Nagy, Sharad C. Seth, Dongpu Jin, David W. Embley, Spencer Machado, Mukkai S. Krishnamoorthy	Data Extraction from Web Tables: The Devil is in the Details.	ICDAR	2011	DBLP DOI BibTeX RDF
1	Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya	Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects.	Asian Test Symposium	2011	DBLP DOI BibTeX RDF
1	David W. Embley, Mukkai S. Krishnamoorthy, George Nagy, Sharad C. Seth	Factoring Web Tables.	IEA/AIE	2011	DBLP DOI BibTeX RDF
1	Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya	PVT: Unified Reduction of Test Power, Volume, and Test Time Using Double-Tree Scan Architecture.	J. Low Power Electronics	2010	DBLP DOI BibTeX RDF
1	Sharad C. Seth, Ramana Chakradhar Jandhyala, Mukkai S. Krishnamoorthy, George Nagy	Analysis and taxonomy of column header categories for web tables.	Document Analysis Systems	2010	DBLP DOI BibTeX RDF	Wang notation, column-header grammar, table ontology, conversion, parsing, web tables
1	Dongyuan Zhan, Hong Jiang, Sharad C. Seth	Exploiting set-level non-uniformity of capacity demand to enhance CMP cooperative caching.	IPDPS	2010	DBLP DOI BibTeX RDF
1	Dongyuan Zhan, Hong Jiang, Sharad C. Seth	STEM: Spatiotemporal Management of Capacity for Intra-core Last Level Caches.	MICRO	2010	DBLP DOI BibTeX RDF
1	Zhen Chen, Sharad C. Seth, Dong Xiang	A novel hybrid delay testing scheme with low test power, volume, and time.	VTS	2010	DBLP DOI BibTeX RDF
1	Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya	A Unified Solution to Scan Test Volume, Time, and Power Minimization.	VLSI Design	2010	DBLP DOI BibTeX RDF	Test power minimization, Test time reduction, Test data reduction, Nonlinear scan
1	George Nagy, Sharad C. Seth, Mahesh Viswanathan	Comment: Projection Methods Require Black Border Removal.	IEEE Trans. Pattern Anal. Mach. Intell.	2009	DBLP DOI BibTeX RDF
1	Ramana Chakradhar Jandhyala, Mukkai S. Krishnamoorthy, George Nagy, Raghav K. Padmanabhan, Sharad C. Seth, William Silversmith	From Tessellations to Table Interpretation.	Calculemus/MKM	2009	DBLP DOI BibTeX RDF	rectangular tilings, X-Y trees, table grammars, Wang notation, tables, document understanding
1	Raghav Krishna Padmanabhan, Ramana Chakradhar Jandhyala, Mukkai S. Krishnamoorthy, George Nagy, Sharad C. Seth, William Silversmith	Interactive Conversion of Web Tables.	GREC	2009	DBLP DOI BibTeX RDF
1	Indranil Saha, Bhargab B. Bhattacharya, Sheng Zhang, Sharad C. Seth	Planar Straight-Line Embedding of Double-Tree Scan Architecture on a Rectangular Grid.	Fundam. Inform.	2008	DBLP BibTeX RDF
1	Sharad C. Seth, Ashok Samal	Conflation of Features.	Encyclopedia of GIS	2008	DBLP DOI BibTeX RDF
1	Ashok Samal, Sharad C. Seth	Feature Extraction, Abstract.	Encyclopedia of GIS	2008	DBLP DOI BibTeX RDF
1	Jian Kang, Sharad C. Seth, Yi-Shing Chang, Vijay Gangaram	Efficient Selection of Observation Points for Functional Tests.	ISQED	2008	DBLP DOI BibTeX RDF
1	Jian Kang, Sharad C. Seth, Vijay Gangaram	Efficient RTL Coverage Metric for Functional Test Selection.	VTS	2007	DBLP DOI BibTeX RDF
1	Ashutosh Joshi, George Nagy, Daniel P. Lopresti, Sharad C. Seth	A Maximum-Likelihood Approach to Symbolic Indirect Correlation.	ICPR	2006	DBLP DOI BibTeX RDF
1	Sheng Zhang, Sharad C. Seth, Bhargab B. Bhattacharya	Efficient Test Compaction for Pseudo-Random Testing.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF	built-in testing, test-data compression, Test compaction, pseudo-random testing
1	Sheng Zhang, Sharad C. Seth, Bhargab B. Bhattacharya	On Finding Consecutive Test Vectors in a Random Sequence for Energy-Aware BIST Design.	VLSI Design	2005	DBLP DOI BibTeX RDF
1	Ashok Samal, Sharad C. Seth, Kevin Cueto	A feature-based approach to conflation of geospatial sources.	International Journal of Geographical Information Science	2004	DBLP DOI BibTeX RDF
1	George Nagy, Ashutosh Joshi, Mukkai S. Krishnamoorthy, Yu Lin, Daniel P. Lopresti, Shashank K. Mehta, Sharad C. Seth	A nonparametric classifier for unsegmented text.	DRR	2004	DBLP BibTeX RDF
1	Hailong Cui, Sharad C. Seth, Shashank K. Mehta	Modeling Fault Coverage of Random Test Patterns.	J. Electronic Testing	2003	DBLP DOI BibTeX RDF	fault-coverage prediction, cost-benefit analysis of fault simulation, variance of fault coverage, BIST, probabilistic model
1	Bhargab B. Bhattacharya, Sharad C. Seth, Sheng Zhang	Double-Tree Scan: A Novel Low-Power Scan-Path Architecture.	ITC	2003	DBLP DOI BibTeX RDF
1	Bhargab B. Bhattacharya, Sharad C. Seth, Sheng Zhang	Low-Energy BIST Design for Scan-based Logic Circuits.	VLSI Design	2003	DBLP DOI BibTeX RDF
1	Hailong Cui, Sharad C. Seth, Shashank K. Mehta	A Novel Method to Improve the Test Efficiency of VLSI Tests.	VLSI Design	2002	DBLP DOI BibTeX RDF
1	Don Sylwester, Sharad C. Seth	Adaptive Segmentation of Document Images. (PDF / PS)	ICDAR	2001	DBLP DOI BibTeX RDF
1	Mark W. Weiss, Sharad C. Seth, Shashank K. Mehta, Kent L. Einspahr	Design Verification and Functional Testing of FiniteState Machines.	VLSI Design	2001	DBLP DOI BibTeX RDF
1	Luyang Li, George Nagy, Ashok Samal, Sharad C. Seth, Yihong Xu	Integrated text and line-art extraction from a topographic map.	IJDAR	2000	DBLP DOI BibTeX RDF	Map processing, Text-graphics segmentation, Adaptation, Geographic information systems, Character recognition, Graphics recognition, Form processing, Interactive processing, Cooperative processing
1	Mark W. Weiss, Sharad C. Seth, Shashank K. Mehta, Kent L. Einspahr	Exploiting don't cares to enhance functional tests.	ITC	2000	DBLP DOI BibTeX RDF
1	Kent L. Einspahr, Shashank K. Mehta, Sharad C. Seth	A synthesis for testability scheme for finite state machines using clock control.	IEEE Trans. on CAD of Integrated Circuits and Systems	1999	DBLP DOI BibTeX RDF
1	Luyang Li, George Nagy, Ashok Samal, Sharad C. Seth, Yihong Xu	Cooperative Text and Line-Art Extraction from a Topographic Map. (PDF / PS)	ICDAR	1999	DBLP DOI BibTeX RDF
1	Shashank K. Mehta, Sharad C. Seth	Empirical Computation of Reject Ratio in VLSI Testing.	VLSI Design	1999	DBLP DOI BibTeX RDF
1	Kent L. Einspahr, Shashank K. Mehta, Sharad C. Seth	Synthesis of Sequential Circuits with Clock Control to Improve Testability.	Asian Test Symposium	1998	DBLP DOI BibTeX RDF
1	Vishwani D. Agrawal, Sharad C. Seth	Mutually Disjoint Signals and Probability Calculation in Digital Circuits.	Great Lakes Symposium on VLSI	1998	DBLP DOI BibTeX RDF	Testing, Digital circuits, Signal probabilities, Syndrome
1	George Nagy, Ashok Samal, Sharad C. Seth, T. Fisher, E. Guthmann, K. Kalafala, Luyang Li, Prateek Sarkar, S. Sivasubramaniam, Yihong Xu	A Prototype for Adaptive Association of Street Names with Streets on Maps.	GREC	1997	DBLP DOI BibTeX RDF
1	Shashank K. Mehta, Kent L. Einspahr, Sharad C. Seth	Synthesis for Testability by Two-Clock Control.	VLSI Design	1997	DBLP DOI BibTeX RDF	two-clock control scheme, split coding system, FSM benchmark, timing, finite state machine, sequential circuit, encoding, logic synthesis, Hamiltonian cycle, synthesis for testability, state transition graph
1	Kent L. Einspahr, Sharad C. Seth, Vishwani D. Agrawal	Improving Circuit Testability by Clock Control. (PDF / PS)	Great Lakes Symposium on VLSI	1996	DBLP DOI BibTeX RDF
1	Kent L. Einspahr, Sharad C. Seth	A switch-level test generation system for synchronous and asynchronous circuits.	J. Electronic Testing	1995	DBLP DOI BibTeX RDF	reverse time processing, stuck-open and stuck-at faults, time-frame expansion, sequential circuits, Automatic test generation
1	N. Ranganathan, Sharad C. Seth	Conference Reports.	IEEE Design & Test of Computers	1995	DBLP BibTeX RDF
1	Don Sylwester, Sharad C. Seth	A trainable, single-pass algorithm for column segmentation. (PDF / PS)	ICDAR	1995	DBLP DOI BibTeX RDF	trainable single-pass algorithm, column segmentation, XYCUT, horizontal profiles, vertical binary profiles, XY-tree, page structure, resolution independent parameter, edit distance function, page image segmentation, repair cost function, OCR, image representation, document image processing, errors, document analysis, ground truth, technical document
1	Yuhong Yu, Ashok Samal, Sharad C. Seth	A system for recognizing a large class of engineering drawings. (PDF / PS)	ICDAR	1995	DBLP DOI BibTeX RDF	engineering drawings recognition, symbolic engineering drawings, chemical plant diagrams, automatic recognition, domain-independent rules segment symbols, understanding subsystem, domain-specific matchers, printed images, graphical user interface, design verification, large database, flowcharting, flowcharts, netlist, residual errors
1	Stephen D. Scott, Ashok Samal, Sharad C. Seth	HGA: A Hardware-Based Genetic Algorithm.	FPGA	1995	DBLP DOI BibTeX RDF	performance acceleration, performance evaluation, field programmable gate arrays, function optimization, parallel genetic algorithms
1	S. Venkatraman, Sharad C. Seth, Prathima Agrawal	Parallel test generation with low communication overhead.	VLSI Design	1995	DBLP DOI BibTeX RDF	parallel test generation, low communication overhead, dynamic search-space allocation strategy, Sequent multiprocessor, parallel algorithms, logic testing, Boolean functions, analytical model, combinational circuits, shared memory multiprocessor, shared memory systems, processor scheduling, software performance evaluation, boolean satisfiability, combinational logic, greedy heuristic
1	Yuhong Yu, Ashok Samal, Sharad C. Seth	Isolating symbols from connection lines in a class of engineering drawings.	Pattern Recognition	1994	DBLP DOI BibTeX RDF
1	Sharad C. Seth, Lee Gowen, Matt Payne, Don Sylwester	Logic Simulation Using an Asynchronous Parallel Discrete-Event Simulation Model on a SIMD Machine.	VLSI Design	1994	DBLP BibTeX RDF
1	Mukkai S. Krishnamoorthy, George Nagy, Sharad C. Seth, Mahesh Viswanathan	Syntactic Segmentation and Labeling of Digitized Pages from Technical Journals.	IEEE Trans. Pattern Anal. Mach. Intell.	1993	DBLP DOI BibTeX RDF	syntactic segmentation, horizontal projection profiles, digitized pages, vertical projection profiles, scanned page images, thresholded profile strings, compiler utilities, block grammars, Unix Shell, labeled x-y tree, image segmentation, feature extraction, image recognition, image recognition, branch and bound, document image processing, document image processing, grammars, labeling, error recovery, technical documents, Lex, Yacc
1	D. Das, Sharad C. Seth, Vishwani D. Agrawal	Accurate computation of field reject ratio based on fault latency.	IEEE Trans. VLSI Syst.	1993	DBLP DOI BibTeX RDF
1	Prathima Agrawal, Vishwani D. Agrawal, Sharad C. Seth	Generating Tests for Delay Faults in Nonscan Circuits.	IEEE Design & Test of Computers	1993	DBLP DOI BibTeX RDF
1	George Nagy, Sharad C. Seth, Mahesh Viswanathan	A Prototype Document Image Analysis System for Technical Journals.	IEEE Computer	1992	DBLP DOI BibTeX RDF
1	Dharam Vir Das, Sharad C. Seth, Vishwani D. Agrawal	Estimating the Quality of Manufactured Digital Sequential Circuits.	ITC	1991	DBLP DOI BibTeX RDF
1	Sharad C. Seth, Vishwani D. Agrawal, Hassan Farhat	A Statistical Theory of Digital Circuit Testability.	IEEE Trans. Computers	1990	DBLP DOI BibTeX RDF
1	Dharam Vir Das, Sharad C. Seth, Paul T. Wagner, John C. Anderson, Vishwani D. Agrawal	An experimental study on reject ratio prediction for VLSI circuits: Kokomo revisited.	ITC	1990	DBLP DOI BibTeX RDF
1	Paul Kenyon, Prathima Agrawal, Sharad C. Seth	High-level microprogramming: an optimizing C compiler for a processing element of a CAD accelerator.	MICRO	1990	DBLP DOI BibTeX RDF	front-end DAG compiler, hand vs. compiled microcode, microcode compiler, programming environment for CAD, space/time overhead, code generation, hardware accelerator, performance data
1	Lester Lipsky, Sharad C. Seth	Signal Probabilities in AND-OR Trees.	IEEE Trans. Computers	1989	DBLP DOI BibTeX RDF	random pattern detectability, AND-OR tree circuits, random-pattern inputs, S-shaped function, probability transfer function, interior fixed point, unit step, circuit depth, logic testing, probability, convergence, random testing, logic circuits, transfer functions, signal probabilities, fan-ins
1	Bhargab B. Bhattacharya, Sharad C. Seth	Design of Parity Testable Combinational Circuits.	IEEE Trans. Computers	1989	DBLP DOI BibTeX RDF	parity testable combinational circuits, maximal supergates, single external test-mode pin, logic testing, integrated circuit testing, design for testability, integrated logic circuits, combinatorial circuits
1	Raghu V. Hudli, Sharad C. Seth	Testability Analysis of Synchronous Sequential Circuits Based on Structural Data.	ITC	1989	DBLP DOI BibTeX RDF
1	George Nagy, Sharad C. Seth, Kent L. Einspahr	Decoding Substitution Ciphers by Means of Word Matching with Application to OCR.	IEEE Trans. Pattern Anal. Mach. Intell.	1987	DBLP DOI BibTeX RDF
1	Sharad C. Seth	Predicting Fault Coverage from Probabilistic Testability.	ITC	1985	DBLP BibTeX RDF
1	Ten-Chuan Hsiao, Sharad C. Seth	An Analysis of the Use of Rademacher-Walsh Spectrum in Compact Testing.	IEEE Trans. Computers	1984	DBLP DOI BibTeX RDF	random compact testing, Rademacher-Walsh coefficients, Error analysis, functional testing
1	Sharad C. Seth, Vishwani D. Agrawal	Characterizing the LSI Yield Equation from Wafer Test Data.	IEEE Trans. on CAD of Integrated Circuits and Systems	1984	DBLP DOI BibTeX RDF
1	Sharad C. Seth, Lester Lipsky	A Simplified Method to Calculate Failure Times in Fault-Tolerant Systems.	IEEE Trans. Computers	1983	DBLP DOI BibTeX RDF	Failure-time distribution, mean time to failure (MTTF), mean residual life (MRL), fault-tolerant systems, renewal theory
1	Sharad C. Seth, K. Narayanaswamy	A Graph Model for Pattern-Sensitive Faults in Random Access Memories.	IEEE Trans. Computers	1981	DBLP DOI BibTeX RDF	single pattern-sensitive faults, Coloring algorithm, optimal transition write sequences, graph modeling, RAM testing
1	Vishwani D. Agrawal, Sharad C. Seth, Prathima Agrawal	LSI product quality and fault coverage.	DAC	1981	DBLP BibTeX RDF
1	Kolar L. Kodandapani, Sharad C. Seth	On Combinational Networks with Restricted Fan-Out.	IEEE Trans. Computers	1978	DBLP DOI BibTeX RDF	single fault location, Characterization of fan-out-free networks, counting of fan-out-free, fan-out-free networks, localized fan outs, functional decomposition, combinational networks, multiple fault detection
1	James M. Steckelberg, Sharad C. Seth	On a Relation Between Algebraic Programs and Turing Machines.	Inf. Process. Lett.	1977	DBLP DOI BibTeX RDF
1	Sharad C. Seth, Kolar L. Kodandapani	Diagnosis of Faults in Linear Tree Networks.	IEEE Trans. Computers	1977	DBLP DOI BibTeX RDF

Publications of "Sharad C. Seth" ( http://dblp.L3S.de/Authors/Sharad_C._Seth )